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Showing 1–3 of 3 results for author: Xin, H L

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  1. arXiv:2210.09024  [pdf

    eess.IV cond-mat.mtrl-sci cs.CV

    Periodic Artifact Reduction in Fourier transforms of Full Field Atomic Resolution Images

    Authors: Robert Hovden, Yi Jiang, Huolin L. Xin, Lena F. Kourkoutis

    Abstract: The discrete Fourier transform is among the most routine tools used in high-resolution scanning / transmission electron microscopy (S/TEM). However, when calculating a Fourier transform, periodic boundary conditions are imposed and sharp discontinuities between the edges of an image cause a cross patterned artifact along the reciprocal space axes. This artifact can interfere with the analysis of r… ▽ More

    Submitted 14 October, 2022; originally announced October 2022.

    Journal ref: Microscopy and Microanalysis, 21(2), 436-441 (2015)

  2. arXiv:2209.13026  [pdf

    cond-mat.mtrl-sci cs.LG eess.SP physics.chem-ph

    Electron energy loss spectroscopy database synthesis and automation of core-loss edge recognition by deep-learning neural networks

    Authors: Lingli Kong, Zhengran Ji, Huolin L. Xin

    Abstract: The ionization edges encoded in the electron energy loss spectroscopy (EELS) spectra enable advanced material analysis including composition analyses and elemental quantifications. The development of the parallel EELS instrument and fast, sensitive detectors have greatly improved the acquisition speed of EELS spectra. However, the traditional way of core-loss edge recognition is experience based a… ▽ More

    Submitted 26 September, 2022; originally announced September 2022.

    Comments: 23 pages, 6 figures

  3. arXiv:2003.12259  [pdf

    cond-mat.mtrl-sci eess.IV physics.app-ph physics.ins-det

    0.71-Å resolution electron tomography enabled by deep learning aided information recovery

    Authors: Chunyang Wang, Guanglei Ding, Yitong Liu, Huolin L. Xin

    Abstract: Electron tomography, as an important 3D imaging method, offers a powerful method to probe the 3D structure of materials from the nano- to the atomic-scale. However, as a grant challenge, radiation intolerance of the nanoscale samples and the missing-wedge-induced information loss and artifacts greatly hindered us from obtaining 3D atomic structures with high fidelity. Here, for the first time, by… ▽ More

    Submitted 27 March, 2020; originally announced March 2020.