The limits of Near Field Immersion Microwave Microscopy evaluated by imaging bilayer graphene Moiré patterns
Authors:
Douglas A. A. Ohlberg,
Diego Tami,
Andreij C. Gadelha,
Eliel G. S. Neto,
Fabiano C. Santana,
Daniel Miranda,
Wellington Avelino,
Kenji Watanabe,
Takashi Taniguchi,
Leonardo C. Campos,
Jhonattan C. Ramirez,
Cássio Gonçalves do Rego,
Ado Jorio,
Gilberto Medeiros-Ribeiro
Abstract:
Molecular and atomic imaging required the development of electron and scanning probe microscopies to surpass the physical limits dictated by diffraction. Nano-infrared experiments and pico-cavity tip-enhanced Raman spectroscopy imaging later demonstrated that radiation in the visible range can surpass this limit by using scanning probe tips to access the near-field regime. Here we show that ultima…
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Molecular and atomic imaging required the development of electron and scanning probe microscopies to surpass the physical limits dictated by diffraction. Nano-infrared experiments and pico-cavity tip-enhanced Raman spectroscopy imaging later demonstrated that radiation in the visible range can surpass this limit by using scanning probe tips to access the near-field regime. Here we show that ultimate resolution can be obtained by using scanning microwave imaging microscopy to reveal structures with feature sizes down to 1~nm using a radiation of 0.1~m in wavelength. As a test material we use twisted bilayer graphene, which is not only a very important recent topic due to the discovery of correlated electron effects such as superconductivity, but also because it provides a sample where we can systematically tune a superstructure Moiré patterns modulation from below one up to tens of nanometers. By analyzing the tip-sample distance dynamics, we demonstrate that this ultimate 10$^8$ probe-to-pattern resolution can be achieved by using liquid immersion microscopy concepts and exquisite force control exerted on nanoscale water menisci.
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Submitted 7 July, 2020;
originally announced July 2020.
Lattice dynamics localization in low-angle twisted bilayer graphene
Authors:
Andreij C. Gadelha,
Douglas A. A. Ohlberg,
Cassiano Rabelo,
Eliel G. S. Neto,
Thiago L. Vasconcelos,
João L. Campos,
Jessica S. Lemos,
Vinícius Ornelas,
Daniel Miranda,
Rafael Nadas,
Fabiano C. Santana,
Kenji Watanabe,
Takashi Taniguchi,
Benoit van Troeye,
Michael Lamparski,
Vincent Meunier,
Viet-Hung Nguyen,
Dawid Paszko,
Jean-Christophe Charlier,
Leonardo C. Campos,
Luiz G. Cançado,
Gilberto Medeiros-Ribeiro,
Ado Jorio
Abstract:
A low twist angle between the two stacked crystal networks in bilayer graphene enables self-organized lattice reconstruction with the formation of a periodic domain. This superlattice modulates the vibrational and electronic structures, imposing new rules for electron-phonon coupling and the eventual observation of strong correlation and superconductivity. Direct optical images of the crystal supe…
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A low twist angle between the two stacked crystal networks in bilayer graphene enables self-organized lattice reconstruction with the formation of a periodic domain. This superlattice modulates the vibrational and electronic structures, imposing new rules for electron-phonon coupling and the eventual observation of strong correlation and superconductivity. Direct optical images of the crystal superlattice in reconstructed twisted bilayer graphene are reported here, generated by the inelastic scattering of light in a nano-Raman spectroscope. The observation of the crystallographic structure with visible light is made possible due to lattice dynamics localization, the images resembling spectral variations caused by the presence of strain solitons and topological points. The results are rationalized by a nearly-free-phonon model and electronic calculations that highlight the relevance of solitons and topological points, particularly pronounced for structures with small twist angles. We anticipate our discovery to play a role in understanding Jahn-Teller effects and electronic Cooper pairing, among many other important phonon-related effects, and it may be useful for characterizing devices in the most prominent platform for the field of twistronics.
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Submitted 16 June, 2020;
originally announced June 2020.
