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Strain distribution in WS2 monolayers detected through Polarization-resolved Second Harmonic Generation
Authors:
George Kourmoulakis,
Sotiris Psilodimitrakopoulos,
George Miltos Maragkakis,
Leonidas Mouchliadis,
Antonios Michail,
Joseph A Christodoulides,
Manoj Tripathi,
Alan B Dalton,
John Parthenios,
Konstantinos Papagelis,
Emmanuel Stratakis,
George Kioseoglou
Abstract:
Two-dimensional (2D) graphene and graphene-related materials (GRMs) show great promise for future electronic devices. Nevertheless, GRMs result distinct properties under the influence of the substrate that serves as support through uneven compression/ elongation of GRMs surface atoms. Strain in GRM monolayers is the most common feature that alters the interatomic distances, band structure, providi…
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Two-dimensional (2D) graphene and graphene-related materials (GRMs) show great promise for future electronic devices. Nevertheless, GRMs result distinct properties under the influence of the substrate that serves as support through uneven compression/ elongation of GRMs surface atoms. Strain in GRM monolayers is the most common feature that alters the interatomic distances, band structure, providing a new degree of freedom that allows regulation of their electronic properties and introducing the field of straintronics. Having an all-optical detection, a minimally invasive tool that rapidly probes strain in large areas of GRM monolayers, would be of great importance in the research and development of novel 2D devices. Here, we use Polarization-resolved Second Harmonic Generation (P-SHG) optical imaging to identify strain distribution, induced in a single layer of WS2 placed on a pre-patterned Si/SiO2 substrate with cylindrical wells. By fitting the P-SHG data pixel-by-pixel, we produce spatially resolved images of the crystal armchair direction. In regions where the WS2 monolayer conforms to the pattern topography, a distinct cross-shaped pattern is evident in the armchair image owing to strain. The presence of strain in these regions is independently confirmed using a combination of atomic force microscopy and Raman mapping.
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Submitted 28 March, 2024;
originally announced March 2024.
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Biaxial strain tuning of exciton energy and polarization in monolayer WS2
Authors:
G. Kourmoulakis,
A. Michail,
I. Paradisanos,
X. Marie,
M. M. Glazov,
B. Jorissen,
L. Covaci,
E. Stratakis,
K. Papagelis,
J. Parthenios,
G. Kioseoglou
Abstract:
We perform micro-photoluminescence and Raman experiments to examine the impact of biaxial tensile strain on the optical properties of WS2 monolayers. A strong shift on the order of -130 meV per % of strain is observed in the neutral exciton emission at room temperature. Under near-resonant excitation we measure a monotonic decrease in the circular polarization degree under applied strain. We exper…
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We perform micro-photoluminescence and Raman experiments to examine the impact of biaxial tensile strain on the optical properties of WS2 monolayers. A strong shift on the order of -130 meV per % of strain is observed in the neutral exciton emission at room temperature. Under near-resonant excitation we measure a monotonic decrease in the circular polarization degree under applied strain. We experimentally separate the effect of the strain-induced energy detuning and evaluate the pure effect coming from biaxial strain. The analysis shows that the suppression of the circular polarization degree under biaxial strain is related to an interplay of energy and polarization relaxation channels as well as to variations in the exciton oscillator strength affecting the long-range exchange interaction.
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Submitted 24 July, 2023;
originally announced July 2023.
