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3D evolution of protein networks and lipid globules in heat-treated egg yolk
Authors:
Felix Wittwer,
Nimmi Das Anthuparambil,
Frederik Unger,
Randeer Pratap Gautam,
Silja Flenner,
Imke Greving,
Christian Gutt,
Peter Modregger
Abstract:
Upon heating, egg yolk transforms from a liquid to a gel due to protein denaturation. This process can serve as a useful model to better understand protein denaturation in general. Using x-ray holographic tomography, we investigated the structural changes in egg yolk during boiling without the need for complex sample fixation or drying. Our results reveal a developing separation between proteins a…
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Upon heating, egg yolk transforms from a liquid to a gel due to protein denaturation. This process can serve as a useful model to better understand protein denaturation in general. Using x-ray holographic tomography, we investigated the structural changes in egg yolk during boiling without the need for complex sample fixation or drying. Our results reveal a developing separation between proteins and lipids, with fatty components rapidly aggregating into large globules that subsequently evolve into bubbles.
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Submitted 8 April, 2025;
originally announced April 2025.
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Multi-modal strain mapping of steel crack tips with micrometer spatial resolution
Authors:
Ahmar Khaliq,
Felix Wittwer,
Markus Hartmann,
Matthias Thimm,
Robert Brandt,
Dennis Brueckner,
Jan Garrevoet,
Gerald Falkenberg,
Peter Modregger
Abstract:
Due to their superior fatigue strength, martensitic steels are the material of choice for high cyclic loading applications such as coil springs. However, crack propagation is influenced by residual stresses and their interaction is poorly understood. In fact, Linear Elastic Fracture Mechanics predicts un-physical singularities in the strain around the crack tip. In this study, we have combined syn…
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Due to their superior fatigue strength, martensitic steels are the material of choice for high cyclic loading applications such as coil springs. However, crack propagation is influenced by residual stresses and their interaction is poorly understood. In fact, Linear Elastic Fracture Mechanics predicts un-physical singularities in the strain around the crack tip. In this study, we have combined synchrotron-based x-ray diffraction, x-ray fluorescence, and optical microscopy to map the factual strain fields around crack tips with micrometer spatial resolution. X-ray fluorescence and optical images were co-registered to locate the crack in the x-ray diffraction maps. Observed crystal recovery close to cracks confirmed that the diffraction signal originates at least in parts from the cracks. The retrieved local strain field around the crack was further improved by averaging information over carefully selected diffraction peaks. This procedure provided strain maps around crack tips with a spatial resolution of about 1 micro meter and enabled a prediction of further crack growth.
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Submitted 8 April, 2025;
originally announced April 2025.
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X-ray Strain and Stress Tensor Tomography
Authors:
Peter Modregger,
James. A. D. Ball,
Felix Wittwer,
Ahmar Khaliq,
Jonathan Wright
Abstract:
The microscopic distribution of strain and stress plays a crucial role for the performance, safety, and lifetime of components in aeronautics, automotive and critical infrastructure [1]. While non-destructive methods for measuring the stress close to the surface have long been long established, only a limited number of approaches for depth-resolved measurements based on x-rays or neutrons are avai…
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The microscopic distribution of strain and stress plays a crucial role for the performance, safety, and lifetime of components in aeronautics, automotive and critical infrastructure [1]. While non-destructive methods for measuring the stress close to the surface have long been long established, only a limited number of approaches for depth-resolved measurements based on x-rays or neutrons are available [2]. These feature significant limitations, including long scan times, intricate experimental set-ups, limited spatial resolution or anisotropic gauge volumes with aspect ratios of 1:10 or worse. Here, we present a method that overcomes these limitations and obtains tomographic reconstructions of the full six-dimensional strain and stress tensor components. Using a simple and wide spread experimental set-up that combines x-ray powder diffraction with single axis tomography, we achieve non-destructive determination of depth-resolved strain and stress distributions with isotropic resolution. The presented method could be of interest for additive manufacturing of metals [3,4], battery research [5], in-situ metallurgy [6] and the experimental validation of finite element simulations [7].
