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Characterization of band offsets in Al$_x$In$_{1-x}$As$_y$Sb$_{1-y}$ alloys with varying Al composition
Authors:
Jiyuan Zheng,
Andrew H. Jones,
Yaohua Tan,
Ann K. Rockwell,
Stephen March,
Sheikh Z. Ahmed,
Catherine A. Dukes,
Avik W. Ghosh,
Seth R. Bank,
Joe C. Campbell
Abstract:
The unprecedented wide bandgap tunability (~1 eV) of Al$_x$In$_{1-x}$As$_y$Sb$_{1-y}$ latticed-matched to GaSb enables the fabrication of photodetectors over a wide range from near-infrared to mid-infrared. In this paper, the valence band-offsets in AlxIn1-xAsySb1-y with different Al compositions are analyzed by tight-binding calculations and X-ray photoelectron spectroscopy (XPS) measurements. Th…
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The unprecedented wide bandgap tunability (~1 eV) of Al$_x$In$_{1-x}$As$_y$Sb$_{1-y}$ latticed-matched to GaSb enables the fabrication of photodetectors over a wide range from near-infrared to mid-infrared. In this paper, the valence band-offsets in AlxIn1-xAsySb1-y with different Al compositions are analyzed by tight-binding calculations and X-ray photoelectron spectroscopy (XPS) measurements. The observed weak variation in valence band offsets is consistent with the lack of any minigaps in the valence band, compared to the conduction band.
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Submitted 27 May, 2021;
originally announced May 2021.
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Full band Monte Carlo simulation of AlInAsSb digital alloys
Authors:
Jiyuan Zheng,
Sheikh Z. Ahmed,
Yuan Yuan,
Andrew Jones,
Yaohua Tan,
Ann K. Rockwell,
Stephen D. March,
Seth R. Bank,
Avik W. Ghosh,
Joe C. Campbell
Abstract:
Avalanche photodiodes fabricated from AlInAsSb grown as a digital alloy exhibit low excess noise. In this paper, we investigate the band structure-related mechanisms that influence impact ionization. Band-structures calculated using an empirical tight-binding method and Monte Carlo simulations reveal that the mini-gaps in the conduction band do not inhibit electron impact ionization. Good agreemen…
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Avalanche photodiodes fabricated from AlInAsSb grown as a digital alloy exhibit low excess noise. In this paper, we investigate the band structure-related mechanisms that influence impact ionization. Band-structures calculated using an empirical tight-binding method and Monte Carlo simulations reveal that the mini-gaps in the conduction band do not inhibit electron impact ionization. Good agreement between the full band Monte Carlo simulations and measured noise characteristics is demonstrated.
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Submitted 27 May, 2021;
originally announced May 2021.
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Picosecond Transient Thermoreflectance for Thermal Conductivity Characterization
Authors:
Jihoon Jeong,
Xianghai Meng,
Ann Kathryn Rockwell,
Seth R Bank,
Wen-Pin Hsieh,
Jung-fu Lin,
Yaguo Wang
Abstract:
We have developed a transient thermoreflectance technique using picosecond pulsed and cw laser to study thermal conductivity and interface conductance in both thin-films and bulk materials. A real time-resolved system observes a thermal transport along the cross-plane direction of the sample during a single pulse excitation. The suggested TTR technique can measure thermal conductivity in up to a f…
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We have developed a transient thermoreflectance technique using picosecond pulsed and cw laser to study thermal conductivity and interface conductance in both thin-films and bulk materials. A real time-resolved system observes a thermal transport along the cross-plane direction of the sample during a single pulse excitation. The suggested TTR technique can measure thermal conductivity in up to a few hundred nm of thin films with a reasonable uncertainty by carefully selecting metal transducer thickness. In this paper, we examine thermal conductivity in several substrates including Si, GaAs, Sapphire, and Glass after depositing Au thin film as metal transducer and compare with reported values to validate our technique. For further study on our method, MoS2 thin-films with different thicknesses are prepared via exfoliating, and their thermal conductivity are measured as average value of 3.4 W/mK. Compared to TDTR technique, TTR is a simpler and inexpensive method to study thermophysical properties and can also measure in-plane thermal property using a grating imaging technique. TTR can be one of the available options for observing thermal transport phenomena in both horizontal and vertical directions with a simple and inexpensive preparation.
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Submitted 12 October, 2018; v1 submitted 15 August, 2018;
originally announced August 2018.
