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Showing 1–2 of 2 results for author: Niroula, J

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  1. arXiv:2504.12685  [pdf

    cond-mat.mtrl-sci physics.app-ph

    High Breakdown Electric Field (> 5 MV/cm) in UWBG AlGaN Transistors

    Authors: Seungheon Shin, Hridibrata Pal, Jon Pratt, John Niroula, Yinxuan Zhu, Chandan Joishi, Brianna A. Klein, Andrew Armstrong, Andrew A. Allerman, Tomás Palacios, Siddharth Rajan

    Abstract: We report on the design and demonstration of ultra-wide bandgap (UWBG) AlGaN-channel metal-insulator heterostructure field effect transistors (HEFTs) for high-power, high-frequency applications. We find that the integration of gate dielectrics and field plates greatly improves the breakdown field in these devices, with state-of-art average breakdown field of 5.3 MV/cm (breakdown voltage > 260 V) w… ▽ More

    Submitted 17 April, 2025; v1 submitted 17 April, 2025; originally announced April 2025.

    Comments: 14 pages, 10 figures

  2. arXiv:1901.10570  [pdf

    cs.ET cond-mat.dis-nn

    Using Floating Gate Memory to Train Ideal Accuracy Neural Networks

    Authors: Sapan Agarwal, Diana Garland, John Niroula, Robin B, Jacobs-Gedrim, Alex Hsia, Michael S. Van Heukelom, Elliot Fuller, Bruce Draper, Matthew J. Marinella

    Abstract: Floating gate SONOS (Silicon-Oxygen-Nitrogen-Oxygen-Silicon) transistors can be used to train neural networks to ideal accuracies that match those of floating point digital weights on the MNIST dataset when using multiple devices to represent a weight or within 1% of ideal accuracy when using a single device. This is enabled by operating devices in the subthreshold regime, where they exhibit symme… ▽ More

    Submitted 27 February, 2019; v1 submitted 29 January, 2019; originally announced January 2019.