-
In-situ strain tuning of the Dirac surface states in Bi2Se3 films
Authors:
David Floetotto,
Yang Bai,
Yang-Hao Chan,
Peng Chen,
Xiaoxiong Wang,
Paul Rossi,
Cai-Zhi Xu,
Can Zhang,
Joe A. Hlevyack,
Jonathan D. Denlinger,
Hawoong Hong,
Mei-Yin Chou,
Eric J. Mittemeijer,
James N. Eckstein,
Tai-Chang Chiang
Abstract:
Elastic strain has the potential for a controlled manipulation of the band gap and spin-polarized Dirac states of topological materials, which can lead to pseudo-magnetic-field effects, helical flat bands and topological phase transitions. However, practical realization of these exotic phenomena is challenging and yet to be achieved. Here, we show that the Dirac surface states of the topological i…
▽ More
Elastic strain has the potential for a controlled manipulation of the band gap and spin-polarized Dirac states of topological materials, which can lead to pseudo-magnetic-field effects, helical flat bands and topological phase transitions. However, practical realization of these exotic phenomena is challenging and yet to be achieved. Here, we show that the Dirac surface states of the topological insulator Bi2Se3 can be reversibly tuned by an externally applied elastic strain. Performing in-situ x-ray diffraction and in-situ angle-resolved photoemission spectroscopy measurements during tensile testing of epitaxial Bi2Se3 films bonded onto a flexible substrate, we demonstrate elastic strains of up to 2.1% and quantify the resulting reversible changes in the topological surface state. Our study establishes the functional relationship between the lattice and electronic structures of Bi2Se3 and, more generally, demonstrates a new route toward momentum-resolved mapping of strain-induced band structure changes.
△ Less
Submitted 1 July, 2018;
originally announced July 2018.
-
The Microstructure of Tool Steel after Low Temperature Ion Nitriding
Authors:
L. F. Zagonel,
E. J. Mittemeijer,
F. Alvarez
Abstract:
The microstructural development in H13 tool steel upon nitriding by an ion beam process was investigated. The nitriding experiments were performed at a relatively low temperature of about 400°C and at constant ion beam energy (400 eV) of different doses in a high-vacuum preparation chamber; the ion source was fed with high purity nitrogen gas. The specimens were characterized by X-ray photoelectro…
▽ More
The microstructural development in H13 tool steel upon nitriding by an ion beam process was investigated. The nitriding experiments were performed at a relatively low temperature of about 400°C and at constant ion beam energy (400 eV) of different doses in a high-vacuum preparation chamber; the ion source was fed with high purity nitrogen gas. The specimens were characterized by X-ray photoelectron spectroscopy (XPS), electron probe microanalysis (EPMA), scanning and transmission electron microscopy (SEM and TEM), and grazing incidence and Bragg-Brentano X-ray diffractometry. In particular, the influence of the nitrogen surface concentration on the development of the nitrogen concentration-depth profile and the possible precipitation of alloying element nitrides are discussed.
△ Less
Submitted 12 December, 2012;
originally announced December 2012.
-
Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary
Authors:
F. Pérez-Willard,
D. Wolde-Giorgis,
T. Al-Kassab,
G. A. López,
E. J. Mittemeijer,
R. Kirchheim,
D. Gerthsen
Abstract:
Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a dual-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomograph…
▽ More
Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a dual-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomographic atom probe (TAP). The analysis of such specimens allows in particular the determination of solute excess atoms at this specific grain boundary and hence the investigation of the segregation behaviour. The crucial preparation steps are discussed in detail in the present study for the S 19a {331} <110> grain boundary of a 40 at.ppm-Bi doped Cu bi-crystal. Transmission electron microscope (TEM) images and TAP analyses of the atom probe tips demonstrate unambiguously the presence of the selectively prepared grain boundary in the apex region of some of the specimens.
△ Less
Submitted 24 January, 2006;
originally announced January 2006.
