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Comparison of Kikuchi Diffraction Geometries in Scanning Electron Microscope
Authors:
Tianbi Zhang,
Lukas Berners,
Jakub Holzer,
T. Ben Britton
Abstract:
Recent advances in scanning electron microscope (SEM) based Kikuchi diffraction have demonstrated the important potential for reflection and transmission methods, like transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Furthermore, with the advent of compact direct electron detectors (DED) it has been possible to place the detector in a variety of configurations wi…
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Recent advances in scanning electron microscope (SEM) based Kikuchi diffraction have demonstrated the important potential for reflection and transmission methods, like transmission Kikuchi diffraction (TKD) and electron backscatter diffraction (EBSD). Furthermore, with the advent of compact direct electron detectors (DED) it has been possible to place the detector in a variety of configurations within the SEM chamber. This motivates the present work where we explore the similarities and differences of the different geometries that include on-axis TKD & off-axis TKD using electron transparent samples, as well as more conventional EBSD. Furthermore, we compare these with the newest method called "reflection Kikuchi diffraction" RKD where the sample is placed flat in the chamber and the detector is placed below the pole piece. Through remapping collected diffraction patterns, all these methods can be used to generate an experimental "diffraction sphere" that can be used to explore diffraction from any scattering vector from the unit cell, as well as the ability to perform band profile analysis. This diffraction sphere approach enables us to further probe specific differences between the methods, including for example thickness effects in TKD that can result in the generation of diffraction spots, as well as electron scattering path length effects that result in excess and deficiency variations, as well as inversion of bands in experimental patterns.
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Submitted 24 January, 2025; v1 submitted 19 November, 2024;
originally announced November 2024.
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Microstructural characterization to reveal evidence of shock deformation in a Campo del Cielo meteorite fragment
Authors:
Graeme J. Francolini,
Thomas B. Britton
Abstract:
The study of meteorites and their microstructures is a topic which spans multiple fields of research, such as meteoritics and materials science. For materials scientists and engineers, the extreme and unusual conditions which these microstructures form allow for insight into materials which would exist at the edge of our thermomechanical processing abilities. One such microstructure found in low-s…
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The study of meteorites and their microstructures is a topic which spans multiple fields of research, such as meteoritics and materials science. For materials scientists and engineers, the extreme and unusual conditions which these microstructures form allow for insight into materials which would exist at the edge of our thermomechanical processing abilities. One such microstructure found in low-shock event iron meteorites is Neumann bands. These bands are an array of lenticular deformation twins that form throughout the Fe-Ni matrix with numerous intersections, resulting in many high stress and strain regions within the material's surface. The existence of these regions and the shocks that formed them encourage atypical strain accommodating mechanisms and structural changes of the material. However, direct investigation of the deformation twin intersections and the microstructural behaviour in and around these regions has been limited. In this work, investigation of these regions in a Campo del Cielo meteorite fragment, with electron backscatter diffraction (EBSD) and forescatter electron (FSE) imaging, revealed two primary findings: high-intensity pattern doubling mirrored across the {110} band at twin-twin intersection and microband formation across the sample surface, which suggest multilayer twinning and constraint of the crystal structure at points of twin-twin intersection. Microbands were found to form along the {110} plane and in regions near Neumann bands. The simultaneous existence of Neumann bands (microtwins) and microbands is presented here for a BCC material, and it is believed the Neumann band and microbands formed during different types and/or shock events. The presence of both Neumann bands and microbands within a BCC iron meteorite is previously unreported and may be valuable in furthering our understanding of shock deformation within iron-based materials.
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Submitted 10 February, 2025; v1 submitted 29 August, 2024;
originally announced August 2024.
