Showing 1–2 of 2 results for author: No, K
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Measurement Anomaly of Step Width in Calibration Grating using Atomic Force Microscopy
Authors:
Gun Ahn,
Yoon-Young Choi,
Dean J. Miller,
Hanwook Song,
Kwangsoo No,
Seungbum Hong
Abstract:
We imaged the topography of a silicon grating with atomic force microscopy (AFM) using different scan parameters to probe the effect of pixel pitch on resolution. We found variations in the measured step height and profile of the grating depending on scan parameters, with measured step width decreasing from 1300 to 108 nm and step height increasing from 172 to 184 nm when a pixel pitch in the scan…
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We imaged the topography of a silicon grating with atomic force microscopy (AFM) using different scan parameters to probe the effect of pixel pitch on resolution. We found variations in the measured step height and profile of the grating depending on scan parameters, with measured step width decreasing from 1300 to 108 nm and step height increasing from 172 to 184 nm when a pixel pitch in the scan axis decreased from 625 nm to 3.91 nm. In order to resolve the measurement anomaly of step width, we compared these values with step width and height of the same grating measured using scanning electron microscopy (SEM). The values obtained from SEM imaging were 187.3 nm +/- 6.2 nm and 116 nm +/- 10.4 nm, which were in good agreement with AFM data using a 3.91 nm of pixel pitch. We think that we need at least four pixels over the step width to avoid the measurement anomaly induced by the stick-slip or dragging of the tip. Our findings that RMS roughness varied less than 1 nm and converged at the value of 77.6 nm for any pixel pitch suggest that the RMS roughness is relatively insensitive to the pixel pitch.
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Submitted 20 September, 2019;
originally announced September 2019.
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Visualization of Ion Channels in Membranes using Electrochemical Strain Microscopy
Authors:
Suran Kim,
Chungik Oh,
Hongjun Kim,
Yuanyuan Shi,
Mario Lanza,
Kwangsoo No,
Seungbum Hong
Abstract:
Polymer composite electrolytes of Nafion and phosphotungstic acid (PWA) are fabricated and analyzed using electrochemical strain microscopy (ESM) and conductive atomic force microscopy (C-AFM) to visualize hydrophilic ion channels near the surface, which are composed of water and sulfonic acid groups. The results indicate that the fibrillar objects in ESM image, without significant changes in topo…
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Polymer composite electrolytes of Nafion and phosphotungstic acid (PWA) are fabricated and analyzed using electrochemical strain microscopy (ESM) and conductive atomic force microscopy (C-AFM) to visualize hydrophilic ion channels near the surface, which are composed of water and sulfonic acid groups. The results indicate that the fibrillar objects in ESM image, without significant changes in topography, are hydrophilic ion channels and additional ion channels formed by interaction between PWA and sulfonic groups in Nafion. In this study, the buried ion channels lying under the surface are probed as well as the inlet and outlet of the channels on the surface through combined use of ESM and C-AFM. The results further enhance the understanding of ionic conduction in composite polymer electrolytes in various fields.
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Submitted 3 September, 2019; v1 submitted 2 September, 2019;
originally announced September 2019.
