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Skipper-in-CMOS: Non-Destructive Readout with Sub-Electron Noise Performance for Pixel Detectors
Authors:
Agustin J. Lapi,
Miguel Sofo-Haro,
Benjamin C. Parpillon,
Adi Birman,
Guillermo Fernandez-Moroni,
Lorenzo Rota,
Fabricio Alcalde Bessia,
Aseem Gupta,
Claudio Chavez Blanco,
Fernando Chierchie,
Julie Segal,
Christopher J. Kenney,
Angelo Dragone,
Shaorui Li,
Davide Braga,
Amos Fenigstein,
Juan Estrada,
Farah Fahim
Abstract:
The Skipper-in-CMOS image sensor integrates the non-destructive readout capability of Skipper Charge Coupled Devices (Skipper-CCDs) with the high conversion gain of a pinned photodiode in a CMOS imaging process, while taking advantage of in-pixel signal processing. This allows both single photon counting as well as high frame rate readout through highly parallel processing. The first results obtai…
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The Skipper-in-CMOS image sensor integrates the non-destructive readout capability of Skipper Charge Coupled Devices (Skipper-CCDs) with the high conversion gain of a pinned photodiode in a CMOS imaging process, while taking advantage of in-pixel signal processing. This allows both single photon counting as well as high frame rate readout through highly parallel processing. The first results obtained from a 15 x 15 um^2 pixel cell of a Skipper-in-CMOS sensor fabricated in Tower Semiconductor's commercial 180 nm CMOS Image Sensor process are presented. Measurements confirm the expected reduction of the readout noise with the number of samples down to deep sub-electron noise of 0.15rms e-, demonstrating the charge transfer operation from the pinned photodiode and the single photon counting operation when the sensor is exposed to light. The article also discusses new testing strategies employed for its operation and characterization.
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Submitted 13 November, 2024; v1 submitted 19 February, 2024;
originally announced February 2024.
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A Sub-Electron-Noise Multi-Channel Cryogenic Skipper-CCD Readout ASIC
Authors:
Fabricio Alcalde Bessia,
Troy England,
Hongzhi Sun,
Leandro Stefanazzi,
Davide Braga,
Miguel Sofo Haro,
Shaorui Li,
Juan Estrada,
Farah Fahim
Abstract:
The \emph{MIDNA} application specific integrated circuit (ASIC) is a skipper-CCD readout chip fabricated in a 65 nm LP-CMOS process that is capable of working at cryogenic temperatures. The chip integrates four front-end channels that process the skipper-CCD signal and performs differential averaging using a dual slope integration (DSI) circuit. Each readout channel contains a pre-amplifier, a DC…
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The \emph{MIDNA} application specific integrated circuit (ASIC) is a skipper-CCD readout chip fabricated in a 65 nm LP-CMOS process that is capable of working at cryogenic temperatures. The chip integrates four front-end channels that process the skipper-CCD signal and performs differential averaging using a dual slope integration (DSI) circuit. Each readout channel contains a pre-amplifier, a DC restorer, and a dual-slope integrator with chopping capability. The integrator chopping is a key system design element in order to mitigate the effect of low-frequency noise produced by the integrator itself, and it is not often required with standard CCDs. Each channel consumes 4.5 mW of power, occupies 0.156 mm${^2}$ area and has an input referred noise of 2.7${μν}_{rms}$. It is demonstrated experimentally to achieve sub-electron noise when coupled with a skipper-CCD by means of averaging samples of each pixel. Sub-electron noise is shown in three different acquisition approaches. The signal range is 6000 electrons. The readout system achieves 0.2${e^{-}}$ RMS by averaging 1000 samples with MIDNA both at room temperature and at 180 Kelvin.
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Submitted 25 April, 2023;
originally announced April 2023.
