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Dictionary Attack on IMU-based Gait Authentication
Authors:
Rajesh Kumar,
Can Isik,
Chilukuri K. Mohan
Abstract:
We present a novel adversarial model for authentication systems that use gait patterns recorded by the inertial measurement unit (IMU) built into smartphones. The attack idea is inspired by and named after the concept of a dictionary attack on knowledge (PIN or password) based authentication systems. In particular, this work investigates whether it is possible to build a dictionary of IMUGait patt…
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We present a novel adversarial model for authentication systems that use gait patterns recorded by the inertial measurement unit (IMU) built into smartphones. The attack idea is inspired by and named after the concept of a dictionary attack on knowledge (PIN or password) based authentication systems. In particular, this work investigates whether it is possible to build a dictionary of IMUGait patterns and use it to launch an attack or find an imitator who can actively reproduce IMUGait patterns that match the target's IMUGait pattern. Nine physically and demographically diverse individuals walked at various levels of four predefined controllable and adaptable gait factors (speed, step length, step width, and thigh-lift), producing 178 unique IMUGait patterns. Each pattern attacked a wide variety of user authentication models. The deeper analysis of error rates (before and after the attack) challenges the belief that authentication systems based on IMUGait patterns are the most difficult to spoof; further research is needed on adversarial models and associated countermeasures.
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Submitted 31 December, 2023; v1 submitted 21 September, 2023;
originally announced September 2023.
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WaferSegClassNet -- A Light-weight Network for Classification and Segmentation of Semiconductor Wafer Defects
Authors:
Subhrajit Nag,
Dhruv Makwana,
Sai Chandra Teja R,
Sparsh Mittal,
C Krishna Mohan
Abstract:
As the integration density and design intricacy of semiconductor wafers increase, the magnitude and complexity of defects in them are also on the rise. Since the manual inspection of wafer defects is costly, an automated artificial intelligence (AI) based computer-vision approach is highly desired. The previous works on defect analysis have several limitations, such as low accuracy and the need fo…
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As the integration density and design intricacy of semiconductor wafers increase, the magnitude and complexity of defects in them are also on the rise. Since the manual inspection of wafer defects is costly, an automated artificial intelligence (AI) based computer-vision approach is highly desired. The previous works on defect analysis have several limitations, such as low accuracy and the need for separate models for classification and segmentation. For analyzing mixed-type defects, some previous works require separately training one model for each defect type, which is non-scalable. In this paper, we present WaferSegClassNet (WSCN), a novel network based on encoder-decoder architecture. WSCN performs simultaneous classification and segmentation of both single and mixed-type wafer defects. WSCN uses a "shared encoder" for classification, and segmentation, which allows training WSCN end-to-end. We use N-pair contrastive loss to first pretrain the encoder and then use BCE-Dice loss for segmentation, and categorical cross-entropy loss for classification. Use of N-pair contrastive loss helps in better embedding representation in the latent dimension of wafer maps. WSCN has a model size of only 0.51MB and performs only 0.2M FLOPS. Thus, it is much lighter than other state-of-the-art models. Also, it requires only 150 epochs for convergence, compared to 4,000 epochs needed by a previous work. We evaluate our model on the MixedWM38 dataset, which has 38,015 images. WSCN achieves an average classification accuracy of 98.2% and a dice coefficient of 0.9999. We are the first to show segmentation results on the MixedWM38 dataset. The source code can be obtained from https://github.com/ckmvigil/WaferSegClassNet.
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Submitted 3 July, 2022;
originally announced July 2022.
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Defining Traffic States using Spatio-temporal Traffic Graphs
Authors:
Debaditya Roy,
K. Naveen Kumar,
C. Krishna Mohan
Abstract:
Intersections are one of the main sources of congestion and hence, it is important to understand traffic behavior at intersections. Particularly, in developing countries with high vehicle density, mixed traffic type, and lane-less driving behavior, it is difficult to distinguish between congested and normal traffic behavior. In this work, we propose a way to understand the traffic state of smaller…
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Intersections are one of the main sources of congestion and hence, it is important to understand traffic behavior at intersections. Particularly, in developing countries with high vehicle density, mixed traffic type, and lane-less driving behavior, it is difficult to distinguish between congested and normal traffic behavior. In this work, we propose a way to understand the traffic state of smaller spatial regions at intersections using traffic graphs. The way these traffic graphs evolve over time reveals different traffic states - a) a congestion is forming (clumping), the congestion is dispersing (unclumping), or c) the traffic is flowing normally (neutral). We train a spatio-temporal deep network to identify these changes. Also, we introduce a large dataset called EyeonTraffic (EoT) containing 3 hours of aerial videos collected at 3 busy intersections in Ahmedabad, India. Our experiments on the EoT dataset show that the traffic graphs can help in correctly identifying congestion-prone behavior in different spatial regions of an intersection.
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Submitted 27 July, 2020;
originally announced August 2020.
