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Bismuth doping induced enhancement of the spin-orbit coupling strength in the prototype dilute ferromagnetic semiconductor (Ga,Mn)As: a review
Authors:
Tadeusz Wosinski
Abstract:
Extensive studies on the impact of bismuth incorporation into the (Ga,Mn)As prototype dilute ferromagnetic semiconductor (DFS) on its structural, magnetic and magnetotransport properties are summarized in this review. Thin epitaxial layers of the quaternary (Ga,Mn)(Bi,As) compound, containing up to 1% Bi and 6% Mn atoms, and the reference ternary (Ga,Mn)As compound, have been grown under either a…
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Extensive studies on the impact of bismuth incorporation into the (Ga,Mn)As prototype dilute ferromagnetic semiconductor (DFS) on its structural, magnetic and magnetotransport properties are summarized in this review. Thin epitaxial layers of the quaternary (Ga,Mn)(Bi,As) compound, containing up to 1% Bi and 6% Mn atoms, and the reference ternary (Ga,Mn)As compound, have been grown under either a compressive or tensile biaxial misfit strain by the low-temperature molecular-beam epitaxy technique with precisely optimized growth conditions. The high-resolution X-ray diffractometry measurements and transmission electron microscopy imaging of cross-sections across the sample interfaces have evidenced for high structural perfection of the DFS layers and sharp interfaces with the substrate. An addition of bismuth into the layers causes a small decrease in their ferromagnetic Curie temperature and a distinct increase in the coercive fields, as revealed by the superconducting quantum interference device magnetometry investigations. Most of all, the incorporation of a small atomic fraction of heavy Bi atoms, substituting As atoms in the layer, predominantly enhances the spin-orbit coupling strength in its valence band, considerably affecting electromagnetic properties of the layers. Investigations of magnetotransport properties of the DFS layers, performed on micro-Hall-bars prepared from the layers using electron-beam lithography patterning, reveal, as a result of Bi addition to the layers, significantly enhanced magnitudes of magnetoresistance, anomalous and planar Hall effects as well as the spin-orbit torque effect. The latter effect is of special interest for applications to the next generation non-volatile data storage and logic spintronic devices, utilizing electrically controlled magnetization reversal.
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Submitted 23 December, 2024;
originally announced December 2024.
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Current-induced magnetization reversal in (Ga,Mn)(Bi,As) epitaxial layer with perpendicular magnetic anisotropy
Authors:
Tomasz Andrearczyk,
Janusz Sadowski,
Krzysztof Dybko,
Tadeusz Figielski,
Tadeusz Wosinski
Abstract:
Pulsed current-induced magnetization reversal is investigated in the layer of (Ga,Mn)(Bi,As) dilute ferromagnetic semiconductor (DFS) epitaxially grown under tensile misfit strain causing perpendicular magnetic anisotropy in the layer. The magnetization reversal, recorded through measurements of the anomalous Hall effect, appearing under assistance of a static magnetic field parallel to the curren…
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Pulsed current-induced magnetization reversal is investigated in the layer of (Ga,Mn)(Bi,As) dilute ferromagnetic semiconductor (DFS) epitaxially grown under tensile misfit strain causing perpendicular magnetic anisotropy in the layer. The magnetization reversal, recorded through measurements of the anomalous Hall effect, appearing under assistance of a static magnetic field parallel to the current, is interpreted in terms of the spin-orbit torque mechanism. Our results demonstrate that an addition of a small fraction of heavy Bi atoms, substituting As atoms in the prototype DFS (Ga,Mn)As and increasing the strength of spin-orbit coupling in the DFS valence band, significantly enhances the efficiency of current-induced magnetization reversal thus reducing considerably the threshold current density necessary for the reversal. Our findings are of technological importance for applications to spin-orbit torque-driven nonvolatile memory and logic elements.
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Submitted 22 August, 2022;
originally announced August 2022.
