Showing 1–2 of 2 results for author: Suresh, K S

Study of involution domain based interfaces in Ni-Ti-Cu Shape Memory Alloy

Authors: Atharva Pagare, V Sashi Mohan Rao, K Naga Chaithanya Kumar, K S Suresh

Abstract: An algorithm was made to study the lattice correspondence involved in phase transformation from cubic B2 to monoclinic B19'. The method is based on studying the orientation matrices generated from EBSD data. Starting from the very fundamental, coordinate transformation matrices as well as the vector transformation matrices have been walked through for a general non-orthogonal to the orthogonal sys… ▽ More An algorithm was made to study the lattice correspondence involved in phase transformation from cubic B2 to monoclinic B19'. The method is based on studying the orientation matrices generated from EBSD data. Starting from the very fundamental, coordinate transformation matrices as well as the vector transformation matrices have been walked through for a general non-orthogonal to the orthogonal system. Further, using the defined formulas, orientation matrices will be used to identify a new, non-generic Involution Domain and the already accepted Bain Domain. △ Less

Submitted 25 December, 2020; v1 submitted 1 December, 2020; originally announced December 2020.

Comments: 14 pages, 6 Figures, 3 Tables

Texture of ZnO thin films deposited through microwave irradiation

Authors: Piyush Jaiswal, Sanjaya Brahma, K. S. Suresh, S. A. Shivashankar, Satyam Suwas

Abstract: We report the crystallographic texture of ZnO thin films comprising nanorods grown by a microwave irradiation assisted method. Different substrates were used, namely Si, Ge, metal coated Si, PMMA coated Si and ITO coated glass, to examine the respective development of crystallographic texture. The films were characterized by Xray diffraction and scanning electron microscopy, while the texture anal… ▽ More We report the crystallographic texture of ZnO thin films comprising nanorods grown by a microwave irradiation assisted method. Different substrates were used, namely Si, Ge, metal coated Si, PMMA coated Si and ITO coated glass, to examine the respective development of crystallographic texture. The films were characterized by Xray diffraction and scanning electron microscopy, while the texture analysis was done by Xray pole figure analysis using the Schultz reflection method. The ZnO film deposited on Si and Ge showed a mixed texture. On all the other substrates, c axis oriented ZnO films were obtained. △ Less

Submitted 25 July, 2013; originally announced July 2013.

Journal ref: Thin Solid Films Volume 593, 30 October 2015, Pages 81-90