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Helium load on W-O coatings grown by pulsed laser deposition
Authors:
R. Mateus,
D. Dellasega,
M. Passoni,
Z. Siketić,
I. Bogdanović Radović,
A. Hakola,
E. Alves
Abstract:
W-O deposits with complex morphologies and significant He contents will growth on the surface of plasma facing components exposed to He discharges. To mimic the re/co-deposition process, W-O-He coatings were produced by implanting He+ ions on W films grown by pulsed laser deposition (PLD). The use of appropriate PLD experimental parameters such as Ar or He background atmospheres induces the deposi…
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W-O deposits with complex morphologies and significant He contents will growth on the surface of plasma facing components exposed to He discharges. To mimic the re/co-deposition process, W-O-He coatings were produced by implanting He+ ions on W films grown by pulsed laser deposition (PLD). The use of appropriate PLD experimental parameters such as Ar or He background atmospheres induces the deposition of porous or amorphous-like W-O structures, respectively. After multiple ion implantation stages using 150 keV, 100 keV and 50 keV incident He+ ion beams with a total fluence of 5 x 1017 ion/cm^2, significant amounts of He were identified in porous coatings by Rutherford backscattering (RBS). Time-of-flight elastic recoil detection (TOF-ERDA) measurements showed that most of the implanted He was already released from the porous coatings five month after implantation while for the case of amorphous ones the He content remains significant at deeper layers and smoothly decrease towards the surface, as result of a different morphology and nanostructure. The proposed method involving PLD and ion implantation seems adequate to produce W-O-He reference samples for fusion investigations.
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Submitted 17 December, 2018; v1 submitted 5 December, 2018;
originally announced December 2018.
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High-energy plasmon spectroscopy of freestanding multilayer graphene
Authors:
V. Borka Jovanović,
I. Radović,
D. Borka,
Z. L. Mišković
Abstract:
We present several applications of the layered electron gas model to electron energy loss spectroscopy of free-standing films consisting of $N$ graphene layers in a scanning transmission electron microscope. Using a two-fluid model for the single-layer polarizability, we discuss the evolution of high-energy plasmon spectra with $N$, and find good agreement with the recent experimental data for bot…
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We present several applications of the layered electron gas model to electron energy loss spectroscopy of free-standing films consisting of $N$ graphene layers in a scanning transmission electron microscope. Using a two-fluid model for the single-layer polarizability, we discuss the evolution of high-energy plasmon spectra with $N$, and find good agreement with the recent experimental data for both multi-layer graphene with $N<10$, and thick slabs of graphite. Such applications of these analytical models help shed light on several features observed in the plasmon spectra of those structures, including the role of plasmon dispersion, dynamic interference in excitations of various plasmon eigenmodes, as well as the relevance of the bulk plasmon bands, rather than surface plasmons, in classifying the plasmon peaks.
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Submitted 14 October, 2011; v1 submitted 3 January, 2011;
originally announced January 2011.
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Dynamic polarization of graphene by moving external charges: random phase approximation
Authors:
K. F. Allison,
D. Borka,
I. Radović,
Lj. Hadžievski,
Z. L. Mišković
Abstract:
We evaluate the stopping and image forces on a charged particle moving parallel to a doped sheet of graphene by using the dielectric response formalism for graphene's $π$-electron bands in the random phase approximation (RPA). The forces are presented as functions of the particle speed and the particle distance for a broad range of charge-carrier densities in graphene. A detailed comparison with…
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We evaluate the stopping and image forces on a charged particle moving parallel to a doped sheet of graphene by using the dielectric response formalism for graphene's $π$-electron bands in the random phase approximation (RPA). The forces are presented as functions of the particle speed and the particle distance for a broad range of charge-carrier densities in graphene. A detailed comparison with the results from a kinetic equation model reveal the importance of inter-band single-particle excitations in the RPA model for high particle speeds. We also consider the effects of a finite gap between graphene and a supporting substrate, as well as the effects of a finite damping rate that is included through the use of Mermin's procedure. The damping rate is estimated from a tentative comparison of the Mermin loss function with a HREELS experiment. In the limit of low particle speeds, several analytical results are obtained for the friction coefficient that show an intricate relationship between the charge-carrier density, the damping rate, and the particle distance, which may be relevant to surface processes and electrochemistry involving graphene.
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Submitted 10 November, 2009; v1 submitted 30 September, 2009;
originally announced September 2009.
