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Sub micron-precision sample holder for accurate re-positioning of samples in Scanning Force Microscopy
Authors:
José Abad,
Juan Francisco González Martínez,
Jaime Colchero Paetz
Abstract:
Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on the sample is tedious. This is an important limitation of many Scanning Probe Microscopes, in particular when the sample has to be removed for some kind of treatment and then re-allocated to characterize the same position…
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Scanning Probe Microscopy allows for extreme resolution down to the atomic scale. Unfortunately, total scanning range is rather limited, therefore finding a specific position on the sample is tedious. This is an important limitation of many Scanning Probe Microscopes, in particular when the sample has to be removed for some kind of treatment and then re-allocated to characterize the same position where the previous experiment had been performed. In the present work we describe two simple and compact sub micron-precision sample holders that can be easily integrated in to a commercial Scanning Force Microscopy system. The design is based either on a traditional kinematic mounting or on self-adjustment of the sample holder and the upper piece of the piezoelectric scanner as the glue used to assemble the final setup solidifies. With these sample holders a specific sample position is automatically recovered to within about 100 nanometers, and thus well within the typical range of a piezoelectric scanner. Our experimental setup therefore allows ex-situ manipulation of the sample and SFM imaging of the same region without the aid of an optical microscope, positioning marks and tedious re-allocation.
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Submitted 9 November, 2012;
originally announced November 2012.
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Calibration of oscillation amplitude in Dynamic Scanning Force Microscopy
Authors:
Juan Francisco González Martínez,
Inés Nieto Carvajal,
Jaime Colchero Paetz
Abstract:
A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to transfer the thermal noise of the cantilever motion from its resonance frequency to a much lower frequency within the typical bandwidth of the corresponding electron…
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A method to precisely calibrate the oscillation amplitude in Dynamic Scanning Force Microscopy is described. It is experimentally shown that a typical electronics used to process the dynamic motion of the cantilever can be adjusted to transfer the thermal noise of the cantilever motion from its resonance frequency to a much lower frequency within the typical bandwidth of the corresponding electronics. Therefore, the thermal noise measured in the in-phase ("phase") and out of phase ("amplitude") output of such an electronics can be related to the thermal energy $kT$. If the force constant of the cantilever is known then the oscillation amplitude can be precisely calibrated from the thermal power measured in these signals. Based on this concept, two procedures for the calibration of the oscillation amplitude are proposed. One is based on simple calculation of the Root Mean Square (RMS) measured at the outputs of the electronics used to process the dynamic motion of the cantilever, and the other one is based on analysis of the corresponding spectrum and the calculation of the quality factor, the resonance frequency and the signal strength.
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Submitted 11 October, 2012; v1 submitted 4 May, 2012;
originally announced May 2012.
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Nanoscale measurement of the Power Spectral Density of surface roughness: a difficult experimental challenge and how to solve it
Authors:
Juan Francisco González Martínez,
Inés Nieto Carvajal,
José Abad,
Jaime Colchero Paetz
Abstract:
In the present work we show that the correct determination of surface morphology using Scanning Force Microscopy (SFM) imaging and Power Spectral Density (PSD) analysis of the surface roughness is an extremely demanding task that is easily affected by experimental parameters such as scan speed and feedback parameters. We present examples were the measured topography data is significantly influence…
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In the present work we show that the correct determination of surface morphology using Scanning Force Microscopy (SFM) imaging and Power Spectral Density (PSD) analysis of the surface roughness is an extremely demanding task that is easily affected by experimental parameters such as scan speed and feedback parameters. We present examples were the measured topography data is significantly influenced by the feedback response of the SFM system and the PSD curves calculated from this experimental data do not correspond to that of the true topography. Instead, either features are "lost" due to low pass filtering or features are "created" due to oscillation of the feedback loop. In order to overcome these serious problems we show that the interaction signal (error signal) can be used not only to quantitatively control but also to significantly improve the quality of the topography raw data used for the PSD analysis. In particular, the calibrated error signal image can be used in combination with the topography image in order to obtain a correct representation of surface morphology ("true" topographic image). From this "true" topographic image a faithful determination of the PSD of surface morphology is possible. The corresponding PSD curve is not affected by the fine-tuning of feedback parameters, and allows for much faster image acquisition speeds without loss information in the PSD curve.
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Submitted 27 July, 2011; v1 submitted 25 April, 2011;
originally announced April 2011.