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Multi-exposure diffraction pattern fusion applied to enable wider-angle transmission Kikuchi diffraction with direct electron detectors
Authors:
Tianbi Zhang,
T. Ben Britton
Abstract:
Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials typically diffraction pattern analysis is performed in the transmission electron microscope (TEM) and TEM diffraction patterns typically have a limited angular ra…
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Diffraction pattern analysis can be used to reveal the crystalline structure of materials, and this information is used to nano- and micro-structure of advanced engineering materials that enable modern life. For nano-structured materials typically diffraction pattern analysis is performed in the transmission electron microscope (TEM) and TEM diffraction patterns typically have a limited angular range (less than a few degrees) due to the long camera length, and this requires analysis of multiple patterns to probe a unit cell. As a different approach, wide angle Kikuchi patterns can be captured using an on-axis detector in the scanning electron microscope (SEM) with a shorter camera length. These 'transmission Kikuchi diffraction' (TKD) patterns present a direct projection of the unit cell and can be routinely analyzed using EBSD-based methods and dynamical diffraction theory. In the present work, we enhance this analysis significantly and present a multi-exposure diffraction pattern fusion method that increases the dynamic range of the detected patterns captured with a Timepix3-based direct electron detector (DED). This method uses an easy-to-apply exposure fusion routine to collect data and extend the dynamic range, as well as normalize the intensity distribution within these very wide (>95°) angle patterns. The potential of this method is demonstrated with full diffraction sphere reprojection and highlight potential of the approach to rapidly probe the structure of nano-structured materials in the scanning electron microscope.
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Submitted 27 October, 2023; v1 submitted 25 June, 2023;
originally announced June 2023.
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Optimizing broad ion beam polishing of zircaloy-4 for electron backscatter diffraction analysis
Authors:
Ning Fang,
Ruth Birch,
T. Ben Britton
Abstract:
Microstructural analysis with electron backscatter diffraction (EBSD) involves sectioning and polishing to create a flat and preparation-artifact free surface. The quality of EBSD analysis is often dependant on this step, and this motivates us to explore how broad ion beam (BIB) milling can be optimised for the preparation of zircaloy-4 with different grain sizes. We systematically explore the rol…
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Microstructural analysis with electron backscatter diffraction (EBSD) involves sectioning and polishing to create a flat and preparation-artifact free surface. The quality of EBSD analysis is often dependant on this step, and this motivates us to explore how broad ion beam (BIB) milling can be optimised for the preparation of zircaloy-4 with different grain sizes. We systematically explore the role of ion beam angle, ion beam voltage, polishing duration and polishing temperature and how this changes the surface roughness and indexing quality. Our results provide a method to routinely prepare high-quality Zircaloy-4 surfaces, and methods to optimise BIB polishing of other materials for high-quality EBSD studies.
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Submitted 30 March, 2022; v1 submitted 7 January, 2022;
originally announced January 2022.
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Gender issues in fundamental physics: Strumia's bibliometric analysis fails to account for key confounders and confuses correlation with causation
Authors:
Philip Ball,
T. Benjamin Britton,
Erin Hengel,
Philip Moriarty,
Rachel A. Oliver,
Gina Rippon,
Angela Saini,
Jessica Wade
Abstract:
Alessandro Strumia recently published a survey of gender differences in publications and citations in high-energy physics (HEP). In addition to providing full access to the data, code, and methodology, Strumia (2020) systematically describes and accounts for gender differences in HEP citation networks. His analysis points both to ongoing difficulties in attracting women to high-energy physics and…
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Alessandro Strumia recently published a survey of gender differences in publications and citations in high-energy physics (HEP). In addition to providing full access to the data, code, and methodology, Strumia (2020) systematically describes and accounts for gender differences in HEP citation networks. His analysis points both to ongoing difficulties in attracting women to high-energy physics and an encouraging-though slow-trend in improvement. Unfortunately, however, the time and effort Strumia (2020) devoted to collating and quantifying the data are not matched by a similar rigour in interpreting the results. To support his conclusions, he selectively cites available literature and fails to adequately adjust for a range of confounding factors. For example, his analyses do not consider how unobserved factors -- e.g., a tendency to overcite well-known authors -- drive a wedge between quality and citations and correlate with author gender. He also fails to take into account many structural and non-structural factors -- including, but not limited to, direct discrimination and the expectations women form (and actions they take) in response to it -- that undoubtedly lead to gender differences in productivity. We therefore believe that a number of Strumia's conclusions are not supported by his analysis. Indeed, we re-analyse a subsample of solo-authored papers from his data, adjusting for year and journal of publication, authors' research age and their lifetime "fame". Our re-analysis suggests that female-authored papers are actually cited more than male-authored papers. This finding is inconsistent with the "greater male variability" hypothesis Strumia (2020) proposes to explain many of his results.
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Submitted 3 December, 2020;
originally announced June 2021.
