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Showing 1–2 of 2 results for author: Spiegelberg, J

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  1. Proposal for measuring magnetism with patterned apertures

    Authors: Devendra Negi, Jakob Spiegelberg, Shunsuke Muto, Thomas Thersleff, Masahiro Ohtsuka, Linus Schönström, Kazuyoshi Tatsumi, Jaán Rusz

    Abstract: We propose a magnetic measurement method utilizing a patterned post-sample aperture in a transmission electron microscope. While utilizing electron magnetic circular dichroism, the method circumvents previous needs to shape the electron probe to an electron vortex beam or astigmatic beam. The method can be implemented in standard scanning transmission electron microscopes by replacing the spectrom… ▽ More

    Submitted 13 October, 2018; originally announced October 2018.

    Comments: 6 pages, 4 figures

    Journal ref: Phys. Rev. Lett. 122, 037201 (2019)

  2. Fully nonlocal inelastic scattering computations for spectroscopical transmission electron microscopy methods

    Authors: Ján Rusz, Axel Lubk, Jakob Spiegelberg, Dmitry Tyutyunnikov

    Abstract: The complex interplay of elastic and inelastic scattering amenable to different levels of approximation constitutes the major challenge for the computation and hence interpretation of TEM-based spectroscopical methods. The two major approaches to calculate inelastic scattering cross sections of fast electrons on crystals-Yoshioka-equations-based forward propagation and the reciprocal wave method-a… ▽ More

    Submitted 10 October, 2018; originally announced October 2018.

    Journal ref: Phys. Rev. B 96, 245121 (2017)