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Submitted 8 April, 2025;
originally announced April 2025.
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Measurements of dislocations in 4H-SiC with rocking curve imaging
Authors:
Ahmar Khaliq,
Felix Wittwer,
Niklas Pyrlik,
Giovanni Fevola,
Svenja Patjens,
Jackson Barp,
Gero Falkenberg,
Sven Hampel,
Michael Stuckelberger,
Jan Garrevoet,
Dennis Bruckner,
Peter Modregger
Abstract:
4H Silicon Carbide (4H-SiC) combines many attractive properties such as a high carrier mobility, a wide bandgap, and a high thermal conductivity, making it an ideal candidate for high-power electronic devices. However, a primary challenge in utilizing 4H-SiC is the presence of defects in epitaxial layers, which can significantly degrade device performance. In this study, we have used X-ray transmi…
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4H Silicon Carbide (4H-SiC) combines many attractive properties such as a high carrier mobility, a wide bandgap, and a high thermal conductivity, making it an ideal candidate for high-power electronic devices. However, a primary challenge in utilizing 4H-SiC is the presence of defects in epitaxial layers, which can significantly degrade device performance. In this study, we have used X-ray transmission topography with a rocking curve imaging technique to characterize the types and distribution of defects in 4H-SiC. The derived maps from the fitted Gaussian parameters were used to investigate dislocations in 4H-SiC. Understanding the distribution of the dislocations provides valuable insights into the overall crystal quality, which can guide improvements for the fabrication processes.
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Submitted 30 August, 2024;
originally announced September 2024.
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Annular x-ray optics offer superior resolution for radiation sensitive samples
Authors:
Felix Wittwer,
Peter Modregger
Abstract:
High-resolution x-ray microscopy requires a high photon flux to measure the signal from weakly scattering samples. This exposes samples to high radiation doses, potentially damaging or destroying them through radiation damage. In this work, we propose the use of annular optics in scanning microscopy as an alternative to full-aperture optics. Annular optics act as high-pass filters. Compared to reg…
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High-resolution x-ray microscopy requires a high photon flux to measure the signal from weakly scattering samples. This exposes samples to high radiation doses, potentially damaging or destroying them through radiation damage. In this work, we propose the use of annular optics in scanning microscopy as an alternative to full-aperture optics. Annular optics act as high-pass filters. Compared to regular optics with the same numerical aperture, annular optics expose the sample to less dose while producing the same signal from small sample features. Annular optics benefit significantly from the high photon fluxes of the latest x-ray sources to compensate for their overall smaller cross section. Using numerical simulations, we show that annular optics offer superior optical performance for sample features close to the resolution limit of the optic.
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Submitted 30 August, 2024;
originally announced September 2024.
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Parallax in angular sensitive powder diffraction tomography
Authors:
Peter Modregger,
Ahmar Khaliq,
Felix Wittwer
Abstract:
While a few methods for the determination of depth-resolved strain distributions each with inherent limitations are available, tomographic reconstruction has been applied to this problem in only a limited sense. One of the challenges was the potential impact of geometric parallax, which constitutes a non-negligible lateral offset of diffraction information arising from different sample depths at t…
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While a few methods for the determination of depth-resolved strain distributions each with inherent limitations are available, tomographic reconstruction has been applied to this problem in only a limited sense. One of the challenges was the potential impact of geometric parallax, which constitutes a non-negligible lateral offset of diffraction information arising from different sample depths at the detector. Here, the effect of parallax was investigated and two main results have emerged. First, the impact of parallax was found to be additive to other offset contributions, which implies a straightforward correction. Second, for tomographic scans utilizing a full 360° rotation parallax has been found to have no impact on reconstructions of angular information.
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Submitted 30 August, 2024;
originally announced September 2024.
