Showing 1–1 of 1 results for author: Dottermusch, S
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Unclonable anti-counterfeiting labels based on microlens arrays and luminescent microparticles
Authors:
Vinay Kumar,
Stephan Dottermusch,
Ngei Katumo,
Bryce S. Richards,
Ian A. Howard
Abstract:
Micron-scale randomness during manufacturing can ensure anti-counterfeiting labels are unclonable. However, this security typically comes at the expense of complex hardware being needed for authentication (e.g., microscopy systems). We demonstrate unclonable labels that can be authenticated using a standard light-emitting diode and smartphone camera. The labels consist of a microlens array laminat…
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Micron-scale randomness during manufacturing can ensure anti-counterfeiting labels are unclonable. However, this security typically comes at the expense of complex hardware being needed for authentication (e.g., microscopy systems). We demonstrate unclonable labels that can be authenticated using a standard light-emitting diode and smartphone camera. The labels consist of a microlens array laminated to a polymer film that is doped with luminescent microparticles. The micron-scale random overlap of focal volumes and microparticles leads to a pattern of bright points of visible light emission that can be easily imaged by a smartphone camera. 10 000 comparisons of images demonstrate that the labels can be robustly authenticated, and that the probability of a false authentication is on the order of $10^{-15}$. The ability for microlens arrays to simplify the hardware needed for authentication of unclonable labels is generalizable, and attractive for the implementation of unclonable labels in anti-counterfeiting systems.
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Submitted 12 July, 2021;
originally announced July 2021.
