Controlling exchange coupling strength in NixCu100-x thin films
Authors:
B. Nagy,
Yu. N. Khaydukov,
L. F. Kiss,
Sz. Sajti,
D. G. Merkel,
F. Tanczikó,
A. S. Vasenko,
R. O. Tsaregorodsev,
A. Rühm,
T. Keller,
L. Bottyán
Abstract:
Thickness (dF) and concentration (x) dependence of the Curie temperature of NixCu100-x(dF) ferromagnetic alloy layers (x =0.55,0.65, dF =[3nm÷12nm]) being in contact with a vanadium layer was studied. The Curie temperature of the ferromagnetic layers depends on the thickness when it is comparable with the interface layer between the F and the vanadium layers, which is attributed to the proximity c…
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Thickness (dF) and concentration (x) dependence of the Curie temperature of NixCu100-x(dF) ferromagnetic alloy layers (x =0.55,0.65, dF =[3nm÷12nm]) being in contact with a vanadium layer was studied. The Curie temperature of the ferromagnetic layers depends on the thickness when it is comparable with the interface layer between the F and the vanadium layers, which is attributed to the proximity coupling of the interface region with the rest of the F layer. The present study provides valuable information for fabrication of samples with controlled exchange coupling strength for studies of superconductor/ferromagnet (S/F) proximity effects.
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Submitted 18 May, 2012;
originally announced May 2012.