From Fe$_3$O$_4$/NiO bilayers to NiFe$_2$O$_4$-like thin films through Ni interdiffusion
Authors:
O. Kuschel,
R. Buß,
W. Spiess,
T. Schemme,
J. Wöllermann,
K. Balinski,
T. Kuschel,
A. T. N'Diaye,
J. Wollschläger,
K. Kuepper
Abstract:
Ferrites with (inverse) spinel structure display a large variety of electronic and magnetic properties making some of them interesting for potential applications in spintronics. We investigate the thermally induced interdiffusion of Ni$^{2+}$ ions out of NiO into Fe$_3$O$_4$ ultrathin films resulting in off-stoichiometric nickelferrite-like thin layers. We synthesized epitaxial Fe$_3$O$_4$/NiO bil…
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Ferrites with (inverse) spinel structure display a large variety of electronic and magnetic properties making some of them interesting for potential applications in spintronics. We investigate the thermally induced interdiffusion of Ni$^{2+}$ ions out of NiO into Fe$_3$O$_4$ ultrathin films resulting in off-stoichiometric nickelferrite-like thin layers. We synthesized epitaxial Fe$_3$O$_4$/NiO bilayers on Nb-doped SrTiO$_3$(001) substrates by means of reactive molecular beam epitaxy. Subsequently, we performed an annealing cycle comprising three steps at temperatures of 400\,$^{\circ}$C, 600\,$^{\circ}$C, and 800\,$^{\circ}$C under an oxygen background atmosphere. We studied the changes of the chemical and electronic properties as result of each annealing step with help of hard x-ray photoelectron spectroscopy and found a rather homogenous distribution of Ni and Fe cations throughout the entire film after the overall annealing cycle. For one sample we observed a cationic distribution close to that of the spinel ferrite NiFe$_2$O$_4$. Further evidence comes from low energy electron diffraction patterns indicating a spinel type structure at the surface after annealing. Site and element specific hysteresis loops performed by x-ray magnetic circular dichroism uncovered the antiferrimagnetic alignment between the octahedral coordinated Ni$^{2+}$ and Fe$^{3+}$ ions and the Fe$^{3+}$ in tetrahedral coordination. We find a quite low coercive field of 0.02\,T, indicating a rather low defect concentration within the thin ferrite films.
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Submitted 18 February, 2016;
originally announced February 2016.
