Fast and interpretable classification of small X-ray diffraction datasets using data augmentation and deep neural networks
Authors:
Felipe Oviedo,
Zekun Ren,
Shijing Sun,
Charlie Settens,
Zhe Liu,
Noor Titan Putri Hartono,
Ramasamy Savitha,
Brian L. DeCost,
Siyu I. P. Tian,
Giuseppe Romano,
Aaron Gilad Kusne,
Tonio Buonassisi
Abstract:
X-ray diffraction (XRD) data acquisition and analysis is among the most time-consuming steps in the development cycle of novel thin-film materials. We propose a machine-learning-enabled approach to predict crystallographic dimensionality and space group from a limited number of thin-film XRD patterns. We overcome the scarce-data problem intrinsic to novel materials development by coupling a superv…
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X-ray diffraction (XRD) data acquisition and analysis is among the most time-consuming steps in the development cycle of novel thin-film materials. We propose a machine-learning-enabled approach to predict crystallographic dimensionality and space group from a limited number of thin-film XRD patterns. We overcome the scarce-data problem intrinsic to novel materials development by coupling a supervised machine learning approach with a model agnostic, physics-informed data augmentation strategy using simulated data from the Inorganic Crystal Structure Database (ICSD) and experimental data. As a test case, 115 thin-film metal halides spanning 3 dimensionalities and 7 space-groups are synthesized and classified. After testing various algorithms, we develop and implement an all convolutional neural network, with cross validated accuracies for dimensionality and space-group classification of 93% and 89%, respectively. We propose average class activation maps, computed from a global average pooling layer, to allow high model interpretability by human experimentalists, elucidating the root causes of misclassification. Finally, we systematically evaluate the maximum XRD pattern step size (data acquisition rate) before loss of predictive accuracy occurs, and determine it to be 0.16°, which enables an XRD pattern to be obtained and classified in 5.5 minutes or less.
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Submitted 23 April, 2019; v1 submitted 20 November, 2018;
originally announced November 2018.
Graph Convolutional Neural Networks for Polymers Property Prediction
Authors:
Minggang Zeng,
Jatin Nitin Kumar,
Zeng Zeng,
Ramasamy Savitha,
Vijay Ramaseshan Chandrasekhar,
Kedar Hippalgaonkar
Abstract:
A fast and accurate predictive tool for polymer properties is demanding and will pave the way to iterative inverse design. In this work, we apply graph convolutional neural networks (GCNN) to predict the dielectric constant and energy bandgap of polymers. Using density functional theory (DFT) calculated properties as the ground truth, GCNN can achieve remarkable agreement with DFT results. Moreove…
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A fast and accurate predictive tool for polymer properties is demanding and will pave the way to iterative inverse design. In this work, we apply graph convolutional neural networks (GCNN) to predict the dielectric constant and energy bandgap of polymers. Using density functional theory (DFT) calculated properties as the ground truth, GCNN can achieve remarkable agreement with DFT results. Moreover, we show that GCNN outperforms other machine learning algorithms. Our work proves that GCNN relies only on morphological data of polymers and removes the requirement for complicated hand-crafted descriptors, while still offering accuracy in fast predictions.
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Submitted 15 November, 2018;
originally announced November 2018.