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Structural defects in MBE-grown CdTe-based heterojunctions for photovoltaic applications
Authors:
Karolina Wichrowska,
Tadeusz Wosinski,
Jaroslaw Z. Domagala,
Slawomir Kret,
Sergij Chusnutdinow,
Grzegorz Karczewski
Abstract:
Structural defects in the p-ZnTe/i-CdTe/n-CdTe single-crystalline heterojunctions designed for photovoltaic applications have been investigated by transmission electron microscopy (TEM) and deep-level transient spectroscopy (DLTS). Lattice parameters and misfit strain in the undoped CdTe absorber layers of the heterojunctions, grown by the molecular-beam epitaxy technique on two different substrat…
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Structural defects in the p-ZnTe/i-CdTe/n-CdTe single-crystalline heterojunctions designed for photovoltaic applications have been investigated by transmission electron microscopy (TEM) and deep-level transient spectroscopy (DLTS). Lattice parameters and misfit strain in the undoped CdTe absorber layers of the heterojunctions, grown by the molecular-beam epitaxy technique on two different substrates, GaAs and CdTe, have been determined with high-resolution X-ray diffractometry. A dense network of misfit dislocations at the lattice-mismatched CdTe/GaAs and ZnTe/CdTe interfaces and numerous threading dislocations and stacking faults have been shown by the cross-sectional TEM imaging of the heterojunctions. The DLTS measurements revealed five deep-level traps in the heterojunctions grown on the GaAs substrates and only three of them in the heterojunctions grown on CdTe. One of the traps, showing the exponential capture kinetics of charge carriers, has been identified as associated with the double acceptor level of Cd vacancies in the CdTe absorber layers. All the other traps have been attributed to the electronic states of extended defects, presumably dislocations, on the grounds of their logarithmic capture kinetics. Two of these traps, displaying the largest values of their capture cross-section and the properties characteristic of bandlike electronic states, have been ascribed to the core states of dislocations. It is argued that they are most likely responsible for decreased lifetime of photo-excited carriers resulting in a low energy conversion efficiency of solar cells based on similarly grown heterojunctions.
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Submitted 24 December, 2019;
originally announced December 2019.
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On the origin of magnetism in (Ga,Mn)As: from paramagnetic through superparamagnetic to ferromagnetic phase
Authors:
L. Gluba,
O. Yastrubchak,
J. Z. Domagala,
R. Jakiela,
T. Andrearczyk,
J. Żuk,
T. Wosinski,
J. Sadowski,
M. Sawicki
Abstract:
The high-spectral-resolution spectroscopic studies of the energy gap evolution, supplemented with electronic, magnetic and structural characterization, show that the modification of the GaAs valence band caused by Mn incorporation occurs already for a very low Mn content, much lower than that required to support ferromagnetic spin - spin coupling in (Ga,Mn)As. Only for n-type (Ga,Mn)As with the Mn…
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The high-spectral-resolution spectroscopic studies of the energy gap evolution, supplemented with electronic, magnetic and structural characterization, show that the modification of the GaAs valence band caused by Mn incorporation occurs already for a very low Mn content, much lower than that required to support ferromagnetic spin - spin coupling in (Ga,Mn)As. Only for n-type (Ga,Mn)As with the Mn content below about 0.3% the Mn-related extended states are visible as a feature detached from the valence-band edge and partly occupied with electrons. The combined magnetic and low-temperature photoreflectance studies presented here indicate that the paramagnetic - ferromagnetic transformation in p-type (Ga,Mn)As takes place without imposing changes of the unitary character of the valence band with the Fermi level located therein. The whole process is rooted in the nanoscale fluctuations of the local (hole) density of states and the formation of a superparamagnetic-like state. The Fermi level in (Ga,Mn)As is coarsened by the carrier concentration of the itinerant valence band holes and further fine-tuned by the many-body interactions.
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Submitted 21 August, 2017;
originally announced August 2017.
