X-ray diffraction reveals the consequences of strong deformation in thin smectic films: dilation and chevron formation
Authors:
Jean de Dieu Niyonzima,
Haifa Jeridi,
Lamya Essaoui,
Caterina Tosarelli,
Alina Vlad,
Alessandro Coati,
Sebastien Royer,
Isabelle Trimaille,
Michel Goldmann,
Bruno Gallas,
Doru Constantin,
David Babonneau,
Yves Garreau,
Bernard Croset,
Samo Kralj,
Randall D. Kamien,
Emmanuelle Lacaze
Abstract:
Smectic liquid crystals can be viewed as model systems for lamellar structures for which there has been extensive theoretical development. We demonstrate that a nonlinear energy description is required with respect to the usual Landau-de Gennes elasticity in order to explain the observed layer spacing of highly curved smectic layers. Using X-ray diffraction we have quantitatively determined the di…
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Smectic liquid crystals can be viewed as model systems for lamellar structures for which there has been extensive theoretical development. We demonstrate that a nonlinear energy description is required with respect to the usual Landau-de Gennes elasticity in order to explain the observed layer spacing of highly curved smectic layers. Using X-ray diffraction we have quantitatively determined the dilation of bent layers distorted by antagonistic anchoring (as high as 1.8% of dilation for the most bent smectic layers) and accurately described it by the minimal nonlinear expression for energy. We observe a 1° tilt of planar layers that are connected to the curved layers. This value is consistent with simple energetic calculations, demonstrating how the bending energy impacts the overall structure of a thin distorted smectic film. Finally, we show that combined X-ray measurements and theoretical modeling allow for the quantitative determination of the number of curved smectic layers and of the resulting thickness of the dilated region with unprecedented precision.
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Submitted 15 July, 2024;
originally announced July 2024.
