-
Ferroelectric domain scaling and electronic properties in ultrathin BiFeO3 films on vicinal substrates
Authors:
Vilas Shelke,
Dipanjan Mazumdar,
Sergey Faleev,
Oleg Mryasov,
Stephen Jesse,
Sergei Kalinin,
Arthur Baddorf,
Arunava Gupta
Abstract:
We report electrically switchable polarization and ferroelectric domain scaling over a thickness range of 5-100 nm in BiFeO3 films deposited on [110] vicinal substrates. The BiFeO3 films of variable thickness were deposited with SrRuO3 bottom layer using pulsed laser deposition technique. These films have fractal domain patterns and the domain width scales closely with the square root of film thic…
▽ More
We report electrically switchable polarization and ferroelectric domain scaling over a thickness range of 5-100 nm in BiFeO3 films deposited on [110] vicinal substrates. The BiFeO3 films of variable thickness were deposited with SrRuO3 bottom layer using pulsed laser deposition technique. These films have fractal domain patterns and the domain width scales closely with the square root of film thickness, in accordance with the Landau-Lifschitz-Kittel (LLK) law. The Switching Spectroscopy Piezo-response Force Microscopy provides clear evidence for the ferroelectric switching behavior in all the films. Using Quasi-particle Self-consistent GW (QPGW) approximation we have investigated physical parameters relevant for direct tunneling behavior, namely the effective mass and effective barrier height of electrons. For rhombohedral BFO, we report a large effective barrier height value of 3.6 eV, which is in reasonable agreement with nanoscale transport measurements. QPGW investigations into the tetragonal BFO structure with P4mm symmetry revealed a barrier height of 0.38 eV, significantly lower compared to its rhombohedral counterpart. This difference has very significant implications on the transport properties of nearly tetragonal BFO phase.
△ Less
Submitted 28 December, 2010; v1 submitted 4 October, 2010;
originally announced October 2010.
-
Nanoscale switching characteristics of nearly tetragonal BiFeO3 thin films
Authors:
Dipanjan Mazumdar,
Vilas Shelke,
Milko Iliev,
Stephen Jesse,
Amit Kumar,
Sergei Kalinin,
Arthur Baddorf,
Arunava Gupta
Abstract:
We have investigated the nanoscale switching properties of strain-engineered BiFeO3 thin films deposited on LaAlO3 substrates using a combination of scanning probe techniques. Polarized Raman spectral analysis indicate that the nearly-tetragonal films have monoclinic (Cc) rather than P4mm tetragonal symmetry. Through local switching-spectroscopy measurements and piezoresponse force microscopy we…
▽ More
We have investigated the nanoscale switching properties of strain-engineered BiFeO3 thin films deposited on LaAlO3 substrates using a combination of scanning probe techniques. Polarized Raman spectral analysis indicate that the nearly-tetragonal films have monoclinic (Cc) rather than P4mm tetragonal symmetry. Through local switching-spectroscopy measurements and piezoresponse force microscopy we provide clear evidence of ferroelectric switching of the tetragonal phase but the polarization direction, and therefore its switching, deviates strongly from the expected (001) tetragonal axis. We also demonstrate a large and reversible, electrically-driven structural phase transition from the tetragonal to the rhombohedral polymorph in this material which is promising for a plethora of applications.
△ Less
Submitted 12 April, 2010;
originally announced April 2010.
-
Polarized Raman spectroscopy of nearly-tetragonal BiFeO$_3$ thin films
Authors:
M. N. Iliev,
M. V. Abrashev,
D. Mazumdar,
V. Shelke,
A. Gupta
Abstract:
BiFeO$_3$ thin films can be epitaxially stabilized in a nearly-tetragonal phase under a high biaxial compressive strain. Here we investigate the polarized Raman spectra of constrained BiFeO$_3$ films with tetragonal-like (BFO-T), rhombohedral-like (BFO-R) and multiphase (BFO-T+R) structure. Based on analysis of the number and symmetry of the Raman lines, we provide strong experimental evidence th…
▽ More
BiFeO$_3$ thin films can be epitaxially stabilized in a nearly-tetragonal phase under a high biaxial compressive strain. Here we investigate the polarized Raman spectra of constrained BiFeO$_3$ films with tetragonal-like (BFO-T), rhombohedral-like (BFO-R) and multiphase (BFO-T+R) structure. Based on analysis of the number and symmetry of the Raman lines, we provide strong experimental evidence that the nearly-tetragonal films are monoclinic ($Cc$ symmetry) and not tetragonal $(P4mm)$. Through the Raman mapping technique we show localized coexistence of BFO-T and BFO-R phases with the relative fraction dependent on the film thickness.
△ Less
Submitted 14 March, 2010;
originally announced March 2010.
