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Showing 1–3 of 3 results for author: Lyeo, H

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  1. arXiv:2101.12485  [pdf

    cond-mat.mtrl-sci cond-mat.mes-hall

    Derivation of a governing rule in triboelectric charging and series from thermoelectricity

    Authors: Eui-Cheol Shin, Jae-Hyeon Ko, Ho-Ki Lyeo, Yong-Hyun Kim

    Abstract: Friction-driven static electrification is familiar and fundamental in daily life, industry, and technology, but its basics have long been unknown and have continually perplexed scientists from ancient Greece to the modern high-tech era. Despite its simple manifestation, triboelectric charging is believed to be very complex because of the unresolvable interfacial interaction between two rubbing mat… ▽ More

    Submitted 28 April, 2022; v1 submitted 29 January, 2021; originally announced January 2021.

    Comments: 34 pages, 9 figures, 2 tables, supplementary materials (15 pages)

    Journal ref: Phys. Rev. Research 4, 023131 (2022)

  2. arXiv:1307.3742  [pdf

    cond-mat.mes-hall cond-mat.mtrl-sci

    Seebeck effect at the atomic scale

    Authors: Eui-Sup Lee, Sanghee Cho, Ho-Ki Lyeo, Yong-Hyun Kim

    Abstract: The atomic variations of electronic wavefunctions at the surface and electron scattering near a defect have been detected unprecedentedly by tracing thermoelectric voltages given a temperature bias [Cho et al., Nature Mater. 12, 913 (2013)]. Because thermoelectricity, or Seebeck effect, is associated with heat-induced electron diffusion, how the thermoelectric signal is related to the atomic-scale… ▽ More

    Submitted 1 April, 2014; v1 submitted 14 July, 2013; originally announced July 2013.

    Comments: Main text (16 pages including 4 figures and 34 references) plus Supplementary Information (10 pages including 6 figures)

    Journal ref: Phys. Rev. Lett. 112, 136601 (2014)

  3. arXiv:1305.2845  [pdf

    cond-mat.mtrl-sci

    Thermoelectric imaging of structural disorder in epitaxial graphene

    Authors: Sanghee Cho, Stephen Dongmin Kang, Wondong Kim, Eui-Sup Lee, Sung-Jae Woo, Ki-Jeong Kong, Ilyou Kim, Hyeong-Do Kim, Tong Zhang, Joseph A. Stroscio, Yong-Hyun Kim, Ho-Ki Lyeo

    Abstract: Heat is a familiar form of energy transported from a hot side to a colder side of an object, but not a notion associated with microscopic measurements of electronic properties. A temperature difference within a material causes charge carriers, electrons or holes, to diffuse along the temperature gradient inducing a thermoelectric voltage. Here we show that local thermoelectric measurements can yie… ▽ More

    Submitted 15 July, 2013; v1 submitted 13 May, 2013; originally announced May 2013.

    Comments: Main Text (19 pages including 5 figures) + Supplementary Information (6 pages including 10 figures, simplified version)

    Journal ref: Nature Materials 12 (2013) 913-918