Texture tomography with high angular resolution utilizing sparsity
Authors:
Mads Carlsen,
Florencia Malamud,
Peter Modregger,
Anna Wildeis,
Markus Hartmann,
Robert Brandt,
Andreas Menzel,
Marianne Liebi
Abstract:
We demonstrate a novel approach to the reconstruction of scanning probe x-ray diffraction tomography data with anisotropic poly crystalline samples. The method involves reconstructing a voxel map containing an orientation distribution function in each voxel of an extended 3D sample. This method differs from existing approaches by not relying on a peak-finding and is therefore applicable to sample…
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We demonstrate a novel approach to the reconstruction of scanning probe x-ray diffraction tomography data with anisotropic poly crystalline samples. The method involves reconstructing a voxel map containing an orientation distribution function in each voxel of an extended 3D sample. This method differs from existing approaches by not relying on a peak-finding and is therefore applicable to sample systems consisting of small and highly mosaic crystalline domains that are not handled well by existing methods. Samples of interest include bio-minerals and a range of small-graines microstructures common in engineering metals. By choosing a particular kind of basis functions, we can effectively utilize non-negativity in orientation-space for samples with sparse texture. This enables us to achieve stable solutions at high angular resolutions where the problem would otherwise be under determined. We demonstrate the new approach using data from a shot peened martensite sample where we are able to map the twinning micro structure in the interior of a bulk sample without resolving the individual lattice domains. We also demonstrate the approach on a piece of gastropods shell with a mosaic micro structure.
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Submitted 23 September, 2024; v1 submitted 1 July, 2024;
originally announced July 2024.
X-ray diffraction with micrometer spatial resolution for highly absorbing samples
Authors:
P. Chakrabarti,
A. Wildeis,
M. Hartmann,
R. Brandt,
R. Döhrmann,
G. Fevola,
C. Ossig,
M. E. Stuckelberger,
J. Garrevoet,
K. V. Falch,
V. Galbierz,
G. Falkenberg,
P. Modregger
Abstract:
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we…
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X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations & 2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.
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Submitted 31 January, 2022;
originally announced January 2022.
