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Showing 1–1 of 1 results for author: Agarwal, N S

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  1. arXiv:2505.05054  [pdf, other

    eess.IV cs.AI cs.CV

    Direct Image Classification from Fourier Ptychographic Microscopy Measurements without Reconstruction

    Authors: Navya Sonal Agarwal, Jan Philipp Schneider, Kanchana Vaishnavi Gandikota, Syed Muhammad Kazim, John Meshreki, Ivo Ihrke, Michael Moeller

    Abstract: The computational imaging technique of Fourier Ptychographic Microscopy (FPM) enables high-resolution imaging with a wide field of view and can serve as an extremely valuable tool, e.g. in the classification of cells in medical applications. However, reconstructing a high-resolution image from tens or even hundreds of measurements is computationally expensive, particularly for a wide field of view… ▽ More

    Submitted 8 May, 2025; originally announced May 2025.

    Comments: ISCS 2025