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Optical versus electron diffraction imaging of Twist-angle in 2D transition metal dichalcogenide bilayer superlattices
Authors:
S. Psilodimitrakopoulos,
A. Orekhov,
L. Mouchliadis,
D. Jannis,
G. M. Maragkakis,
G. Kourmoulakis,
N. Gauquelin,
G. Kioseoglou,
J. Verbeeck,
E. Stratakis
Abstract:
Atomically thin two-dimensional (2D) materials can be vertically stacked with van der Waals bonds, which enable interlayer coupling. In the particular case of transition metal dichalcogenide (TMD) bilayers, the relative direction between the two monolayers, coined as twist-angle, modifies the crystal symmetry and creates a superlattice with exciting properties. Here, we demonstrate an all-optical…
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Atomically thin two-dimensional (2D) materials can be vertically stacked with van der Waals bonds, which enable interlayer coupling. In the particular case of transition metal dichalcogenide (TMD) bilayers, the relative direction between the two monolayers, coined as twist-angle, modifies the crystal symmetry and creates a superlattice with exciting properties. Here, we demonstrate an all-optical method for pixel-by-pixel mapping of the twist-angle with resolution of 0.23 degrees, via polarization-resolved second harmonic generation (P-SHG) microscopy and we compare it with four-dimensional scanning transmission electron microscopy (4D-STEM). It is found that the twist-angle imaging of WS2 bilayers, using the P-SHG technique is in excellent agreement with that obtained using electron diffraction. The main advantages of the optical approach are that the characterization is performed on the same substrate that the device is created on and that it is three orders of magnitude faster than the 4D-STEM. We envisage that the optical P-SHG imaging could become the gold standard for the quality examination of TMD superlattice-based devices.
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Submitted 12 April, 2021;
originally announced April 2021.
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Probing valley population imbalance in transition metal dichalcogenides via temperature-dependent second harmonic generation imaging
Authors:
Leonidas Mouchliadis,
Sotiris Psilodimitrakopoulos,
George Miltos Maragkakis,
Ioanna Demeridou,
George Kourmoulakis,
Andreas Lemonis,
George Kioseoglou,
Emmanuel Stratakis
Abstract:
Degenerate minima in momentum space - valleys - provide an additional degree of freedom that can be used for information transport and storage. Notably, such minima naturally exist in the band structure of transition metal dichalcogenides (TMDs). When these atomically thin crystals interact with intense laser light, the second harmonic generated (SHG) field inherits special characteristics that re…
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Degenerate minima in momentum space - valleys - provide an additional degree of freedom that can be used for information transport and storage. Notably, such minima naturally exist in the band structure of transition metal dichalcogenides (TMDs). When these atomically thin crystals interact with intense laser light, the second harmonic generated (SHG) field inherits special characteristics that reflect not only the broken inversion symmetry in real space, but also the valley anisotropy in reciprocal space. The latter is present whenever there exists a valley population imbalance (VPI) between the two valleys. In this work, it is shown that the temperature-induced changes of the SHG intensity dependence on the excitation fieldpolarization, is a unique fingerprint of VPI in TMDs. Analysis of such changes, in particular, enables the calculation of the valley-induced to intrinsic second order susceptibilities ratio. Unlike temperature-dependent photoluminescence (PL) measurements of valley polarization and coherence, the proposed polarization resolved SHG (PSHG) methodology is insensitive to the excitation field wavelength, an advantage that renders it ideal for monitoring VPI in large crystalline or stacked areas comprising different TMDs.
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Submitted 26 June, 2020;
originally announced June 2020.
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Twist Angle mapping in layered WS2 by Polarization-Resolved Second Harmonic Generation
Authors:
Sotiris Psilodimitrakopoulos,
Leonidas Mouchliadis,
Ioannis Paradisanos,
George Kourmoulakis,
Andreas Lemonis,
George Kioseoglou,
Emmanuel Stratakis
Abstract:
Stacked atomically thin transition metal dichalcogenides (TMDs) exhibit fundamentally new physical properties compared to those of the individual layers. The twist angle between the layers plays a crucial role in tuning these properties. Having a tool that provides highresolution, large area mapping of the twist angle, would be of great importance in the characterization of such 2D structures. Her…
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Stacked atomically thin transition metal dichalcogenides (TMDs) exhibit fundamentally new physical properties compared to those of the individual layers. The twist angle between the layers plays a crucial role in tuning these properties. Having a tool that provides highresolution, large area mapping of the twist angle, would be of great importance in the characterization of such 2D structures. Here we use polarization-resolved second harmonic generation (P-SHG) imaging microscopy to rapidly map the twist angle in large areas of overlapping WS2 stacked layers. The robustness of our methodology lies in the combination of both intensity and polarization measurements of SHG in the overlapping region. This allows the accurate measurement and consequent pixel-by-pixel mapping of the twist angle in this area. For the specific case of 30o twist angle, P-SHG enables imaging of individual layers.
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Submitted 29 July, 2019; v1 submitted 6 March, 2019;
originally announced March 2019.