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Texture tomography with high angular resolution utilizing sparsity
Authors:
Mads Carlsen,
Florencia Malamud,
Peter Modregger,
Anna Wildeis,
Markus Hartmann,
Robert Brandt,
Andreas Menzel,
Marianne Liebi
Abstract:
We demonstrate a novel approach to the reconstruction of scanning probe x-ray diffraction tomography data with anisotropic poly crystalline samples. The method involves reconstructing a voxel map containing an orientation distribution function in each voxel of an extended 3D sample. This method differs from existing approaches by not relying on a peak-finding and is therefore applicable to sample…
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We demonstrate a novel approach to the reconstruction of scanning probe x-ray diffraction tomography data with anisotropic poly crystalline samples. The method involves reconstructing a voxel map containing an orientation distribution function in each voxel of an extended 3D sample. This method differs from existing approaches by not relying on a peak-finding and is therefore applicable to sample systems consisting of small and highly mosaic crystalline domains that are not handled well by existing methods. Samples of interest include bio-minerals and a range of small-graines microstructures common in engineering metals. By choosing a particular kind of basis functions, we can effectively utilize non-negativity in orientation-space for samples with sparse texture. This enables us to achieve stable solutions at high angular resolutions where the problem would otherwise be under determined. We demonstrate the new approach using data from a shot peened martensite sample where we are able to map the twinning micro structure in the interior of a bulk sample without resolving the individual lattice domains. We also demonstrate the approach on a piece of gastropods shell with a mosaic micro structure.
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Submitted 23 September, 2024; v1 submitted 1 July, 2024;
originally announced July 2024.
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Increased material differentiation through multi-contrast x-ray imaging: a preliminary evaluation of potential applications to the detection of threat materials
Authors:
A. Astolfo,
I. G. Haig,
D. Bate,
A. Olivo,
P. Modregger
Abstract:
Most material discrimination in security inspections is based on dual-energy x-ray imaging, which enables the determination of a material's effective atomic number (Zeff) as well as electron density and its consequent classification as organic or inorganic. Recently phase-based "dark-field" x-ray imaging approaches have emerged that are sensitive to complementary features of a material, namely its…
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Most material discrimination in security inspections is based on dual-energy x-ray imaging, which enables the determination of a material's effective atomic number (Zeff) as well as electron density and its consequent classification as organic or inorganic. Recently phase-based "dark-field" x-ray imaging approaches have emerged that are sensitive to complementary features of a material, namely its unresolved microstructure. It can therefore be speculated that their inclusion in the security-based imaging could enhance material discrimination, for example of materials with similar electron densities and Z eff but different microstructures. In this paper, we present a preliminary evaluation of the advantages that such a combination could bear. Utilising an energy-resolved detector for a phase-based dark-field technique provides dual-energy attenuation and dark-field images simultaneously. In addition, since we use a method based on attenuating x-ray masks to generate the dark-field images, a fifth (attenuation) image at a much higher photon energy is obtained by exploiting the x-rays transmitted through the highly absorbing mask septa. In a first test, a threat material is imaged against a non-threat one, and we show how their discrimination based on maximising their relative contrast through linear combinations of two and five imaging channels leads to an improvement in the latter case. We then present a second example to show how the method can be extended to discrimination against more than one non-threat material, obtaining similar results. Albeit admittedly preliminary, these results indicate that significant margins of improvement in material discrimination are available by including additional x-ray contrasts in the scanning process.
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Submitted 22 December, 2022;
originally announced December 2022.
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Object Initialization For Ptychographic Scans With Reduced Overlap
Authors:
Felix Wittwer,
Peter Modregger
Abstract:
X-ray ptychography utilizes overlapping illuminations to reconstruct the object's phase and absorption signal with spatial resolutions much smaller than the focus size. Usually, the illumination overlap is chosen to be between 50% and 60% in order to ensure high quality reconstructions at reasonable scan times and/or doses. Here, we experimentally demonstrate that ptychographic iteration with obje…
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X-ray ptychography utilizes overlapping illuminations to reconstruct the object's phase and absorption signal with spatial resolutions much smaller than the focus size. Usually, the illumination overlap is chosen to be between 50% and 60% in order to ensure high quality reconstructions at reasonable scan times and/or doses. Here, we experimentally demonstrate that ptychographic iteration with object instead of flat initialization allows for a significant reduction of the overlap with only a modest loss in reconstruction quality. This approach could prove beneficial for dose sensitive experiments and for rapid feedback overview scans.
