Showing 1–1 of 1 results for author: Tisler, J

Single Defect Center Scanning Near-Field Optical Microscopy on Graphene

Authors: J. Tisler, T. Oeckinghaus, R. Stöhr, R. Kolesov, F. Reinhard, J. Wrachtrup

Abstract: We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the ener… ▽ More We demonstrate high resolution scanning fluorescence resonance energy transfer 10 microscopy between a single nitrogen-vacancy center as donor and graphene as acceptor. 11 Images with few nanometer resolution of single and multilayer graphene structures were 12 attained. An energy transfer efficiency of 30% at distances of 10nm between a single 13 defect and graphene was measured. Further the energy transfer distance dependence of 14 the nitrogen-vacancy center to graphene was measured to show the predicted d-4 15 dependence. Our studies pave the way towards a diamond defect center based versatile 16 single emitter scanning microscope. △ Less

Submitted 2 January, 2013; originally announced January 2013.

Comments: 12 pages, 3 figures