Gallium vacancy and the residual acceptor in undoped GaSb studied by positron lifetime spectroscopy and photoluminescence
Authors:
C. C. Ling,
W. K. Mui,
C. H. Lam,
C. D. Beling,
S. Fung,
M. K. Lui,
K. W. Cheah,
K. F. Li,
Y. W. Zhao,
M. Gong
Abstract:
Positron lifetime, Photoluminescence and Hall measurements were performed to study undoped p-type gallium antimonide materials. A 314ps lifetime component, attributed to $V_{Ga}$ related defect, was identified in the positron lifetime measurement. In the PL measurement, a $778meV$ and a $797meV$ peaks were observed. Isochronal annealing studies were performed and at the temperature of…
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Positron lifetime, Photoluminescence and Hall measurements were performed to study undoped p-type gallium antimonide materials. A 314ps lifetime component, attributed to $V_{Ga}$ related defect, was identified in the positron lifetime measurement. In the PL measurement, a $778meV$ and a $797meV$ peaks were observed. Isochronal annealing studies were performed and at the temperature of $300^{o}C$, both the 314ps positron lifetime component and the two PL signals disappeared, which gives a clear and strong evidence for their correlation. However, the hole concentration ($\sim 2\times 10^{17}cm^{-3}$) was observed to be constant throughout the whole annealing temperature range up to $500^{o}C$. Contradictory to general belief, this implies, at least for samples with annealing temperatures above $300^{o}C$, the Ga vacancy is not the acceptor responsible for the p-type conduction.
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Submitted 17 January, 2002;
originally announced January 2002.
