Showing 1–3 of 3 results for author: Lam, S K H

Direct writing of high temperature superconducting Josephson junctions using a thermal scanning probe

Authors: Ngoc My Hanh Duong, Amanuel M. Berhane, Dave Mitchell, Rifat Ullah, Ting Zhang, He Zhu, Jia Du, Simon K. H. Lam, Emma E. Mitchell, Avi Bendavid

Abstract: In this letter, we demonstrate for the first time the creation of Josephson-like superconducting nanojunctions using a thermal scanning probe to directly inscribe weak links into microstrips of YBa2Cu3O7-x (YBCO). Our method effectively reduces the critical current (Ic) over an order of magnitude. The resulting nanobridges exhibit clear evidence of Josephson effects, of SNS-type junctions, as show… ▽ More In this letter, we demonstrate for the first time the creation of Josephson-like superconducting nanojunctions using a thermal scanning probe to directly inscribe weak links into microstrips of YBa2Cu3O7-x (YBCO). Our method effectively reduces the critical current (Ic) over an order of magnitude. The resulting nanobridges exhibit clear evidence of Josephson effects, of SNS-type junctions, as shown by both the DC and AC Josephson effects. This approach provides a novel and flexible method for scaling up quantum mechanical circuits that operate at liquid nitrogen temperatures. Additionally, it offers a promising pathway for modifying properties of the junctions in-situ and post fabrication. △ Less

Submitted 30 September, 2024; originally announced October 2024.

Comments: 14 pages, 4 figures

Flux noise in ion-implanted nanoSQUIDs

Authors: Giuseppe C. Tettamanzi, Christopher I. Pakes, Simon K. H. Lam, Steven Prawer

Abstract: Focused ion beam (FIB) technology has been used to fabricate miniature Nb DC SQUIDs which incorporate resistively-shunted microbridge junctions and a central loop with a hole diameter ranging from 1058 nm to 50 nm. The smallest device, with a 50 nm hole diameter, has a white flux noise level of 2.6 microphy_{0}/Hz^{0.5} at 10^{4} Hz. The scaling of the flux noise properties and focusing effect of… ▽ More Focused ion beam (FIB) technology has been used to fabricate miniature Nb DC SQUIDs which incorporate resistively-shunted microbridge junctions and a central loop with a hole diameter ranging from 1058 nm to 50 nm. The smallest device, with a 50 nm hole diameter, has a white flux noise level of 2.6 microphy_{0}/Hz^{0.5} at 10^{4} Hz. The scaling of the flux noise properties and focusing effect of the SQUID with the hole size were examined. The observed low-frequency flux noise of different devices were compared with the contribution due to the spin fluctuation of defects during FIB processing and the thermally activated flux hopping in the SQUID washer. △ Less

Submitted 29 March, 2010; originally announced March 2010.

Comments: 16 pages, 6 figures, 1 table

Journal ref: Supercond. Sci. Technol. 22 (2009) 064006

Direct measurement of penetration length in ultra-thin and/or mesoscopic superconducting structures

Authors: L. Hao, J. C. Macfarlane, J. C. Gallop, S. K. H. Lam

Abstract: We describe a method for direct measurement of the magnetic penetration length in thin (10 - 100 nm) superconducting structures having overall dimensions in the range 1 to 100 micrometers. The method is applicable for broadband magnetic fields from dc to MHz frequencies. We describe a method for direct measurement of the magnetic penetration length in thin (10 - 100 nm) superconducting structures having overall dimensions in the range 1 to 100 micrometers. The method is applicable for broadband magnetic fields from dc to MHz frequencies. △ Less

Submitted 12 June, 2006; originally announced June 2006.

Comments: Accepted by Journal of Applied P:hysics (Jun 2006).5 pages, 5 figures