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Submitted 27 July, 2022;
originally announced July 2022.
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Defect detection in glass fabric reinforced thermoplastics by laboratory-based X-ray scattering
Authors:
Özgül Öztürk,
Rolf Brönnimann,
Peter Modregger
Abstract:
Glass fabric reinforced thermoplastic (GFRT) constitutes a class of composite materials that are especially suited for automobile construction due to their combination of low weight, ease of production and mechanical properties. However, in the manufacturing process, during forming of prefabricated laminates, defects in the glass fabric as well as in the polymer matrix can occur, which may comprom…
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Glass fabric reinforced thermoplastic (GFRT) constitutes a class of composite materials that are especially suited for automobile construction due to their combination of low weight, ease of production and mechanical properties. However, in the manufacturing process, during forming of prefabricated laminates, defects in the glass fabric as well as in the polymer matrix can occur, which may compromise the safety or the lifetime of components. Thus, the detection of defects in GFRTs for production monitoring and a deep understanding of defect formation/evolution is essential for mass production. Here, we experimentally demonstrate that a certain type of defects (i.e., local fiber shifts), can be detected reliably by X-ray scattering based on the edge-illumination principle.
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Submitted 29 June, 2022; v1 submitted 25 June, 2022;
originally announced June 2022.
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Ptychographic reconstruction with wavefront initialization
Authors:
Felix Wittwer,
Peter Modregger
Abstract:
X-ray ptychography is a cutting edge imaging technique providing ultra-high spatial resolutions. In ptychography, phase retrieval, i.e., the recovery of a complex valued signal from intensity-only measurements, is enabled by exploiting a redundancy of information contained in diffraction patterns measured with overlapping illuminations. For samples that are considerably larger than the probe we sh…
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X-ray ptychography is a cutting edge imaging technique providing ultra-high spatial resolutions. In ptychography, phase retrieval, i.e., the recovery of a complex valued signal from intensity-only measurements, is enabled by exploiting a redundancy of information contained in diffraction patterns measured with overlapping illuminations. For samples that are considerably larger than the probe we show that during the iteration the bulk information has to propagate from the sample edges to the center. This constitutes an inherent limitation of reconstruction speed for algorithms that use a flat initialization. Here, we experimentally demonstrate that a considerable improvement of computational speed can be achieved by utilizing a low resolution sample wavefront retrieved from measured diffraction patterns as initialization. In addition, we show that this approach avoids phase singularity artifacts due to strong phase gradients. Wavefront initialization is computationally fast and compatible with non-bulky samples. Therefore, the presented approach is readily adaptable with established ptychographic reconstruction algorithms implying a wide spread use.
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Submitted 22 May, 2022;
originally announced May 2022.
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The diffraction volume for square-shaped samples in X-ray diffraction with high spatial resolution
Authors:
Prerana Chakrabarti,
Peter Modregger
Abstract:
X-ray diffraction with high spatial resolution is a prerequisite for the characterization of (poly)-crystalline materials on micro- or nanoscopic scales. This can be achieved by utilizing a focused X-ray beam and scanning of the sample. However, due to the penetration of the X-rays into the material, the exact location of diffraction within the sample is ambiguous. Here, we utilize numerical simul…
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X-ray diffraction with high spatial resolution is a prerequisite for the characterization of (poly)-crystalline materials on micro- or nanoscopic scales. This can be achieved by utilizing a focused X-ray beam and scanning of the sample. However, due to the penetration of the X-rays into the material, the exact location of diffraction within the sample is ambiguous. Here, we utilize numerical simulations to compute the spatially resolved diffraction volume in order to investigate these ambiguities. We demonstrate that partial depth sensitivity can be achieved by rotating the sample.
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Submitted 22 April, 2022;
originally announced April 2022.
