Strain release at the graphene-Ni(100) interface investigated by in-situ and operando scanning tunnelling microscopy
Authors:
Zhiyu Zou,
Laerte L. Patera,
Giovanni Comelli,
Cristina Africh
Abstract:
Interface strain can significantly influence the mechanical, electronic and magnetic properties of low-dimensional materials. Here we investigated by scanning tunneling microscopy how the stress introduced by a mismatched interface affects the structure of a growing graphene (Gr) layer on a Ni(100) surface in real time during the process. Strain release appears to be the main factor governing morp…
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Interface strain can significantly influence the mechanical, electronic and magnetic properties of low-dimensional materials. Here we investigated by scanning tunneling microscopy how the stress introduced by a mismatched interface affects the structure of a growing graphene (Gr) layer on a Ni(100) surface in real time during the process. Strain release appears to be the main factor governing morphology, with the interplay of two simultaneous driving forces: on the one side the need to obtain two-dimensional best registry with the substrate, via formation of moiré patterns, on the other side the requirement of optimal one-dimensional in-plane matching with the transforming nickel carbide layer, achieved by local rotation of the growing Gr flake. Our work suggests the possibility of tuning the local properties of two-dimensional films at the nanoscale through exploitation of strain at a one-dimensional interface.
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Submitted 19 October, 2020; v1 submitted 8 October, 2020;
originally announced October 2020.
The new FAST module: a portable and transparent add-on module for time-resolved investigations with commercial scanning probe microscopes
Authors:
Carlo Dri,
Mirco Panighel,
Daniel Tiemann,
Laerte L. Patera,
Giulia Troiano,
Yves Fukamori,
Fabian Knoller,
Barbara A. J. Lechner,
Giuseppe Cautero,
Dario Giuressi,
Giovanni Comelli,
Jordi Fraxedas,
Cristina Africh,
Friedrich Esch
Abstract:
Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e.g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional S…
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Time resolution is one of the most severe limitations of scanning probe microscopies (SPMs), since the typical image acquisition times are in the order of several seconds or even few minutes. As a consequence, the characterization of dynamical processes occurring at surfaces (e.g. surface diffusion, film growth, self-assembly and chemical reactions) cannot be thoroughly addressed by conventional SPMs. To overcome this limitation, several years ago we developed a first prototype of the FAST module, an add-on instrument capable of driving a commercial scanning tunneling microscope (STM) at and beyond video rate frequencies. Here we report on a fully redesigned version of the FAST module, featuring improved performance and user experience, which can be used both with STMs and atomic force microscopes (AFMs), and offers additional capabilities such as an atom tracking mode. All the new features of the FAST module, including portability between different commercial instruments, are described in detail and practically demonstrated.
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Submitted 21 June, 2019; v1 submitted 20 June, 2019;
originally announced June 2019.