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Novel Quaternary Dilute Magnetic Semiconductor (Ga,Mn)(Bi,As): Magnetic and Magneto-Transport Investigations
Authors:
K. Levchenko,
T. Andrearczyk,
J. Z. Domagala,
J. Sadowski,
L. Kowalczyk,
M. Szot,
R. Kuna,
T. Figielski,
T. Wosinski
Abstract:
Magnetic and magneto-transport properties of thin layers of the (Ga,Mn)(Bi,As) quaternary dilute magnetic semiconductor grown by the low-temperature molecular-beam epitaxy technique on GaAs substrates have been investigated. Ferromagnetic Curie temperature and magneto-crystalline anisotropy of the layers have been examined by using magneto-optical Kerr effect magnetometry and low-temperature magne…
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Magnetic and magneto-transport properties of thin layers of the (Ga,Mn)(Bi,As) quaternary dilute magnetic semiconductor grown by the low-temperature molecular-beam epitaxy technique on GaAs substrates have been investigated. Ferromagnetic Curie temperature and magneto-crystalline anisotropy of the layers have been examined by using magneto-optical Kerr effect magnetometry and low-temperature magneto-transport measurements. Postgrowth annealing treatment has been shown to enhance the hole concentration and Curie temperature in the layers. Significant increase in the magnitude of magnetotransport effects caused by incorporation of a small amount of Bi into the (Ga,Mn)As layers revealed in the planar Hall effect (PHE) measurements, is interpreted as a result of enhanced spin-orbit coupling in the (Ga,Mn)(Bi,As) layers. Two-state behaviour of the planar Hall resistance at zero magnetic field provides its usefulness for applications in nonvolatile memory devices.
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Submitted 9 July, 2016;
originally announced July 2016.
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Effect of Misfit Strain in (Ga,Mn)(Bi,As) Epitaxial Layers on their Magnetic and Magneto-Transport Properties
Authors:
K. Levchenko,
T. Andrearczyk,
J. Z. Domagala,
J. Sadowski,
L. Kowalczyk,
M. Szot,
T. Figielski,
T. Wosinski
Abstract:
Effect of misfit strain in the layers of (Ga,Mn)(Bi,As) quaternary diluted magnetic semiconductor, epitaxially grown on either GaAs substrate or (In,Ga)As buffer, on their magnetic and magneto-transport properties has been investigated. High-resolution X-ray diffraction, applied to characterize the structural quality and misfit strain in the layers, proved that the layers were fully strained to th…
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Effect of misfit strain in the layers of (Ga,Mn)(Bi,As) quaternary diluted magnetic semiconductor, epitaxially grown on either GaAs substrate or (In,Ga)As buffer, on their magnetic and magneto-transport properties has been investigated. High-resolution X-ray diffraction, applied to characterize the structural quality and misfit strain in the layers, proved that the layers were fully strained to the GaAs substrate or (In,Ga)As buffer under compressive or tensile strain, respectively. Ferromagnetic Curie temperature and magnetocrystalline anisotropy of the layers have been examined by using magneto-optical Kerr effect magnetometry and low-temperature magneto-transport measurements. Post-growth annealing treatment of the layers has been shown to enhance the hole concentration and Curie temperature in the layers.
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Submitted 29 June, 2015;
originally announced June 2015.
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Magnetic and magneto-transport characterization of (Ga,Mn)(Bi,As) epitaxial layers
Authors:
K. Levchenko,
T. Andrearczyk,
J. Z. Domagala,
T. Wosinski,
T. Figielski,
J. Sadowski
Abstract:
High-quality layers of the (Ga,Mn)(Bi,As) quaternary compound semiconductor have been grown by the low-temperature molecular-beam epitaxy technique. An effect of Bi incorporation into the (Ga,Mn)As ferromagnetic semiconductor and the post-growth annealing treatment of the layers have been investigated through examination of their magnetic and magneto-transport properties. Significant enhancement o…
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High-quality layers of the (Ga,Mn)(Bi,As) quaternary compound semiconductor have been grown by the low-temperature molecular-beam epitaxy technique. An effect of Bi incorporation into the (Ga,Mn)As ferromagnetic semiconductor and the post-growth annealing treatment of the layers have been investigated through examination of their magnetic and magneto-transport properties. Significant enhancement of the planar Hall effect magnitude upon addition of Bi into the layers is interpreted as a result of increased spin-orbit coupling in the (Ga,Mn)(Bi,As) layers.
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Submitted 19 June, 2014;
originally announced June 2014.
