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Showing 1–2 of 2 results for author: Ribero-Figueroa, X

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  1. arXiv:2506.10592  [pdf

    cond-mat.mes-hall physics.app-ph

    A Taylor Series Approximation Model for Characterizing the Output Resistance of a GFET

    Authors: Xiomara Ribero-Figueroa, Anibal Pacheco-Sanchez, Tzu-Jung Huang, David Jiménez, Ivan Puchades, Reydezel Torres-Torres

    Abstract: The mobility-degradation-based model for the drain-to-source or output resistance of a graphene field-effect-transistor is linearized here using a Taylor series approximation. This simplification is shown to be valid from magnitudes of the gate voltage not significantly higher than the Dirac voltage, and it enables the analytical determination of the transconductance parameter, the voltage related… ▽ More

    Submitted 12 June, 2025; originally announced June 2025.

    Journal ref: IEEE Transactions on Electron Devices, vol. 71, no. 11, pp. 7204-7207, Nov. 2024

  2. arXiv:2309.08282  [pdf

    cond-mat.mes-hall physics.app-ph

    Characterization of the Intrinsic and Extrinsic Resistances of a Microwave Graphene FET Under Zero Transconductance Conditions

    Authors: Xiomara Ribero-Figueroa, Anibal Pacheco-Sanchez, Aida Mansouri, Pankaj Kumar, Omid Habibpour, Herbert Zirath, Roman Sordan, Francisco Pasadas, David Jiménez, Reydezel Torres-Torres

    Abstract: Graphene field-effect transistors exhibit negligible transconductance under two scenarios: for any gate-to-source voltage when the drain-to-source voltage is set to zero, and for an arbitrary drain-to-source voltage provided that the gate-to-source voltage equals the Dirac voltage. Hence, extracting the channel and the parasitic series resistances from S-parameters under these conditions enables a… ▽ More

    Submitted 15 September, 2023; originally announced September 2023.

    Journal ref: IEEE Transactions on Electron Devices, Sep. 2023