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Optimization of the Mean First Passage Time in Near-Disk and Elliptical Domains in 2-D with Small Absorbing Traps
Authors:
Sarafa A. Iyaniwura,
Tony Wong,
Colin B. Macdonald,
Micheal J. Ward
Abstract:
The determination of the mean first passage time (MFPT) for a Brownian particle in a bounded 2-D domain containing small absorbing traps is a fundamental problem with biophysical applications. The average MFPT is the expected capture time assuming a uniform distribution of starting points for the random walk. We develop a hybrid asymptotic-numerical approach to predict optimal configurations of…
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The determination of the mean first passage time (MFPT) for a Brownian particle in a bounded 2-D domain containing small absorbing traps is a fundamental problem with biophysical applications. The average MFPT is the expected capture time assuming a uniform distribution of starting points for the random walk. We develop a hybrid asymptotic-numerical approach to predict optimal configurations of $m$ small stationary circular absorbing traps that minimize the average MFPT in near-disk and elliptical domains. For a general class of near-disk domains, we illustrate through several specific examples how simple, but yet highly accurate, numerical methods can be used to implement the asymptotic theory. From the derivation of a new explicit formula for the Neumann Green's function and its regular part for the ellipse, a numerical approach based on our asymptotic theory is used to investigate how the spatial distribution of the optimal trap locations changes as the aspect ratio of an ellipse of fixed area is varied. The results from the hybrid theory for the ellipse are compared with full PDE numerical results computed from the closest point method \cite{IWWC2019}. For long and thin ellipses, it is shown that the optimal trap pattern for $m=2,\ldots,5$ identical traps is collinear along the semi-major axis of the ellipse. For such essentially 1-D patterns, a thin-domain asymptotic analysis is formulated and implemented to accurately predict the optimal locations of collinear trap patterns and the corresponding optimal average MFPT.
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Submitted 22 June, 2020;
originally announced June 2020.
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Epitaxial growth of Bi$_2$Pt$_2$O$_7$ pyrochlore
Authors:
Araceli Gutierrez-Llorente,
Howie Joress,
Arthur Woll,
Megan E. Holtz,
Matthew J. Ward,
Matthew C. Sullivan,
David A. Muller,
Joel D. Brock
Abstract:
Certain pyrochlore oxides are among the best oxygen catalysts in alkaline media. Hence, exploring epitaxial films of these materials is of great fundamental and technological interest. Unfortunately, direct film growth of one of the most promising pyrochlores, Bi$_2$Pt$_2$O$_7$, has not yet been achieved, owing to the difficulty of oxidizing platinum metal in the precursor material to Pt$^{4+}$. I…
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Certain pyrochlore oxides are among the best oxygen catalysts in alkaline media. Hence, exploring epitaxial films of these materials is of great fundamental and technological interest. Unfortunately, direct film growth of one of the most promising pyrochlores, Bi$_2$Pt$_2$O$_7$, has not yet been achieved, owing to the difficulty of oxidizing platinum metal in the precursor material to Pt$^{4+}$. In this work, in order to induce oxidation of the platinum, we annealed pulsed laser deposited films consisting of epitaxial $δ$-Bi$_2$O$_3$ and co-deposited, comparatively disordered platinum. We present synchrotron x-ray diffraction results that show the annealed films are the first epitaxial crystals of Bi$_2$Pt$_2$O$_7$. We also visualized the pyrochlore structure by scanning transmission electron microscopy, and observed ordered cation vacancies in a bismuth-rich film but not in a platinum-rich film. The similarity between the $δ$-Bi$_2$O$_3$ and Bi$_2$Pt$_2$O$_7$ structures appears to facilitate the pyrochlore formation. These results constitute a new approach for synthesis of novel pyrochlore thin film oxygen catalysts.
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Submitted 8 October, 2014;
originally announced October 2014.
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Complex oxide growth using simultaneous in situ RHEED and x-ray reflectivity: When is one layer complete?
Authors:
M. C. Sullivan,
M. J. Ward,
Araceli Gutierrez-Llorente,
Eli R. Adler,
H. Joress,
A. Woll,
J. D. Brock
Abstract:
During layer-by-layer homoepitaxial growth, both the Reflection High-Energy Electron Diffraction (RHEED) intensity and the x-ray reflection intensity will oscillate, and each complete oscillation indicates the addition of one monolayer of material. However, it is well documented, but not well understood, that the phase of the RHEED oscillations is not constant and thus the maxima in the RHEED inte…
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During layer-by-layer homoepitaxial growth, both the Reflection High-Energy Electron Diffraction (RHEED) intensity and the x-ray reflection intensity will oscillate, and each complete oscillation indicates the addition of one monolayer of material. However, it is well documented, but not well understood, that the phase of the RHEED oscillations is not constant and thus the maxima in the RHEED intensity oscillations do not necessarily occur at the completion of a layer. We demonstrate this using simultaneous in situ x-ray reflectivity and RHEED during layer-by-layer growth of SrTiO$_3$. We show that we can control the RHEED oscillation phase by changing the pre-growth substrate annealing conditions, changing the RHEED oscillation phase by nearly 180$^\circ$. In addition, during growth via pulsed laser deposition, the exponential relaxation times between each laser pulse can be used to determine when a layer is complete, independent of the phase of the RHEED oscillation.
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Submitted 3 October, 2014;
originally announced October 2014.
