Bayesian Deconvolution of Scanning Electron Microscopy Images Using Point-spread Function Estimation and Non-local Regularization
Authors:
Joris Roels,
Jan Aelterman,
Jonas De Vylder,
Hiep Luong,
Yvan Saeys,
Wilfried Philips
Abstract:
Microscopy is one of the most essential imaging techniques in life sciences. High-quality images are required in order to solve (potentially life-saving) biomedical research problems. Many microscopy techniques do not achieve sufficient resolution for these purposes, being limited by physical diffraction and hardware deficiencies. Electron microscopy addresses optical diffraction by measuring emit…
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Microscopy is one of the most essential imaging techniques in life sciences. High-quality images are required in order to solve (potentially life-saving) biomedical research problems. Many microscopy techniques do not achieve sufficient resolution for these purposes, being limited by physical diffraction and hardware deficiencies. Electron microscopy addresses optical diffraction by measuring emitted or transmitted electrons instead of photons, yielding nanometer resolution. Despite pushing back the diffraction limit, blur should still be taken into account because of practical hardware imperfections and remaining electron diffraction. Deconvolution algorithms can remove some of the blur in post-processing but they depend on knowledge of the point-spread function (PSF) and should accurately regularize noise. Any errors in the estimated PSF or noise model will reduce their effectiveness. This paper proposes a new procedure to estimate the lateral component of the point spread function of a 3D scanning electron microscope more accurately. We also propose a Bayesian maximum a posteriori deconvolution algorithm with a non-local image prior which employs this PSF estimate and previously developed noise statistics. We demonstrate visual quality improvements and show that applying our method improves the quality of subsequent segmentation steps.
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Submitted 23 October, 2018;
originally announced October 2018.
Convolutional Neural Network Pruning to Accelerate Membrane Segmentation in Electron Microscopy
Authors:
Joris Roels,
Jonas De Vylder,
Jan Aelterman,
Yvan Saeys,
Wilfried Philips
Abstract:
Biological membranes are one of the most basic structures and regions of interest in cell biology. In the study of membranes, segment extraction is a well-known and difficult problem because of impeding noise, directional and thickness variability, etc. Recent advances in electron microscopy membrane segmentation are able to cope with such difficulties by training convolutional neural networks. Ho…
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Biological membranes are one of the most basic structures and regions of interest in cell biology. In the study of membranes, segment extraction is a well-known and difficult problem because of impeding noise, directional and thickness variability, etc. Recent advances in electron microscopy membrane segmentation are able to cope with such difficulties by training convolutional neural networks. However, because of the massive amount of features that have to be extracted while propagating forward, the practical usability diminishes, even with state-of-the-art GPU's. A significant part of these network features typically contains redundancy through correlation and sparsity. In this work, we propose a pruning method for convolutional neural networks that ensures the training loss increase is minimized. We show that the pruned networks, after retraining, are more efficient in terms of time and memory, without significantly affecting the network accuracy. This way, we manage to obtain real-time membrane segmentation performance, for our specific electron microscopy setup.
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Submitted 23 October, 2018;
originally announced October 2018.
