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Phase-Separated Charge Order and Twinning Across Length Scales in CsV$_3$Sb$_5$
Authors:
Jayden Plumb,
Andrea Capa Salinas,
Krishnanand Mallayya,
Elliot Kisiel,
Fellipe B. Carneiro,
Reina Gomez,
Ganesh Pokharel,
Eun-Ah Kim,
Suchismita Sarker,
Zahirul Islam,
Sam Daly,
Stephen D. Wilson
Abstract:
We present X-ray scattering studies resolving structural twinning and phase separation in the charge density wave (CDW) state of the kagome superconductor CsV$_3$Sb$_5$. The three-dimensional CDW state in CsV$_3$Sb$_5$ is reported to form a complex superposition of Star of David (SoD) or Tri-Hexagonal (TrH) patterns of distortion within its kagome planes, but the out-of-plane stacking is marked by…
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We present X-ray scattering studies resolving structural twinning and phase separation in the charge density wave (CDW) state of the kagome superconductor CsV$_3$Sb$_5$. The three-dimensional CDW state in CsV$_3$Sb$_5$ is reported to form a complex superposition of Star of David (SoD) or Tri-Hexagonal (TrH) patterns of distortion within its kagome planes, but the out-of-plane stacking is marked by metastability. In order to resolve the impact of this metastability, we present reciprocal space mapping and real-space images of CsV$_3$Sb$_5$ collected across multiple length scales using temperature-dependent high-dynamic range mapping (HDRM) and dark-field X-ray microscopy (DFXM). The experimental data provide evidence for a rich microstructure that forms in the CDW state. Data evidence metastability in the formation of $2\times 2\times 4$ and $2\times 2\times 2$ CDW supercells dependent on thermal history and mechanical deformation. We further directly resolve the real space phase segregation of both supercells as well as a real-space, structural twinning driven by the broken rotational symmetry of the CDW state. Our combined results provide insights into the role of microstructure and twinning in experiments probing the electronic properties of CsV$_3$Sb$_5$ where rotational symmetry is broken by the three-dimensional charge density wave order but locally preserved for any single kagome layer.
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Submitted 19 August, 2024; v1 submitted 16 August, 2024;
originally announced August 2024.
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Dark-Field X-Ray Microscopy with Structured Illumination for Three-Dimensional Imaging
Authors:
Doğa Gürsoy,
Kaan Alp Yay,
Elliot Kisiel,
Michael Wojcik,
Dina Sheyfer,
Arndt Last,
Matthew Highland,
Ian Randal Fisher,
Stephan Hruszkewycz,
Zahir Islam
Abstract:
We introduce a structured illumination technique for dark-field x-ray microscopy optimized for three-dimensional imaging of ordered materials at sub-micrometer length scales. Our method utilizes a coded aperture to spatially modulate the incident x-ray beam on the sample, enabling the reconstruction of the sample's 3D structure from images captured at various aperture positions. Unlike common volu…
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We introduce a structured illumination technique for dark-field x-ray microscopy optimized for three-dimensional imaging of ordered materials at sub-micrometer length scales. Our method utilizes a coded aperture to spatially modulate the incident x-ray beam on the sample, enabling the reconstruction of the sample's 3D structure from images captured at various aperture positions. Unlike common volumetric imaging techniques such as tomography, our approach casts a scanning x-ray silhouette of a coded aperture for depth resolution along the axis of diffraction, eliminating any need for sample rotation or rastering, leading to a highly stable imaging modality. This modification provides robustness against geometric uncertainties during data acquisition, particularly for achieving sub-micrometer resolutions where geometric uncertainties typically limit resolution. We introduce the image reconstruction model and validate our results with experimental data on an isolated twin domain within a bulk single crystal of an iron pnictide obtained using a dark-field x-ray microscope. This timely advancement aligns with the enhanced brightness upgrade of the world's synchrotron radiation facilities, opening unprecedented opportunities in imaging.
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Submitted 11 November, 2024; v1 submitted 21 May, 2024;
originally announced May 2024.
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Local strain inhomogeneities during the electrical triggering of a metal-insulator transition revealed by the x-ray microscopy
Authors:
Pavel Salev,
Elliot Kisiel,
Dayne Sasaki,
Brandon Gunn,
Wei He,
Mingzhen Feng,
Junjie Li,
Nobumichi Tamura,
Ishwor Poudyal,
Zahir Islam,
Yayoi Takamura,
Alex Frano,
Ivan K. Schuller
Abstract:
Electrical triggering of a metal-insulator transition (MIT) often results in the formation of characteristic spatial patterns such as a metallic filament percolating through an insulating matrix or an insulating barrier splitting a conducting matrix. When the MIT triggering is driven by electrothermal effects, the temperature of the filament or barrier can be substantially higher than the rest of…
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Electrical triggering of a metal-insulator transition (MIT) often results in the formation of characteristic spatial patterns such as a metallic filament percolating through an insulating matrix or an insulating barrier splitting a conducting matrix. When the MIT triggering is driven by electrothermal effects, the temperature of the filament or barrier can be substantially higher than the rest of material. Using x-ray microdiffraction and dark-field x-ray microscopy, we show that electrothermal MIT triggering leads to the development of an inhomogeneous strain profile across the switching device, even when the material does not undergo a 1st order structural phase transition coinciding with the MIT. Diffraction measurements further reveal evidence of lattice distortions and twinning occurring within the MIT switching device, highlighting a qualitative distinction between the electrothermal process and equilibrium thermal lattice expansion in nonlinear electrical systems. Electrically induced strain development, lattice distortions, and twinning could have important contributions in the MIT triggering process and could drive the material into non-equilibrium states, providing an unconventional pathway to explore the phase space of strongly correlated electronic systems.
