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Effects of Laser-Annealing on Fixed-Frequency Superconducting Qubits
Authors:
Hyunseong Kim,
Christian Jünger,
Alexis Morvan,
Edward S. Barnard,
William P. Livingston,
M. Virginia P. Altoé,
Yosep Kim,
Chengyu Song,
Larry Chen,
John Mark Kreikebaum,
D. Frank Ogletree,
David I. Santiago,
Irfan Siddiqi
Abstract:
As superconducting quantum processors increase in complexity, techniques to overcome constraints on frequency crowding are needed. The recently developed method of laser-annealing provides an effective post-fabrication method to adjust the frequency of superconducting qubits. Here, we present an automated laser-annealing apparatus based on conventional microscopy components and demonstrate preserv…
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As superconducting quantum processors increase in complexity, techniques to overcome constraints on frequency crowding are needed. The recently developed method of laser-annealing provides an effective post-fabrication method to adjust the frequency of superconducting qubits. Here, we present an automated laser-annealing apparatus based on conventional microscopy components and demonstrate preservation of highly coherent transmons. In one case, we observe a two-fold increase in coherence after laser-annealing and perform noise spectroscopy on this qubit to investigate the change in defect features, in particular two-level system defects. Finally, we present a local heating model as well as demonstrate aging stability for laser-annealing on the wafer scale. Our work constitutes an important first step towards both understanding the underlying physical mechanism and scaling up laser-annealing of superconducting qubits.
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Submitted 7 June, 2022;
originally announced June 2022.
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Autonomous Investigations over WS$_2$ and Au{111} with Scanning Probe Microscopy
Authors:
John C. Thomas,
Antonio Rossi,
Darian Smalley,
Luca Francaviglia,
Zhuohang Yu,
Tianyi Zhang,
Shalini Kumari,
Joshua A. Robinson,
Mauricio Terrones,
Masahiro Ishigami,
Eli Rotenberg,
Edward S. Barnard,
Archana Raja,
Ed Wong,
D. Frank Ogletree,
Marcus M. Noack,
Alexander Weber-Bargioni
Abstract:
Individual atomic defects in 2D materials impact their macroscopic functionality. Correlating the interplay is challenging, however, intelligent hyperspectral scanning tunneling spectroscopy (STS) mapping provides a feasible solution to this technically difficult and time consuming problem. Here, dense spectroscopic volume is collected autonomously via Gaussian process regression, where convolutio…
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Individual atomic defects in 2D materials impact their macroscopic functionality. Correlating the interplay is challenging, however, intelligent hyperspectral scanning tunneling spectroscopy (STS) mapping provides a feasible solution to this technically difficult and time consuming problem. Here, dense spectroscopic volume is collected autonomously via Gaussian process regression, where convolutional neural networks are used in tandem for spectral identification. Acquired data enable defect segmentation, and a workflow is provided for machine-driven decision making during experimentation with capability for user customization. We provide a means towards autonomous experimentation for the benefit of both enhanced reproducibility and user-accessibility. Hyperspectral investigations on WS$_2$ sulfur vacancy sites are explored, which is combined with local density of states confirmation on the Au{111} herringbone reconstruction. Chalcogen vacancies, pristine WS$_2$, Au face-centered cubic, and Au hexagonal close packed regions are examined and detected by machine learning methods to demonstrate the potential of artificial intelligence for hyperspectral STS mapping.
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Submitted 2 May, 2022; v1 submitted 7 October, 2021;
originally announced October 2021.
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Direct formation of nitrogen-vacancy centers in nitrogen doped diamond along the trajectories of swift heavy ions
Authors:
Russell E. Lake,
Arun Persaud,
Casey Christian,
Edward S. Barnard,
Emory M. Chan,
Andrew A. Bettiol,
Marilena Tomut,
Christina Trautmann,
Thomas Schenkel
Abstract:
We report depth-resolved photoluminescence measurements of nitrogen-vacancy (NV$^-$) centers formed along the tracks of swift heavy ions (SHIs) in type Ib synthetic single crystal diamonds that had been doped with 100 ppm nitrogen during crystal growth. Analysis of the spectra shows that NV$^-$ centers are formed preferentially within regions where electronic stopping processes dominate and not at…
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We report depth-resolved photoluminescence measurements of nitrogen-vacancy (NV$^-$) centers formed along the tracks of swift heavy ions (SHIs) in type Ib synthetic single crystal diamonds that had been doped with 100 ppm nitrogen during crystal growth. Analysis of the spectra shows that NV$^-$ centers are formed preferentially within regions where electronic stopping processes dominate and not at the end of the ion range where elastic collisions lead to formation of vacancies and defects. Thermal annealing further increases NV yields after irradiation with SHIs preferentially in regions with high vacancy densities. NV centers formed along the tracks of single swift heavy ions can be isolated with lift-out techniques for explorations of color center qubits in quasi-1D registers with an average qubit spacing of a few nanometers and of order 100 color centers per micrometer along 10 to 30 micrometer long percolation chains.
