Whisker growth on Sn thin film accelerated under gamma-ray irradiation
Authors:
Morgan Killefer,
Vamsi Borra,
Ahmed Al-Bayati,
Daniel G. Georgiev,
Victor G. Karpov,
I. Eshmael Parsai,
Diana Shvydka
Abstract:
We report on growth of tin (Sn) metal whiskers that is significantly accelerated under gamma-ray irradiation. The studied Sn thin film, evaporated on glass substrate, was subjected to a total of ~60 hours of irradiation over the course of 30 days. The irradiated sample demonstrated the enhanced development, in both whisker densities and lengths, resulting in an acceleration factor of ~50. This mak…
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We report on growth of tin (Sn) metal whiskers that is significantly accelerated under gamma-ray irradiation. The studied Sn thin film, evaporated on glass substrate, was subjected to a total of ~60 hours of irradiation over the course of 30 days. The irradiated sample demonstrated the enhanced development, in both whisker densities and lengths, resulting in an acceleration factor of ~50. This makes gamma-ray irradiation a candidate tool for accelerated testing of whisker propensity. We attribute the observed enhancement to electrostatic fields created by charged defects in the glass substrate under ionizing radiation of gamma-rays.
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Submitted 13 June, 2017; v1 submitted 30 May, 2017;
originally announced May 2017.