Showing 1–2 of 2 results for author: Rozler, M
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Local transport measurements at mesoscopic length scales using scanning tunneling potentiometry
Authors:
Weigang Wang,
Ko Munakata,
Michael Rozler,
Malcolm R. Beasley
Abstract:
Under mesoscopic conditions, the transport potential on a thin film with current is theoretically expected to bear spatial variation due to quantum interference. Scanning tunneling potentiometry is the ideal tool to investigate such variation, by virtue of its high spatial resolution. We report in this {\it Letter} the first detailed measurement of transport potential under mesoscopic conditions.…
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Under mesoscopic conditions, the transport potential on a thin film with current is theoretically expected to bear spatial variation due to quantum interference. Scanning tunneling potentiometry is the ideal tool to investigate such variation, by virtue of its high spatial resolution. We report in this {\it Letter} the first detailed measurement of transport potential under mesoscopic conditions. Epitaxial graphene at a temperature of 17K was chosen as the initial system for study because the characteristic transport length scales in this material are relatively large. Tip jumping artifacts are a major possible contribution to systematic errors; and we mitigate such problems by using custom-made slender and sharp tips manufactured by focussed ion beam. In our data, we observe residual resistivity dipoles associated with topoographical defects, and local peaks and dips in the potential that are not associated with topographical defects.
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Submitted 5 February, 2013; v1 submitted 26 November, 2012;
originally announced November 2012.
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Design and Performance of a Practical Variable-Temperature Scanning Tunneling Potentiometry System
Authors:
M. Rozler,
M. R. Beasley
Abstract:
We have constructed a scanning tunneling potentiometry system capable of simultaneously mapping the transport-related electrochemical potential of a biased sample along with its surface topography. Combining a novel sample biasing technique with a continuous current-nulling feedback scheme pushes the noise performance of the measurement to its fundamental limit - the Johnson noise of the STM tun…
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We have constructed a scanning tunneling potentiometry system capable of simultaneously mapping the transport-related electrochemical potential of a biased sample along with its surface topography. Combining a novel sample biasing technique with a continuous current-nulling feedback scheme pushes the noise performance of the measurement to its fundamental limit - the Johnson noise of the STM tunnel junction. The resulting 130 nV voltage sensitivity allows us to spatially resolve local potentials at scales down to 2 nm, while maintaining angstrom scale STM imaging, all at scan sizes of up to 15 um. A mm-range two-dimensional coarse positioning stage and the ability to operate from liquid helium to room temperature with a fast turn-around time greatly expand the versatility of the instrument. By performing studies of several model systems, we discuss the implications of various types of surface morphology for potentiometric measurements.
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Submitted 3 June, 2008; v1 submitted 17 April, 2008;
originally announced April 2008.