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Analysis of the $E_{1}$ and $E_{1}$ +$Δ_{1}$ optical transitions in (Ga,Mn)As epitaxial layers
Authors:
L. Gluba,
O. Yastrubchak,
G. Sek,
W. Rudno-Rudziński,
J. Sadowski,
M. Kulik,
W. Rzodkiewicz,
M. Rawski,
T. Andrearczyk,
T. Wosinski,
J. Żuk
Abstract:
The diluted (Ga,Mn)As became a model ferromagnetic semiconductor, however there is still a disagreement on the source of its magnetism. The divergences arise from the results indicating that the holes mediated ferromagnetism reside in the valence band or the impurity band. Full understanding of character of the Mn states in GaAs can bring the increase of (Ga,Mn)As Curie temperature. In this paper…
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The diluted (Ga,Mn)As became a model ferromagnetic semiconductor, however there is still a disagreement on the source of its magnetism. The divergences arise from the results indicating that the holes mediated ferromagnetism reside in the valence band or the impurity band. Full understanding of character of the Mn states in GaAs can bring the increase of (Ga,Mn)As Curie temperature. In this paper we verify the ellipsometric results and compare with more precise photoreflectance method which gives a new insight into the interactions of Mn impurity states with GaAs valence band. Indeed, $E_{1}$ and $E_{1}$+$Δ_{1}$ inter-band transition energies for highly doped and annealed (Ga,Mn)As epitaxial layers have not confirmed the interaction between detached Mn impurity band and the valence band. Thus, the description with merged Mn states and GaAs valence band is in agreement with our results. Our findings are supported by the high resolution transmission microscopy and magnetization measurements.
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Submitted 13 December, 2013;
originally announced December 2013.
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Effect of low-temperature annealing on the electronic- and band-structure of (Ga,Mn)As epitaxial layers
Authors:
O. Yastrubchak,
T. Andrearczyk,
J. Z. Domagala,
J. Sadowski,
L. Gluba,
J. Zuk,
T Wosinski
Abstract:
The effect of outdiffusion of Mn interstitials from (Ga,Mn)As epitaxial layers, caused by post-growth low-temperature annealing, on their electronic- and band-structure properties has been investigated by modulation photoreflectance (PR) spectroscopy. The annealing-induced changes in structural and magnetic properties of the layers were examined with high-resolution X-ray diffractometry and SQUID…
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The effect of outdiffusion of Mn interstitials from (Ga,Mn)As epitaxial layers, caused by post-growth low-temperature annealing, on their electronic- and band-structure properties has been investigated by modulation photoreflectance (PR) spectroscopy. The annealing-induced changes in structural and magnetic properties of the layers were examined with high-resolution X-ray diffractometry and SQUID magnetometery, respectively. They confirmed an outdiffusion of Mn interstitials from the layers and an enhancement in their hole concentration, which were more efficient for the layer covered with a Sb cap acting as a sink for diffusing Mn interstitials. The PR results revealing a decrease in the band-gap-transition energy in the as-grown (Ga,Mn)As layers, with respect to that in the reference GaAs one, are interpreted by assuming a merging of the Mn-related impurity band with the host GaAs valence band. On the other hand, an increase in the band-gap-transition energy in the annealed (Ga,Mn)As layers is interpreted as a result of the Moss-Burstein shift of the absorption edge due to the Fermi level location within the valence band, determined by the enhanced free-hole concentration. The experimental results are consistent with the valence-band origin of mobile holes mediating ferromagnetic ordering in (Ga,Mn)As, in agreement with the Zener model for ferromagnetic semiconductors.
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Submitted 17 May, 2013;
originally announced May 2013.
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Electronic- and band-structure evolution in low-doped (Ga,Mn)As
Authors:
O. Yastrubchak,
J. Sadowski,
H. Krzyzanowska,
L. Gluba,
J. Zuk,
J. Z. Domagala,
T. Andrearczyk,
T. Wosinski
Abstract:
Modulation photoreflectance spectroscopy and Raman spectroscopy have been applied to study the electronic- and band-structure evolution in (Ga,Mn)As epitaxial layers with increasing Mn doping in the range of low Mn content, up to 1.2%. Structural and magnetic properties of the layers were characterized with high-resolution X-ray diffractometry and SQUID magnetometery, respectively. The revealed re…
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Modulation photoreflectance spectroscopy and Raman spectroscopy have been applied to study the electronic- and band-structure evolution in (Ga,Mn)As epitaxial layers with increasing Mn doping in the range of low Mn content, up to 1.2%. Structural and magnetic properties of the layers were characterized with high-resolution X-ray diffractometry and SQUID magnetometery, respectively. The revealed results of decrease in the band-gap transition energy with increasing Mn content in very low-doped (Ga,Mn)As layers with n-type conductivity are interpreted as a result of merging the Mn-related impurity band with the host GaAs valence band. On the other hand, an increase in the band-gap-transition energy with increasing Mn content in (Ga,Mn)As layers with higher Mn content and p-type conductivity indicates the Moss-Burstein shift of the absorption edge due to the Fermi level location within the valence band, determined by the free-hole concentration. The experimental results are consistent with the valence-band origin of mobile holes mediated ferromagnetic ordering in the (Ga,Mn)As diluted ferromagnetic semiconductor.
