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Showing 1–1 of 1 results for author: Patruno, L

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  1. arXiv:2202.10119  [pdf

    cond-mat.mtrl-sci cond-mat.soft physics.app-ph

    In-situ force microscopy to investigate fracture in stretchable electronics: insights on local surface mechanics and conductivity

    Authors: Giorgio Cortelli, Luca Patruno, Tobias Cramer, Beatrice Fraboni, Stefano de Miranda

    Abstract: Stretchable conductors are of crucial relevance for emerging technologies such as wearable electronics, low-invasive bioelectronic implants or soft actuators for robotics. A critical issue for their development regards the understanding of defect formation and fracture of conducting pathways during stress-strain cycles. Here we present a novel atomic force microscopy (AFM) method that provides mul… ▽ More

    Submitted 21 February, 2022; originally announced February 2022.