Showing 1–1 of 1 results for author: Narayanachari, K V L V

Growth Stress Induced Tunability of Dielectric Constant in Thin Films

Authors: K. V. L. V. Narayanachari, Hareesh Chandrasekar, Amiya Banerjee, K. B. R. Varma, Rajeev Ranjan, Navakanta Bhat, Srinivasan Raghavan

Abstract: It is demonstrated here that growth stress has a substantial effect on the dielectric constant of zirconia thin films. The correct combination of parameters - phase, texture and stress - is shown to yield films with high dielectric constant and best reported equivalent oxide thickness of 0.8 nm. The stress effect on dielectric constant is twofold, firstly, by the effect on phase transitions and se… ▽ More It is demonstrated here that growth stress has a substantial effect on the dielectric constant of zirconia thin films. The correct combination of parameters - phase, texture and stress - is shown to yield films with high dielectric constant and best reported equivalent oxide thickness of 0.8 nm. The stress effect on dielectric constant is twofold, firstly, by the effect on phase transitions and secondly by the effect on interatomic distances. We discuss and explain the physical mechanisms involved in the interplay between the stress, phase changes and the dielectric constant in detail. △ Less

Submitted 28 March, 2015; originally announced March 2015.

Comments: 11 pages, 5 figures