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Submitted 1 March, 2021; v1 submitted 6 November, 2020;
originally announced November 2020.
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py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets
Authors:
Benjamin H Savitzky,
Lauren A Hughes,
Steven E Zeltmann,
Hamish G Brown,
Shiteng Zhao,
Philipp M Pelz,
Edward S Barnard,
Jennifer Donohue,
Luis Rangel DaCosta,
Thomas C. Pekin,
Ellis Kennedy,
Matthew T Janish,
Matthew M Schneider,
Patrick Herring,
Chirranjeevi Gopal,
Abraham Anapolsky,
Peter Ercius,
Mary Scott,
Jim Ciston,
Andrew M Minor,
Colin Ophus
Abstract:
Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in…
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Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, including signatures of the local structure, orientation, deformation, electromagnetic fields and other sample-dependent properties. However, extracting this information requires complex analysis pipelines, from data wrangling to calibration to analysis to visualization, all while maintaining robustness against imaging distortions and artifacts. In this paper, we present py4DSTEM, an analysis toolkit for measuring material properties from 4D-STEM datasets, written in the Python language and released with an open source license. We describe the algorithmic steps for dataset calibration and various 4D-STEM property measurements in detail, and present results from several experimental datasets. We have also implemented a simple and universal file format appropriate for electron microscopy data in py4DSTEM, which uses the open source HDF5 standard. We hope this tool will benefit the research community, helps to move the developing standards for data and computational methods in electron microscopy, and invite the community to contribute to this ongoing, fully open-source project.
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Submitted 20 March, 2020;
originally announced March 2020.
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Long-Range Exciton Diffusion in Two-Dimensional Assemblies of Cesium Lead Bromide Perovskite Nanocrystals
Authors:
Erika Penzo,
Anna Loiudice,
Edward S. Barnard,
Nicholas J. Borys,
Matthew J. Jurow,
Monica Lorenzon,
Igor Rajzbaum,
Edward K. Wong,
Yi Liu,
Adam M. Schwartzberg,
Stefano Cabrini,
Stephen Whitelam,
Raffaella Buonsanti,
Alexander Weber-Bargioni
Abstract:
Förster Resonant Energy Transfer (FRET)-mediated exciton diffusion through artificial nanoscale building block assemblies could be used as a new optoelectronic design element to transport energy. However, so far nanocrystal (NC) systems supported only diffusion length of 30 nm, which are too small to be useful in devices. Here, we demonstrate a FRET-mediated exciton diffusion length of 200 nm with…
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Förster Resonant Energy Transfer (FRET)-mediated exciton diffusion through artificial nanoscale building block assemblies could be used as a new optoelectronic design element to transport energy. However, so far nanocrystal (NC) systems supported only diffusion length of 30 nm, which are too small to be useful in devices. Here, we demonstrate a FRET-mediated exciton diffusion length of 200 nm with 0.5 cm2/s diffusivity through an ordered, two-dimensional assembly of cesium lead bromide perovskite nanocrystals (PNC). Exciton diffusion was directly measured via steady-state and time-resolved photoluminescence (PL) microscopy, with physical modeling providing deeper insight into the transport process. This exceptionally efficient exciton transport is facilitated by PNCs high PL quantum yield, large absorption cross-section, and high polarizability, together with minimal energetic and geometric disorder of the assembly. This FRET-mediated exciton diffusion length matches perovskites optical absorption depth, opening the possibility to design new optoelectronic device architectures with improved performances, and providing insight into the high conversion efficiencies of PNC-based optoelectronic devices.
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Submitted 1 September, 2020; v1 submitted 9 March, 2020;
originally announced March 2020.
