Showing 1–1 of 1 results for author: Notario, J A D

Nature of the 1/f Noise in Graphene, Direct Evidence for the Mobility Fluctuations Mechanism

Authors: Adil Rehman, Juan Antonio Delgado Notario, Juan Salvador Sanchez, Yahya Moubarak Meziani, Grzegorz Cywiński, Wojciech Knap, Alexander A. Balandin, Michael Levinshtein, Sergey Rumyantsev

Abstract: The nature of the low-frequency current fluctuations, i.e. carrier number vs. mobility, defines the strategies for noise reduction in electronic devices. While the 1/f noise in metals has been attributed to the electron mobility fluctuations, the direct evidence is lacking (f is the frequency). Here we measured noise in h-BN encapsulated graphene transistor under the condition of geometrical magne… ▽ More The nature of the low-frequency current fluctuations, i.e. carrier number vs. mobility, defines the strategies for noise reduction in electronic devices. While the 1/f noise in metals has been attributed to the electron mobility fluctuations, the direct evidence is lacking (f is the frequency). Here we measured noise in h-BN encapsulated graphene transistor under the condition of geometrical magnetoresistance to directly assess the mechanism of low-frequency electronic current fluctuations. It was found that the relative noise spectral density of the graphene resistance fluctuations depends non-monotonically on the magnetic field (B) with a minimum at approximately uB=1 (u is the electron mobility). This observation proves unambiguously that the mobility fluctuations are the dominant mechanism of the electronic noise in high-quality graphene. Our results are important for all proposed applications of graphene in electronics and add to the fundamental understanding of the 1/f noise origin in any electronic device. △ Less

Submitted 7 November, 2021; originally announced November 2021.

Comments: 23 pages, 3 figures, Noise measurements of h-BN encapsulated graphene transistor under the condition of geometrical magnetoresistance to directly assess the mechanism of low-frequency electronic current fluctuations