Bending forces plastically deform growing bacterial cell walls
Authors:
Ariel Amir,
Farinaz Babaeipour,
Dustin B. McIntosh,
David R. Nelson,
Suckjoon Jun
Abstract:
Cell walls define a cell shape in bacteria. They are rigid to resist large internal pressures, but remarkably plastic to adapt to a wide range of external forces and geometric constraints. Currently, it is unknown how bacteria maintain their shape. In this work, we develop experimental and theoretical approaches and show that mechanical stresses regulate bacterial cell-wall growth. By applying a p…
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Cell walls define a cell shape in bacteria. They are rigid to resist large internal pressures, but remarkably plastic to adapt to a wide range of external forces and geometric constraints. Currently, it is unknown how bacteria maintain their shape. In this work, we develop experimental and theoretical approaches and show that mechanical stresses regulate bacterial cell-wall growth. By applying a precisely controllable hydrodynamic force to growing rod-shaped Escherichia coli and Bacillus subtilis cells, we demonstrate that the cells can exhibit two fundamentally different modes of deformation. The cells behave like elastic rods when subjected to transient forces, but deform plastically when significant cell wall synthesis occurs while the force is applied. The deformed cells always recover their shape. The experimental results are in quantitative agreement with the predictions of the theory of dislocation-mediated growth. In particular, we find that a single dimensionless parameter, which depends on a combination of independently measured physical properties of the cell, can describe the cell's responses under various experimental conditions. These findings provide insight into how living cells robustly maintain their shape under varying physical environments.
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Submitted 30 April, 2014; v1 submitted 24 May, 2013;
originally announced May 2013.
Millimeter Wave Localization: Slow Light and Enhanced Absorption
Authors:
John A. Scales,
L. D. Carr,
D. B. McIntosh,
Valentin Freilikher,
Yu. P. Bliokh
Abstract:
We exploit millimeter wave technology to measure the reflection and transmission response of random dielectric media. Our samples are easily constructed from random stacks of identical, sub-wavelength quartz and Teflon wafers. The measurement allows us to observe the characteristic transmission resonances associated with localization. We show that these resonances give rise to enhanced attenuati…
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We exploit millimeter wave technology to measure the reflection and transmission response of random dielectric media. Our samples are easily constructed from random stacks of identical, sub-wavelength quartz and Teflon wafers. The measurement allows us to observe the characteristic transmission resonances associated with localization. We show that these resonances give rise to enhanced attenuation even though the attenuation of homogeneous quartz and Teflon is quite low. We provide experimental evidence of disorder-induced slow light and superluminal group velocities, which, in contrast to photonic crystals, are not associated with any periodicity in the system. Furthermore, we observe localization even though the sample is only about four times the localization length, interpreting our data in terms of an effective cavity model. An algorithm for the retrieval of the internal parameters of random samples (localization length and average absorption rate) from the external measurements of the reflection and transmission coefficients is presented and applied to a particular random sample. The retrieved value of the absorption is in agreement with the directly measured value within the accuracy of the experiment.
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Submitted 12 June, 2007; v1 submitted 22 January, 2007;
originally announced January 2007.
