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Application of machine learning in grain-related clustering of Laue spots in a polycrystalline energy dispersive Laue pattern
Authors:
Amir Tosson,
Mohammad Shokr,
Mahmoud Al Humaidi,
Eduard Mikayelyan,
Christian Gutt,
Ulrich Pietsch
Abstract:
We address the identification of grain-corresponding Laue reflections in energy dispersive Laue diffraction (EDLD) experiments by formulating it as a clustering problem solvable through unsupervised machine learning (ML). To achieve reliable and efficient identification of grains in a Laue pattern, we employ a combination of clustering algorithms, namely hierarchical clustering (HC) and K-means. T…
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We address the identification of grain-corresponding Laue reflections in energy dispersive Laue diffraction (EDLD) experiments by formulating it as a clustering problem solvable through unsupervised machine learning (ML). To achieve reliable and efficient identification of grains in a Laue pattern, we employ a combination of clustering algorithms, namely hierarchical clustering (HC) and K-means. These algorithms allow us to group together similar Laue reflections, revealing the underlying grain structure in the diffraction pattern. Additionally, we utilise the elbow method to determine the optimal number of clusters, ensuring accurate results. To evaluate the performance of our proposed method, we conducted experiments using both simulated and experimental datasets obtained from nickel wires. The simulated datasets were generated to mimic the characteristics of real-world EDLD experiments, while the experimental datasets were obtained from actual measurements.
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Submitted 16 December, 2024;
originally announced December 2024.
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Local structure of semicrystalline P3HT films probed by nanofocused coherent x-rays
Authors:
Ruslan P. Kurta,
Linda Grodd,
Eduard Mikayelyan,
Oleg Y. Gorobtsov,
Ivan A. Zaluzhnyy,
Ilaria Fratoddi,
Iole Venditti,
Maria Vittoria Russo,
Michael Sprung,
Ivan A. Vartanyants,
S. Grigorian
Abstract:
We present results of an x-ray study of structural properties of semicrystalline polymer films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis (XCCA) to scattering data from blends of poly(3-hexylthiophene) (P3HT) embedded with gold nanoparticles (AuNPs). Spatially resolved maps of orientational distribution of crystalline domains allow us to distinguish sample region…
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We present results of an x-ray study of structural properties of semicrystalline polymer films using nanofocused x-ray beam. We applied the x-ray cross-correlation analysis (XCCA) to scattering data from blends of poly(3-hexylthiophene) (P3HT) embedded with gold nanoparticles (AuNPs). Spatially resolved maps of orientational distribution of crystalline domains allow us to distinguish sample regions of predominant face-on morphology,with a continuous transition to edge-on morphology. The average size of crystalline domains was determined to be of the order of 10 nm. As compared to pristine P3HT film, the P3HT/AuNPs blend is characterized by substantial ordering of crystalline domains, which can be induced by Au nanoparticles. The inhomogeneous structure of the polymer film is clearly visualized on the spatially resolved nanoscale 2D maps obtained using XCCA. Our results suggest that the observed changes of the polymer matrix within crystalline regions can be attributed to nanoconfinement in the presence of gold nanoparticles.
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Submitted 4 November, 2014;
originally announced November 2014.
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Spatial properties of $π-π$ conjugated network in semicrystalline polymer thin films studied by intensity x-ray cross-correlation functions
Authors:
R. P. Kurta,
L. Grodd,
E. Mikayelyan,
O. Y. Gorobtsov,
I. Fratoddi,
I. Venditti,
M. Sprung,
S. Grigorian,
I. A. Vartanyants
Abstract:
We present results of x-ray study of spatial properties of $π-π$ conjugated networks in polymer thin films. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) and gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders $n=2,4$ and $6$ measuring t…
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We present results of x-ray study of spatial properties of $π-π$ conjugated networks in polymer thin films. We applied the x-ray cross-correlation analysis to x-ray scattering data from blends of poly(3-hexylthiophene) (P3HT) and gold nanoparticles. The Fourier spectra of the intensity cross-correlation functions for different films contain non-zero components of orders $n=2,4$ and $6$ measuring the degree of structural order in the system.
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Submitted 6 November, 2013;
originally announced November 2013.