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Calibration of scanning acoustic microscopy for the differentiation between unstable and stable atherosclerotic plaques by X-ray fluorescence imaging
Authors:
Peter Modregger,
Mallika Khosla,
Prerana Chakrabarti,
Özgül Öztürk,
Kathryn M. Spiers,
Mehmet Burcin Unlu,
Bükem Tanören
Abstract:
Although cardiovascular diseases are the leading cause of death globally, non-invasive and inexpensive diagnostic tools for the identification of associated unstable atherosclerotic plaques are not yet available. Scanning acoustic microscopy offers a high potential to fill this critical gap in patient care. However, convincing validation and calibration of this technique requires high resolution m…
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Although cardiovascular diseases are the leading cause of death globally, non-invasive and inexpensive diagnostic tools for the identification of associated unstable atherosclerotic plaques are not yet available. Scanning acoustic microscopy offers a high potential to fill this critical gap in patient care. However, convincing validation and calibration of this technique requires high resolution maps of Ca concentrations of atherosclerotic plaques. Here, we demonstrate that synchrotron radiation-based X-ray fluorescence imaging with micrometer spatial resolution can provide such a gold standard.
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Submitted 4 May, 2022; v1 submitted 14 April, 2022;
originally announced April 2022.
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Accelerated iterative tomographic reconstruction with x-ray edge illumination
Authors:
Peter Modregger,
Tomasz Korzec,
Jeff Meganck,
Lorenzo Massimi,
Alessandro Olivo,
Marco Endrizzi
Abstract:
Compared to standard tomographic reconstruction, iterative approaches offer the possibility to account for extraneous experimental influences, which allows for a suppression of related artifacts. However, the inclusion of corresponding parameters in the iterative forward model typically leads to longer computation times. Here, we demonstrate experimentally for phase sensitive X-ray imaging based o…
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Compared to standard tomographic reconstruction, iterative approaches offer the possibility to account for extraneous experimental influences, which allows for a suppression of related artifacts. However, the inclusion of corresponding parameters in the iterative forward model typically leads to longer computation times. Here, we demonstrate experimentally for phase sensitive X-ray imaging based on the edge illumination principle that inadequately sampled illumination curves result in ring artifacts in tomographic reconstructions. We take advantage of appropriately sampled illumination curves instead, which enables us to eliminate the corresponding parameter from the forward model and substantially increase computational speed. In addition, we demonstrate a 30\% improvement in spatial resolution of the iterative approach compared with the standard non-iterative single shot approach. Further, we report on several significant improvements in our numerical implementation of the iterative approach, which we make available online with this publication. Finally, we show that the combination of both experimental and algorithmic advancement lead to a total speed increase by one order of magnitude and an improved contrast to noise ratio in the reconstructions.
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Submitted 17 February, 2022;
originally announced February 2022.
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X-ray diffraction with micrometer spatial resolution for highly absorbing samples
Authors:
P. Chakrabarti,
A. Wildeis,
M. Hartmann,
R. Brandt,
R. Döhrmann,
G. Fevola,
C. Ossig,
M. E. Stuckelberger,
J. Garrevoet,
K. V. Falch,
V. Galbierz,
G. Falkenberg,
P. Modregger
Abstract:
X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we…
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X-ray diffraction with high spatial resolution is commonly used to characterize (poly-)crystalline samples with, for example, respect to local strain, residual stress, grain boundaries and texture. However, the investigation of highly absorbing samples or the simultaneous assessment of high-Z materials by X-ray fluorescence have been limited due to the utilisation of low photon energies. Here, we report on a goniometer-based setup implemented at the P06 beamline of PETRA III that allows for micrometer spatial resolution with a photon energy of 35 keV and above. A highly focused beam was achieved by using compound refractive lenses and high precision sample manipulation was enabled by a goniometer that allows for up to 5D scans (3 rotations & 2 translations). As experimental examples, we demonstrate the determination of local strain variations in martensitic steel samples with micrometer spatial resolution as well as the simultaneous elemental distribution for high-Z materials in a thin film solar cell. Our proposed approach allows users from the materials science community to determine micro-structural properties even in highly absorbing samples.
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Submitted 31 January, 2022;
originally announced January 2022.