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Showing 1–1 of 1 results for author: Seibel, T

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  1. arXiv:1405.4743  [pdf

    cond-mat.mtrl-sci

    Probabilistic Schmid factors and scatter of LCF life

    Authors: H. Gottschalk, S. Schmitz, T. Seibel, G. Rollmann, R. Krause, T. Beck

    Abstract: We investigate the scatter in the cycles to crack initiation for conventionally cast specimens of the superalloy RENE 80 in total strain controlled low cycle fatigue (LCF) tests at 850°C. The grains at the location of crack initiation are investigated using electron backscatter diffraction (EBSD) measurements with scanning electron microscopy (SEM). This results in determination of maximal Schmid… ▽ More

    Submitted 25 April, 2014; originally announced May 2014.

    Comments: 16 pages, 12 Figures, two Tables

    MSC Class: 47N30; 62G32