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Showing 1–2 of 2 results for author: Petit, J -

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  1. arXiv:2501.10424  [pdf

    cond-mat.mtrl-sci physics.app-ph physics.class-ph

    X-ray diffraction characterization of suspended structures for MEMS applications

    Authors: P. Goudeau, N. Tamura, B. Lavelle, S. Rigo, T. Masri, A. Bosseboeuf, T. Sarnet, J. -A. Petit, J. -M. Desmarres

    Abstract: Mechanical stress control is becoming one of the major challenges for the future of micro and nanotechnologies. Micro scanning X-ray diffraction is one of the promising techniques that allows stress characterization in such complex structures at sub micron scales. Two types of MEMS structure have been studied: a bilayer cantilever composed of a gold film deposited on poly-silicon and a boron doped… ▽ More

    Submitted 10 January, 2025; originally announced January 2025.

    Comments: Thin Films Stresses And Mechanical Properties, Mar 2005, San Francisco CA, United States

  2. Investigating liquid surfaces down to the nanometer scale using grazing incidence x-ray scattering

    Authors: C. Fradin, A. Braslau, D. Luzet, M. Alba, C. Gourier, J. Daillant, G. Gruebel, G. Vignaud, J. -F. Legrand, J. Lal J. -M. Petit, F. Rieutord

    Abstract: Grazing incidence x-ray surface scattering has been used to investigate liquid surfaces down to the molecular scale. The free surface of water is well described by the capillary wave model (<z(q)z(-q)> ~ q-2 spectrum) up to wavevectors > 10^8 m^-1. At larger wavevectors near-surface acoustic waves must be taken into account. When the interface is bounded by a surfactant monolayer, it exhibits a… ▽ More

    Submitted 22 August, 1997; originally announced August 1997.