A computational method for modeling arbitrary junctions employing different surface integral equation formulations for three-dimensional scattering and radiation problems
Authors:
Hipolito Gomez-Sousa,
Oscar Rubiños-Lopez,
Jose Angel Martinez-Lorenzo,
Marcos Arias-Acuña
Abstract:
This paper presents a new method, based on the well-known method of moments (MoM), for the numerical electromagnetic analysis of scattering and radiation from metallic or dielectric structures, or both structure types in the same simulation, that are in contact with other metallic or dielectric structures. The proposed method for solving the MoM junction problem consists of two separate algorithms…
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This paper presents a new method, based on the well-known method of moments (MoM), for the numerical electromagnetic analysis of scattering and radiation from metallic or dielectric structures, or both structure types in the same simulation, that are in contact with other metallic or dielectric structures. The proposed method for solving the MoM junction problem consists of two separate algorithms, one of which comprises a generalization for bodies in contact of the surface integral equation (SIE) formulations. Unlike some other published SIE generalizations in the field of computational electromagnetics, this generalization does not require duplicating unknowns on the dielectric separation surfaces. Additionally, this generalization is applicable to any ordinary single-scatterer SIE formulations employed as baseline. The other algorithm deals with enforcing boundary conditions and Kirchhoff's Law, relating the surface current flow across a junction edge. Two important features inherent to this latter algorithm consist of a mathematically compact description in matrix form, and, importantly from a software engineering point of view, an easy implementation in existing MoM codes which makes the debugging process more comprehensible. A practical example involving a real grounded monopole antenna for airplane-satellite communication is analyzed for validation purposes by comparing with precise measurements covering different electrical sizes.
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Submitted 19 October, 2015;
originally announced October 2015.
