Structural analysis of strained LaVO$_3$ thin films
Authors:
H. Rotella,
O. Copie,
G. Mouillard-Steciuk,
H. Ouerdane,
P. Boullay,
P. Roussel,
M. Morales,
A. David,
A. Pautrat,
B. Mercey,
L. Lutterotti,
D. Chateigner,
W. Prellier
Abstract:
While structure refinement is routinely achieved for simple bulk materials, the accurate structural determination still poses challenges for thin films due on the one hand to the small amount of material deposited on the thicker substrate and, on the other hand, to the intricate epitaxial relationships that substantially complicate standard X-ray diffraction analysis. Using a combined approach, we…
▽ More
While structure refinement is routinely achieved for simple bulk materials, the accurate structural determination still poses challenges for thin films due on the one hand to the small amount of material deposited on the thicker substrate and, on the other hand, to the intricate epitaxial relationships that substantially complicate standard X-ray diffraction analysis. Using a combined approach, we analyze the crystal structure of epitaxial LaVO$_3$ thin films grown on (100)-oriented SrTiO$_3$. Transmission electron microscopy study reveals that the thin films are epitaxially grown on SrTiO$_3$ and points to the presence of 90$^{\circ}$ oriented domains. The mapping of the reciprocal space obtained by high resolution X-ray diffraction permits refinement of the lattice parameters. We finally deduce that strain accommodation imposes a monoclinic structure onto the LaVO$_3$ film. The reciprocal space maps are numerically processed and the extracted data computed to refine the atomic positions, which are compared to those obtained using precession electron diffraction tomography. We discuss the obtained results and our methodological approach as a promising thin film structure determination for complex systems.
△ Less
Submitted 7 July, 2014; v1 submitted 28 March, 2014;
originally announced March 2014.
Growth and texture of Spark Plasma Sintered Al2O3 ceramics: a combined analysis of X-rays and Electron Back Scatter Diffraction
Authors:
Dhanapal Pravarthana,
D. Chateigner,
L. Lutterotti,
M Lacotte,
S. Marinel,
P. A. Dubos,
I Hervan,
E Hug,
Paul A. Salvador,
W. Prellier
Abstract:
Textured alumina ceramics were obtained by Spark Plasma Sintering (SPS) of undoped commercial a-Al2O3 powders. Various parameters (density, grain growth, grain size distribution) of the alumina ceramics, sintered at two typical temperatures 1400°C and 1700°C, are investigated. Quantitative textural and structural analysis, carried out using a combination of Electron Back Scattering Diffraction (EB…
▽ More
Textured alumina ceramics were obtained by Spark Plasma Sintering (SPS) of undoped commercial a-Al2O3 powders. Various parameters (density, grain growth, grain size distribution) of the alumina ceramics, sintered at two typical temperatures 1400°C and 1700°C, are investigated. Quantitative textural and structural analysis, carried out using a combination of Electron Back Scattering Diffraction (EBSD) and X-ray diffraction (XRD), are represented in the form of mapping, and pole figures. The mechanical properties of these textured alumina ceramics include high elastic modulus and hardness value with high anisotropic nature, opening the door for a large range of applications
△ Less
Submitted 3 April, 2013;
originally announced April 2013.