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Effect of high temperature service on the complex through-wall microstructure of centrifugally cast HP40 reformer tube
Authors:
Thibaut Dessolier,
Thomas McAuliffe,
Wouter J. Hamer,
Chrétien G. M. Hermse,
T. Ben Britton
Abstract:
Centrifugally cast reformer tubes are used in petrochemical plants for hydrogen production. Due to the conditions of hydrogen production, reformer tubes are exposed to high temperature which causes creep damage inside the microstructure. In this study, two different ex-service HP40 alloy reformer tubes which come from the same steam reformer unit have been compared by microstructural characterisat…
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Centrifugally cast reformer tubes are used in petrochemical plants for hydrogen production. Due to the conditions of hydrogen production, reformer tubes are exposed to high temperature which causes creep damage inside the microstructure. In this study, two different ex-service HP40 alloy reformer tubes which come from the same steam reformer unit have been compared by microstructural characterisation performed at a range of length scales from mm to um. Analyses performed by EBSD (Electron Backscatter Diffraction), EDS (Energy Dispersive X-ray Spectroscopy) and PCA (Principal Component Analysis) show that both tubes have similar microstructural constituents, with the presence of an austenitic matrix and M23C6, G phase and M6C carbides at the grain boundaries. Even if both tubes have a similar microstructure, one tube due to it localisation inside the steam reformer unit presents a region with more micro cracks which may indicate that this tube have accumulated more creep damage than the other one.
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Submitted 26 August, 2020; v1 submitted 17 August, 2020;
originally announced August 2020.
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The role of lengthscale in the creep of Sn-3Ag-0.5Cu solder microstructures
Authors:
Tianhong Gu,
Christopher M. Gourlay,
T. Ben Britton
Abstract:
Creep of directionally solidified Sn-3Ag-0.5Cu wt.% (SAC305) samples with near-<110> orientation along the loading direction and different microstructural lengthscale is investigated under constant load tensile testing and at a range of temperatures. The creep performance improves by refining the microstructure, i.e. the decrease in secondary dendrite arm spacing (λ2), eutectic intermetallic spaci…
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Creep of directionally solidified Sn-3Ag-0.5Cu wt.% (SAC305) samples with near-<110> orientation along the loading direction and different microstructural lengthscale is investigated under constant load tensile testing and at a range of temperatures. The creep performance improves by refining the microstructure, i.e. the decrease in secondary dendrite arm spacing (λ2), eutectic intermetallic spacing (λe) and intermetallic compound (IMC) size, indicating as a longer creep lifetime, lower creep strain rate, change in activation energy (Q) and increase in ductility and homogeneity in macro- and micro-structural deformation of the samples. The dominating creep mechanism is obstacle-controlled dislocation creep at room temperature and transits to lattice-associated vacancy diffusion creep at elevated temperature (T/T_M > 0.7 to 0.75). The deformation mechanisms are investigated using electron backscatter diffraction (EBSD) and strain heterogeneity is identified between b/-Sn in dendrites and b/-Sn in eutectic regions containing Ag3Sn and Cu6Sn5 particles. The size of the recrystallised grains is modulated by the dendritic and eutectic spacings, however, the recrystalised grains in the eutectic regions for coarse-scaled samples (largest λ2 and λe) is only localised next to IMCs without growth in size.
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Submitted 10 December, 2020; v1 submitted 16 July, 2020;
originally announced July 2020.
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Advances in electron backscatter diffraction
Authors:
Alex Foden,
Alessandro Previero,
Thomas Benjamin Britton
Abstract:
We present a few recent developments in the field of electron backscatter diffraction (EBSD). We highlight how open source algorithms and open data formats can be used to rapidly to develop microstructural insight of materials. We include use of AstroEBSD for single pixel based EBSD mapping and conventional orientation mapping; followed by an unsupervised machine learning approach using principal…
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We present a few recent developments in the field of electron backscatter diffraction (EBSD). We highlight how open source algorithms and open data formats can be used to rapidly to develop microstructural insight of materials. We include use of AstroEBSD for single pixel based EBSD mapping and conventional orientation mapping; followed by an unsupervised machine learning approach using principal component analysis and multivariate statistics combined with a refined template matching method to rapidly index orientation data with high precision. Next, we compare a diffraction pattern captured using direct electron detector with a dynamical simulation and project this to create a high quality experimental "reference diffraction sphere". Finally, we classify phases using supervised machine learning with transfer learning and a convolutional neural network.
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Submitted 12 August, 2019;
originally announced August 2019.
