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Precise nanoscale temperature mapping in operational microelectronic devices by use of a phase change material
Authors:
Qilong Cheng,
Sukumar Rajauria,
Erhard Schreck,
Robert Smith,
Na Wang,
Jim Reiner,
Qing Dai,
David Bogy
Abstract:
The microelectronics industry is pushing the fundamental limit on the physical size of individual elements to produce faster and more powerful integrated chips. These chips have nanoscale features that dissipate power resulting in nanoscale hotspots leading to device failures. To understand the reliability impact of the hotspots, the device needs to be tested under the actual operating conditions.…
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The microelectronics industry is pushing the fundamental limit on the physical size of individual elements to produce faster and more powerful integrated chips. These chips have nanoscale features that dissipate power resulting in nanoscale hotspots leading to device failures. To understand the reliability impact of the hotspots, the device needs to be tested under the actual operating conditions. Therefore, the development of high-resolution thermometry techniques is required to understand the heat dissipation processes during the device operation. Recently, several thermometry techniques have been proposed,such as radiation thermometry, thermocouple based contact thermometry, scanning thermal microscopy (SThM), scanning transmission electron microscopy (STEM) and transition based threshold thermometers. However, most of these techniques have limitations including the need for extensive calibration, perturbation of the actual device temperature, low throughput, and the use of ultra-high vacuum. Here, we present a facile technique, which uses a thin film contact thermometer based on the phase change material Ge2Sb2Te5, to precisely map thermal contours from the nanoscale to the microscale. Ge2Sb2Te5 undergoes a crystalline transition at Tg with large changes in its electric conductivity, optical reflectivity and density. Using this approach, we map the surface temperature of a nanowire and an embedded micro-heater on the same chip where the scales of the temperature contours differ by three orders of magnitude. The spatial resolution can be as high as 20 nanometers thanks to the continuous nature of the thin film.
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Submitted 19 November, 2020;
originally announced November 2020.
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Electrostatically tunable adhesion in a high speed sliding interface
Authors:
Sukumar Rajauria,
Oscar Ruiz,
Sripathi V. Canchi,
Erhard Schreck,
Qing Dai
Abstract:
Contact hysteresis between sliding interfaces is a widely observed phenomenon from macro- to nano- scale sliding interfaces. Most of such studies are done using an atomic force microscope (AFM) where the sliding speed is a few μm/s. Here, we present a unique study on stiction between the head-disk interface of commercially available hard disk drives, wherein vertical clearance between the head and…
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Contact hysteresis between sliding interfaces is a widely observed phenomenon from macro- to nano- scale sliding interfaces. Most of such studies are done using an atomic force microscope (AFM) where the sliding speed is a few μm/s. Here, we present a unique study on stiction between the head-disk interface of commercially available hard disk drives, wherein vertical clearance between the head and the disk is of the same order as in various AFM based fundamental studies, but with a sliding speed that is nearly six orders of magnitude higher. We demonstrate that although the electrostatic force (DC or AC voltage) is an attractive force, the AC voltage induced out-of-plane oscillation of the head with respect to disk is able to suppress completely the contact hysteresis.
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Submitted 29 November, 2017;
originally announced November 2017.
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Voltage assisted asymmetric nanoscale wear on ultra-smooth diamond like carbon thin films at high sliding speeds
Authors:
Sukumar Rajauria,
Erhard Schreck,
Bruno Marchon
Abstract:
The understanding of tribo- and electro-chemical phenomenons on the molecular level at a sliding interface is a field of growing interest. Fundamental chemical and physical insights of sliding surfaces are crucial for understanding wear at an interface, particularly for nano or micro scale devices operating at high sliding speeds. A complete investigation of the electrochemical effects on high sli…
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The understanding of tribo- and electro-chemical phenomenons on the molecular level at a sliding interface is a field of growing interest. Fundamental chemical and physical insights of sliding surfaces are crucial for understanding wear at an interface, particularly for nano or micro scale devices operating at high sliding speeds. A complete investigation of the electrochemical effects on high sliding speed interfaces requires a precise monitoring of both the associated wear and surface chemical reactions at the interface. Here, we demonstrate that head-disk interface inside a commercial magnetic storage hard disk drive provides a unique system for such studies. The results obtained shows that the voltage assisted electrochemical wear lead to asymmetric wear on either side of sliding interface.
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Submitted 8 May, 2016;
originally announced May 2016.
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Nanoscale wear and kinetic friction between atomically smooth surfaces sliding at high speeds
Authors:
Sukumar Rajauria,
Sripathi V. Canchi,
Erhard Schreck,
Bruno Marchon
Abstract:
The kinetic friction and wear at high sliding speeds is investigated using the head-disk interface of hard disk drives, wherein, the head and the disk are less than 10 nm apart and move at sliding speeds of 5-10 m/s relative to each other. While the spacing between the sliding surfaces is of the same order of magnitude as various AFM based fundamental studies on friction, the sliding speed is near…
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The kinetic friction and wear at high sliding speeds is investigated using the head-disk interface of hard disk drives, wherein, the head and the disk are less than 10 nm apart and move at sliding speeds of 5-10 m/s relative to each other. While the spacing between the sliding surfaces is of the same order of magnitude as various AFM based fundamental studies on friction, the sliding speed is nearly six orders of magnitude larger, allowing a unique set-up for a systematic study of nanoscale wear at high sliding speeds. In a hard disk drive, the physical contact between the head and the disk leads to friction, wear and degradation of the head overcoat material (typically diamond like carbon). In this work, strain gauge based friction measurements are performed; the friction coefficient as well as the adhering shear strength at the head-disk interface are extracted; and an experimental set-up for studying friction between high speed sliding surfaces is exemplified.
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Submitted 12 February, 2015;
originally announced February 2015.