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Submitted 17 May, 2013;
originally announced May 2013.
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Photoreflectance Study of the Fundamental Optical Properties of (Ga,Mn)As Epitaxial Films
Authors:
O. Yastrubchak,
J. Zuk,
H. Krzyzanowska,
J. Z. Domagala,
T. Andrearczyk,
J. Sadowski,
T. Wosinski
Abstract:
Fundamental optical properties of thin films of (Ga,Mn)As diluted ferromagnetic semiconductor with a low (1%) and high (6%) Mn content and of a reference GaAs film, grown by low-temperature molecular-beam epitaxy, have been investigated by photoreflectance (PR) spectroscopy. In addition, the films were subjected to complementary characterization by means of superconducting quantum interference dev…
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Fundamental optical properties of thin films of (Ga,Mn)As diluted ferromagnetic semiconductor with a low (1%) and high (6%) Mn content and of a reference GaAs film, grown by low-temperature molecular-beam epitaxy, have been investigated by photoreflectance (PR) spectroscopy. In addition, the films were subjected to complementary characterization by means of superconducting quantum interference device (SQUID) magnetometry, Raman spectroscopy, and high resolution X-ray diffractometry. Thorough full-line-shape analysis of the PR spectra, which enabled determination of the E0 electronic transition in (Ga,Mn)As, revealed significant differences between the energy band structures in vicinity of the Γ point of the Brillouin zone for the two (Ga,Mn)As films. In view of the obtained experimental results the evolution of the valence band structure in (Ga,Mn)As with increasing Mn content is discussed, pointing to a merging the Mn-related impurity band with the host GaAs valence band for high Mn content.
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Submitted 21 December, 2010;
originally announced December 2010.
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Magneto-resistive memory in ferromagnetic (Ga,Mn)As nanostructures
Authors:
T. Figielski,
T. Wosinski,
A. Morawski,
A. Makosa,
J. Wrobel,
J. Sadowski
Abstract:
We show a novel magneto-resistive effect that appears in lithographically shaped, three-arm nanostructure, fabricated from ferromagnetic (Ga,Mn)As layers. The effect, related to a rearrangement of magnetic domain walls between different pairs of arms in the structure, reveals as a dependence of zero-field resistance on the direction of previously applied magnetic field. This effect could allow d…
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We show a novel magneto-resistive effect that appears in lithographically shaped, three-arm nanostructure, fabricated from ferromagnetic (Ga,Mn)As layers. The effect, related to a rearrangement of magnetic domain walls between different pairs of arms in the structure, reveals as a dependence of zero-field resistance on the direction of previously applied magnetic field. This effect could allow designing devices with unique switching and memory properties.
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Submitted 19 October, 2006;
originally announced October 2006.
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Magnetotransport and Domain Wall in Nanoconstriction of Ferromagnetic Semiconductor (Ga,Mn)As
Authors:
T. Figielski,
T. Wosinski,
O. Pelya,
J. Sadowski,
A. Morawski,
A. Makosa,
W. Dobrowolski,
R. Szymczak,
J. Wrobel
Abstract:
We studied magnetoresistance (MR) of nanoconstrictions created in (Ga,Mn)As epilayers by O+ ion implantation. Original layers exhibit a negative MR that is plausibly caused by weak localization (WL) effects at the lowest temperatures. In constricted samples, additionally, jumps of an enhanced conductance appear on the background of the negative MR, whose positions reflect the hysteresis of magne…
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We studied magnetoresistance (MR) of nanoconstrictions created in (Ga,Mn)As epilayers by O+ ion implantation. Original layers exhibit a negative MR that is plausibly caused by weak localization (WL) effects at the lowest temperatures. In constricted samples, additionally, jumps of an enhanced conductance appear on the background of the negative MR, whose positions reflect the hysteresis of magnetization. We argue that they are manifestation of a suppression of WL due to the nucleation of a domain wall in the constriction
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Submitted 9 September, 2004;
originally announced September 2004.