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Visualizing buried local carrier diffusion in halide perovskite crystals via two-photon microscopy
Authors:
Camille Stavrakas,
Géraud Delport,
Ayan A. Zhumekenov,
Miguel Anaya,
Rosemonde Chahbazian,
Osman M. Bakr,
Edward S. Barnard,
Samuel D. Stranks
Abstract:
Halide perovskites have shown great potential for light emission and photovoltaic applications due to their remarkable electronic properties and compatibility with cost-effective fabrication techniques. Although the device performances are promising, they are still limited by microscale heterogeneities in their photophysical properties. In particular, the relation between local heterogeneities and…
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Halide perovskites have shown great potential for light emission and photovoltaic applications due to their remarkable electronic properties and compatibility with cost-effective fabrication techniques. Although the device performances are promising, they are still limited by microscale heterogeneities in their photophysical properties. In particular, the relation between local heterogeneities and the diffusion of charge carriers at the surface and in the bulk, crucial for efficient collection of charges in a light harvesting device, is not well understood. Here, a photoluminescence tomography technique is developed in a confocal microscope using one- and two-photon excitation to distinguish between local surface and bulk diffusion of charge carriers in methylammonium lead bromide single crystals. The local temporal diffusion is probed at various excitation depths to build statistics of local electronic diffusion coefficients. The measured values range between 0.3 to 2 $cm^2.s^{-1}$ depending on the local trap density and the morphological environment - a distribution that would be missed from analogous macroscopic or surface-measurements. Tomographic images of carrier diffusion were reconstructed to reveal buried crystal defects that act as barriers to carrier transport. This work reveals a new framework to understand and homogenise diffusion pathways, which are extremely sensitive to local properties and buried defects.
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Submitted 28 September, 2019;
originally announced September 2019.
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Bright sub-20 nm cathodoluminescent nanoprobes for multicolor electron microscopy
Authors:
Maxim B. Prigozhin,
Peter C. Maurer,
Alexandra M. Courtis,
Nian Liu,
Michael D. Wisser,
Chris Siefe,
Bining Tian,
Emory Chan,
Guosheng Song,
Stefan Fischer,
Shaul Aloni,
D. Frank Ogletree,
Edward S. Barnard,
Lydia-Marie Joubert,
Jianghong Rao,
A. Paul Alivisatos,
Roger M. Macfarlane,
Bruce E. Cohen,
Yi Cui,
Jennifer A. Dionne,
Steven Chu
Abstract:
Electron microscopy (EM) has been instrumental in our understanding of biological systems ranging from subcellular structures to complex organisms. Although EM reveals cellular morphology with nanoscale resolution, it does not provide information on the location of proteins within a cellular context. An EM-based bioimaging technology capable of localizing individual proteins and resolving protein-…
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Electron microscopy (EM) has been instrumental in our understanding of biological systems ranging from subcellular structures to complex organisms. Although EM reveals cellular morphology with nanoscale resolution, it does not provide information on the location of proteins within a cellular context. An EM-based bioimaging technology capable of localizing individual proteins and resolving protein-protein interactions with respect to cellular ultrastructure would provide important insights into the molecular biology of a cell. Here, we report on the development of luminescent nanoprobes potentially suitable for labeling biomolecules in a multicolor EM modality. In this approach, the labels are based on lanthanide-doped nanoparticles that emit light under electron excitation in a process known as cathodoluminescence (CL). Our results suggest that the optimization of nanoparticle composition, synthesis protocols and electron imaging conditions could enable high signal-to-noise localization of biomolecules with a sub-20-nm resolution, limited only by the nanoparticle size. In ensemble measurements, these luminescent labels exhibit narrow spectra of nine distinct colors that are characteristic of the corresponding rare-earth dopant type.
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Submitted 30 May, 2018;
originally announced June 2018.
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Solving dielectric and plasmonic waveguide dispersion relations with a pocket calculator
Authors:
Rohan D. Kekatpure,
Aaron C. Hryciw,
Edward S. Barnard,
Mark L. Brongersma
Abstract:
We present a robust iterative technique for solving complex transcendental dispersion equations routinely encountered in integrated optics. Our method especially befits the multilayer dielectric and plasmonic waveguides forming the basis structures for a host of contemporary nanophotonic devices. The solution algorithm ports seamlessly from the real to the complex domain--i.e., no extra complexi…
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We present a robust iterative technique for solving complex transcendental dispersion equations routinely encountered in integrated optics. Our method especially befits the multilayer dielectric and plasmonic waveguides forming the basis structures for a host of contemporary nanophotonic devices. The solution algorithm ports seamlessly from the real to the complex domain--i.e., no extra complexity results when dealing with leaky structures or those with material/metal loss. Unlike several existing numerical approaches, our algorithm exhibits markedly-reduced sensitivity to the initial guess and allows for straightforward implementation on a pocket calculator.
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Submitted 14 October, 2009; v1 submitted 27 September, 2009;
originally announced September 2009.
