Near-field Hyperspectral Imaging of Resonant Mie Modes in a Dielectric Island
Authors:
Nicoletta Granchi,
Michele Montanari,
Andrea Ristori,
Mario Khoury,
Mohammed Bouabdellaui,
Chiara Barri,
Luca Fagiani,
Massimo Gurioli,
Monica Bollani,
Marco Abbarchi,
Francesca Intonti
Abstract:
All-dielectric, sub-micrometric particles have been successfully exploited for light management in a plethora of applications at visible and near-infrared frequency. However, the investigation of the intricacies of the Mie resonances at the sub-wavelength scale has been hampered by the limitation of conventional near-field methods. Here we address spatial and spectral mapping of multi-polar modes…
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All-dielectric, sub-micrometric particles have been successfully exploited for light management in a plethora of applications at visible and near-infrared frequency. However, the investigation of the intricacies of the Mie resonances at the sub-wavelength scale has been hampered by the limitation of conventional near-field methods. Here we address spatial and spectral mapping of multi-polar modes of a Si island by hyper-spectral imaging. The simultaneous detection of several resonant modes allows to clarify the role of substrate and incidence angle of the impinging light, highlighting spectral splitting of the quadrupolar mode and resulting in different spatial features of the field intensity. We explore theoretically and experimentally such spatial features. Details as small as 200 nm can be detected and are in agreement with simulations based on a Finite Difference Time Domain method. Our results are relevant to near-field imaging of dielectric structures, to the comprehension of the photophysics of resonant Mie structures, to beam steering and to the resonant coupling with light emitters. Our analysis paves the way for a novel approach to control the spatial overlap of a single emitter with localized electric field maxima.
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Submitted 31 August, 2021;
originally announced August 2021.
Third-harmonic light polarization control in magnetically-resonant silicon metasurfaces
Authors:
Andrea Tognazzi,
Kirill I. Okhlopkov,
Attilio Zilli,
Davide Rocco,
Luca Fagiani,
Erfan Mafakheri,
Monica Bollani,
Marco Finazzi,
Michele Celebrano,
Maxim R. Shcherbakov,
Andrey A. Fedyanin,
Costantino de Angelis
Abstract:
Nonlinear metasurfaces have become prominent tools for controlling and engineering light at the nanoscale. Usually, the polarization of the total generated third harmonic is studied. However, diffraction orders may present different polarizations. Here, we design an high quality factor silicon metasurface for third harmonic generation and perform back focal plane imaging of the diffraction orders,…
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Nonlinear metasurfaces have become prominent tools for controlling and engineering light at the nanoscale. Usually, the polarization of the total generated third harmonic is studied. However, diffraction orders may present different polarizations. Here, we design an high quality factor silicon metasurface for third harmonic generation and perform back focal plane imaging of the diffraction orders, which present a rich variety of polarization states. Our results demonstrate the possibility of tailoring the polarization of the generated nonlinear diffraction orders paving the way to a higher degree of wavefront control.
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Submitted 22 January, 2021;
originally announced January 2021.
