X-ray diffraction with micrometer spatial resolution for highly absorbing samples
Authors:
P. Chakrabarti,
A. Wildeis,
M. Hartmann,
R. Brandt,
R. Döhrmann,
G. Fevola,
C. Ossig,
M. E. Stuckelberger,
J. Garrevoet,
K. V. Falch,
V. Galbierz,
G. Falkenberg,
P. Modregger
Abstract:
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we…
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X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations & 2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.
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Submitted 31 January, 2022;
originally announced January 2022.