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Indexing Electron Backscatter Diffraction Patterns with a Refined Template Matching Approach
Authors:
Alexander Foden,
David Collins,
Angus Wilkinson,
Thomas Benjamin Britton
Abstract:
Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the crystals on the material surface. The conventional analysis method uses signal processing based on a Hough/Radon transform to index each diffraction pattern. This…
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Electron backscatter diffraction (EBSD) is a well-established method of characterisation for crystalline materials. This technique can rapidly acquire and index diffraction patterns to provide phase and orientation information about the crystals on the material surface. The conventional analysis method uses signal processing based on a Hough/Radon transform to index each diffraction pattern. This method is limited to the analysis of simple geometric features and ignores subtle characteristics of diffraction patterns, such as variations in relative band intensities. A second method, developed to address the shortcomings of the Hough/Radon transform, is based on template matching of a test experimental pattern with a large library of potential patterns. In the present work, the template matching approach has been refined with a new cross correlation function that allows for a smaller library and enables a dramatic speed up in pattern indexing. Refinement of the indexed orientation is performed with a follow-up step to allow for small alterations to the best match from the library search. The orientation is further refined with rapid measurement of misorientation using whole pattern matching. The refined template matching approach is shown to be comparable in accuracy, precision and sensitivity to the Hough based method, even exceeding it in some cases, via the use of simulations and experimental data collected from a silicon single crystal and a deformed α-iron sample. The drastic speed up and pattern refinement approaches should increase the widespread utility of pattern matching approaches.
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Submitted 9 July, 2019; v1 submitted 30 July, 2018;
originally announced July 2018.
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AstroEBSD: exploring new space in pattern indexing with methods launched from an astronomical approach
Authors:
Thomas Benjamin Britton,
Vivian Tong,
Jim Hickey,
Alex Foden,
Angus Wilkinson
Abstract:
Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is conventionally performed with raw electron backscatter patterns (EBSPs). These patterns are software processed to locate the band centres (and sometimes edges) fr…
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Electron backscatter diffraction (EBSD) is a technique used to measure crystallographic features in the scanning electron microscope. The technique is highly automated and readily accessible in many laboratories. EBSD pattern indexing is conventionally performed with raw electron backscatter patterns (EBSPs). These patterns are software processed to locate the band centres (and sometimes edges) from which the crystallographic index of each band is determined. Once a consistent index for many bands are obtained, the crystal orientation with respect to a reference sample & detector orientation can be determined and presented. Unfortunately, due to challenges related to crystal symmetry, there are limited available pattern indexing approaches and this has likely hampered open development of the technique. In this manuscript, we present a new method of pattern indexing, based upon a method with which satellites locate themselves in the night sky, and systematically demonstrate its effectiveness using dynamical simulations and real experimental patterns. The benefit of releasing this new algorithm is demonstrated as we utilise this indexing process, together with dynamical solutions, to provide some of the first accuracy assessments of an indexing solution. In disclosing a new indexing algorithm, and software processing tool-kit, we hope this opens up EBSD developments to more users. The software code and example data is released alongside this article for 3rd party developments.
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Submitted 17 July, 2018; v1 submitted 7 April, 2018;
originally announced April 2018.
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Understanding deformation with high angular resolution electron backscatter diffraction (HR-EBSD)
Authors:
T Ben Britton,
James L R Hickey
Abstract:
High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative misorientations of 1E-4 rads (~ 0.006 °) and changes in (deviatoric) lattice strain with a precision of 1E-4. This is achieved through direct comparison of two or more di…
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High angular resolution electron backscatter diffraction (HR-EBSD) affords an increase in angular resolution, as compared to 'conventional' Hough transform based EBSD, of two orders of magnitude, enabling measurements of relative misorientations of 1E-4 rads (~ 0.006 °) and changes in (deviatoric) lattice strain with a precision of 1E-4. This is achieved through direct comparison of two or more diffraction patterns using sophisticated cross-correlation based image analysis routines. Image shifts between zone axes in the two-correlated diffraction pattern are measured with sub-pixel precision and this realises the ability to measure changes in interplanar angles and lattice orientation with a high degree of sensitivity. These shifts are linked to strains and lattice rotations through simple geometry. In this manuscript, we outline the basis of the technique and two case studies that highlight its potential to tackle real materials science challenges, such as deformation patterning in polycrystalline alloys.
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Submitted 8 September, 2017;
originally announced October 2017.