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Neutron Imaging Based on Transfer Foil Activation and COTS CMOS Image Sensors
Authors:
M. Pérez,
O. I. Abbate,
J. Lipovetzky,
F. Alcalde Bessia,
F. A. Sánchez,
M. Sofo Haro,
J. Longhino,
M. Gómez Berisso,
J. J. Blostein
Abstract:
In this paper we present a method for obtention of neutron images with Commercial-Off-The-Shelf (COTS) CMOS image sensors through the activation of indium foils. This detection method has been designed specifically for the acquisition of thermal and epitermal neutron images in mixed beams with a high gamma flux, and also for the study of high radioactive samples that are usually placed into resear…
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In this paper we present a method for obtention of neutron images with Commercial-Off-The-Shelf (COTS) CMOS image sensors through the activation of indium foils. This detection method has been designed specifically for the acquisition of thermal and epitermal neutron images in mixed beams with a high gamma flux, and also for the study of high radioactive samples that are usually placed into research reactor pools. We also present a technique to obtain multi-spectral neutron images taking advantage of the high neutron absorption cross-section of this material in the thermal energy range, as well as around the 1.45 eV resonance. Measurements performed in a neutron beam of the RA6 nuclear research reactor located in Bariloche, Argentina, confirm the capability of the proposed technique.
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Submitted 28 January, 2022;
originally announced January 2022.
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X-ray characterization of BUSARD chip: A HV-SOI monolithic particle detector with pixel sensors under the buried oxide
Authors:
Fabricio Alcalde Bessia,
José Lipovetzky,
Ivan Perić
Abstract:
This work presents the design of BUSARD, an application specific integrated circuit (ASIC) for the detection of ionizing particles. The ASIC is a monolithic active pixel sensor which has been fabricated in a High-Voltage Silicon-On-Insulator (HV-SOI) process that allows the fabrication of a buried N+ diffusion below the Buried OXide (BOX) as a standard processing step. The first version of the chi…
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This work presents the design of BUSARD, an application specific integrated circuit (ASIC) for the detection of ionizing particles. The ASIC is a monolithic active pixel sensor which has been fabricated in a High-Voltage Silicon-On-Insulator (HV-SOI) process that allows the fabrication of a buried N+ diffusion below the Buried OXide (BOX) as a standard processing step. The first version of the chip, BUSARD-A, takes advantage of this buried diffusion as an ionizing particle sensor. It includes a small array of 13$\times$13 pixels, with a pitch of $80\,μ$m, and each pixel has one buried diffusion with a charge amplifier, discriminator with offset tuning and digital processing. The detector has several operation modes including particle counting and Time-over-Threshold (ToT). An initial X-ray characterization of the detector was carried out, obtaining several pulse height and ToT spectra, which then were used to perform the energy calibration of the device. The Molybdenum $\mathbf{K_α}$ emission was measured with a standard deviation of $127\,e^{-}$ of ENC by using the analog pulse output, and with $276\,e^{-}$ of ENC by using the ToT digital output. The resolution in ToT mode is dominated by the pixel-to-pixel variation.
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Submitted 6 December, 2021;
originally announced December 2021.
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Analog pile-up circuit technique using a single capacitor for the readout of Skipper-CCD detectors
Authors:
Miguel Sofo Haro,
Claudio Chavez,
Jose Lipovetzky,
Fabricio Alcalde Bessia,
Gustavo Cancelo,
Fernando Chierchie,
Juan Estrada,
Guillermo Fernandez Moroni,
Leandro Stefanazzi,
Javier Tiffenberg,
Sho Uemura
Abstract:
With Skipper-CCD detectors it is possible to take multiple samples of the charge packet collected on each pixel. After averaging the samples, the noise can be extremely reduced allowing the exact counting of electrons per pixel. In this work we present an analog circuit that, with a minimum number of components, applies a double slope integration (DSI), and at the same time, it averages the multip…
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With Skipper-CCD detectors it is possible to take multiple samples of the charge packet collected on each pixel. After averaging the samples, the noise can be extremely reduced allowing the exact counting of electrons per pixel. In this work we present an analog circuit that, with a minimum number of components, applies a double slope integration (DSI), and at the same time, it averages the multiple samples producing at its output the pixel value with sub-electron noise. For this prupose, we introduce the technique of using the DSI integrator capacitor to add the skipper samples. An experimental verification using discrete components is presented, together with an analysis of its noise sources and limitations. After averaging 400 samples it was possible reach a readout noise of 0.2\,$e^-_{RMS}/pix$, comparable to other available readout systems. Due to its simplicity and significant reduction of the sampling requirements, this circuit technique is of particular interest in particle experiments and cameras with a high density of Skipper-CCDs.
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Submitted 20 August, 2021;
originally announced August 2021.
