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Precise wavefront characterization of X-ray optical elements using a laboratory source
Authors:
J. L. Dresselhaus,
H. Fleckenstein,
M. Domaracky,
M. Prasciolu,
N. Ivanov,
J. Carnis,
K. T. Murray,
A. J. Morgan,
H. N. Chapman,
S. Bajt
Abstract:
Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to compensate for these errors. Nowadays, the characterization of such optics is made using intense X-ray sources such as synchrotrons. However, the limited acces…
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Improvements in X-ray optics critically depend on the measurement of their optical performance. The knowledge of wavefront aberrations, for example, can be used to improve the fabrication of optical elements or to design phase correctors to compensate for these errors. Nowadays, the characterization of such optics is made using intense X-ray sources such as synchrotrons. However, the limited access to these facilities can substantially slow down the development process. Improvements in the brightness of lab-based X-ray micro-sources in combination with the development of new metrology methods, and in particular ptychographic X-ray speckle tracking, enable characterization of X-ray optics in the lab with a precision and sensitivity not possible before. Here, we present a laboratory set-up that utilizes a commercially available X-ray source and can be used to characterize different types of X-ray optics. The set-up is used in our laboratory on a routine basis to characterize multilayer Laue lenses of high numerical aperture and other optical elements. This typically includes measurements of the wavefront distortions, optimum operating photon energy and focal length of the lens. To check the sensitivity and accuracy of this laboratory set-up we compared the results to those obtained at the synchrotron and saw no significant difference. To illustrate the feedback of measurements on performance, we demonstrated the correction of the phase errors of a particular multilayer Laue lens using a 3D printed compound refractive phase plate.
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Submitted 27 March, 2022;
originally announced March 2022.
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On the use of multilayer Laue lenses with X-ray Free Electron Lasers
Authors:
Mauro Prasciolu,
Kevin T. Murray,
Nikolay Ivanov,
Holger Fleckenstein,
Martin Domaracký,
Luca Gelisio,
Fabian Trost,
Kartik Ayyer,
Dietrich Krebs,
Steve Aplin,
Salah Awel,
Ulrike Boesenberg,
Anton Barty,
Armando D. Estillore,
Matthias Fuchs,
Yaroslav Gevorkov,
Joerg Hallmann,
Chan Kim,
Juraj Knoška,
Jochen Küpper,
Chufeng Li,
Wei Lu,
Valerio Mariani,
Andrew J. Morgan,
Johannes Möller
, et al. (12 additional authors not shown)
Abstract:
Multilayer Laue lenses were used for the first time to focus x-rays from an X-ray Free Electron Laser (XFEL). In an experiment, which was performed at the European XFEL, we demonstrated focusing to a spot size of a few tens of nanometers. A series of runs in which the number of pulses per train was increased from 1 to 2, 3, 4, 5, 6, 7, 10, 20 and 30 pulses per train, all with a pulse separation of…
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Multilayer Laue lenses were used for the first time to focus x-rays from an X-ray Free Electron Laser (XFEL). In an experiment, which was performed at the European XFEL, we demonstrated focusing to a spot size of a few tens of nanometers. A series of runs in which the number of pulses per train was increased from 1 to 2, 3, 4, 5, 6, 7, 10, 20 and 30 pulses per train, all with a pulse separation of 3.55 us, was done using the same set of lenses. The increase in the number of pulses per train was accompanied with an increase of x-ray intensity (transmission) from 9% to 92% at 5 pulses per train, and then the transmission was reduced to 23.5 % when the pulses were increased further. The final working condition was 30 pulses per train and 23.5% transmission. Only at this condition we saw that the diffraction efficiency of the MLLs changed over the course of a pulse train, and this variation was reproducible from train to train. We present the procedure to align and characterize these lenses and discuss challenges working with the pulse trains from this unique x-ray source.
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Submitted 22 March, 2022;
originally announced March 2022.
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New aerodynamic lens injector for single particle diffractive imaging
Authors:
Nils Roth,
Daniel A. Horke,
Jannik Lübke,
Amit K. Samanta,
Armando D. Estillore,
Lena Worbs,
Nicolai Pohlman,
Kartik Ayyer,
Andrew Morgan,
Holger Fleckenstein,
Martin Domaracky,
Benjamin Erk,
Christopher Passow,
Jonathan Correa,
Oleksandr Yefanov,
Anton Barty,
Saša Bajt,
Richard A. Kirian,
Henry N. Chapman,
Jochen Küpper
Abstract:
An aerodynamic lens injector was developed specifically for the needs of single-particle diffractive imaging experiments at free-electron lasers. Its design allows for quick changes of injector geometries and focusing properties in order to optimize injection for specific individual samples. Here, we present results of its first use at the FLASH free-electron-laser facility. Recorded diffraction p…
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An aerodynamic lens injector was developed specifically for the needs of single-particle diffractive imaging experiments at free-electron lasers. Its design allows for quick changes of injector geometries and focusing properties in order to optimize injection for specific individual samples. Here, we present results of its first use at the FLASH free-electron-laser facility. Recorded diffraction patterns of polystyrene spheres are modeled using Mie scattering, which allowed for the characterization of the particle beam under diffractive-imaging conditions and yield good agreement with particle-trajectory simulations.
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Submitted 21 December, 2020;
originally announced December 2020.
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Ptychographic X-ray Speckle Tracking with Multi Layer Laue Lens Systems
Authors:
Andrew James Morgan,
Kevin T. Murray,
Mauro Prasciolu,
Holger Fleckenstein,
Oleksandr Yefanov,
Pablo Villanueva-Perez,
Valerio Mariani,
Martin Domaracky,
Manuela Kuhn,
Steve Aplin,
Istwan Mohacsi,
Marc Messerschmidt,
Karolina Stachnik,
Yang Du,
Anja Burkhart,
Alke Meents,
Evgeny Nazaretski,
Hanfei Yan,
Xiaojing Huang,
Yong Chu,
Henry N. Chapman,
Saša Bajt
Abstract:
The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical s…
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The ever-increasing brightness of synchrotron radiation sources demands improved x-ray optics to utilise their capability for imaging and probing biological cells, nano-devices, and functional matter on the nanometre scale with chemical sensitivity. Hard x-rays are ideal for high-resolution imaging and spectroscopic applications due to their short wavelength, high penetrating power, and chemical sensitivity. The penetrating power that makes x-rays useful for imaging also makes focusing them technologically challenging. Recent developments in layer deposition techniques that have enabled the fabrication of a series of highly focusing x-ray lenses, known as wedged multi layer Laue lenses. Improvements to the lens design and fabrication technique demands an accurate, robust, in-situ and at-wavelength characterisation method. To this end, we have developed a modified form of the speckle-tracking wavefront metrology method, the ptychographic x-ray speckle tracking method, which is capable of operating with highly divergent wavefields. A useful by-product of this method, is that it also provides high-resolution and aberration-free projection images of extended specimens. We report on three separate experiments using this method, where we have resolved ray path angles to within 4 nano-radians with an imaging resolution of 45nm (full-period). This method does not require a high degree of coherence, making it suitable for lab based x-ray sources. Likewise it is robust to errors in the registered sample positions making it suitable for x-ray free-electron laser facilities, where beam pointing fluctuations can be problematic for wavefront metrology.
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Submitted 28 March, 2020;
originally announced March 2020.