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Submitted 10 October, 2023;
originally announced October 2023.
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Detection of a two-phonon mode in a cuprate superconductor via polarimetric RIXS
Authors:
Kirsty Scott,
Elliot Kisiel,
Flora Yakhou,
Stefano Agrestini,
Mirian Garcia-Fernandez,
Kurt Kummer,
Jaewon Choi,
Ruidan Zhong,
John A. Schneeloch,
Genda D. Gu,
Ke-Jin Zhou,
Nicholas B. Brookes,
Alexander F. Kemper,
Matteo Minola,
Fabio Boschini,
Alex Frano,
Adrian Gozar,
Eduardo H. da Silva Neto
Abstract:
Recent improvements in the energy resolution of resonant inelastic x-ray scattering experiments (RIXS) at the Cu-L$_3$ edge have enabled the study of lattice, spin, and charge excitations. Here, we report on the detection of a low intensity signal at 140meV, twice the energy of the bond-stretching (BS) phonon mode, in the cuprate superconductor…
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Recent improvements in the energy resolution of resonant inelastic x-ray scattering experiments (RIXS) at the Cu-L$_3$ edge have enabled the study of lattice, spin, and charge excitations. Here, we report on the detection of a low intensity signal at 140meV, twice the energy of the bond-stretching (BS) phonon mode, in the cuprate superconductor $\textrm{Bi}_2\textrm{Sr}_2\textrm{Ca}\textrm{Cu}_2\textrm{O}_{8+x}$ (Bi-2212). Ultra-high resolution polarimetric RIXS measurements allow us to resolve the outgoing polarization of the signal and identify this feature as a two-phonon excitation. Further, we study the connection between the two-phonon mode and the BS one-phonon mode by constructing a joint density of states toy model that reproduces the key features of the data.
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Submitted 27 September, 2023;
originally announced September 2023.
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High-Resolution Full-field Structural Microscopy of the Voltage Induced Filament Formation in Neuromorphic Devices
Authors:
Elliot Kisiel,
Pavel Salev,
Ishwor Poudyal,
Fellipe Baptista,
Fanny Rodolakis,
Zhan Zhang,
Oleg Shpyrko,
Ivan K. Schuller,
Zahir Islam,
Alex Frano
Abstract:
Neuromorphic functionalities in memristive devices are commonly associated with the ability to electrically create local conductive pathways by resistive switching. The archetypal correlated material, VO2, has been intensively studied for its complex electronic and structural phase transition as well as its filament formation under applied voltages. Local structural studies of the filament behavio…
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Neuromorphic functionalities in memristive devices are commonly associated with the ability to electrically create local conductive pathways by resistive switching. The archetypal correlated material, VO2, has been intensively studied for its complex electronic and structural phase transition as well as its filament formation under applied voltages. Local structural studies of the filament behavior are often limited due to time-consuming rastering which makes impractical many experiments aimed at investigating large spatial areas or temporal dynamics associated with the electrical triggering of the phase transition. Utilizing Dark Field X-ray Microscopy (DFXM), a novel full-field x-ray imaging technique, we study this complex filament formation process in-operando in VO2 devices from a structural perspective. We show that prior to filament formation, there is a significant gain of the metallic rutile phase beneath the metal electrodes that define the device. We observed that the filament formation follows a preferential path determined by the nucleation sites within the device. These nucleation sites are predisposed to the phase transition and can persistently maintain the high-temperature rutile phase even after returning to room temperature, which can enable a novel training/learning mechanism. Filament formation also appears to follow a preferential path determined by a nucleation site within the device which is predisposed to the rutile transition even after returning to room temperature. Finally, we found that small isolated low-temperature phase clusters can be present inside the high-temperature filaments indicating that the filament structure is not uniform. Our results provide a unique perspective on the electrically induced filament formation in metal-insulator transition materials, which further the basic understanding of this resistive switching.
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Submitted 27 September, 2023;
originally announced September 2023.
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Low-energy quasi-circular electron correlations with charge order wavelength in $\textrm{Bi}_2\textrm{Sr}_2\textrm{Ca}\textrm{Cu}_2\textrm{O}_{8+δ}$
Authors:
K. Scott,
E. Kisiel,
T. J. Boyle,
R. Basak,
G. Jargot,
S. Das,
S. Agrestini,
M. Garcia-Fernandez,
J. Choi,
J. Pelliciari,
J. Li,
Y. D. Chuang,
R. D. Zhong,
J. A. Schneeloch,
G. D. Gu,
F. Légaré,
A. F. Kemper,
Ke-Jin Zhou,
V. Bisogni,
S. Blanco-Canosa,
A. Frano,
F. Boschini,
E. H. da Silva Neto
Abstract:
In the study of dynamic charge order correlations in the cuprates, most high energy-resolution resonant inelastic x-ray scattering (RIXS) measurements have focused on momenta along the high-symmetry directions of the copper oxide plane. However, electron scattering along other in-plane directions should not be neglected as they may contain information relevant, for example, to the origin of charge…
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In the study of dynamic charge order correlations in the cuprates, most high energy-resolution resonant inelastic x-ray scattering (RIXS) measurements have focused on momenta along the high-symmetry directions of the copper oxide plane. However, electron scattering along other in-plane directions should not be neglected as they may contain information relevant, for example, to the origin of charge order correlations or to our understanding of the isotropic scattering responsible for strange metal behavior in cuprates. We report high-resolution resonant inelastic x-ray scattering (RIXS) experiments that reveal the presence of dynamic electron correlations over the $q_x$-$q_y$ scattering plane in underdoped $\textrm{Bi}_2\textrm{Sr}_2\textrm{Ca}\textrm{Cu}_2\textrm{O}_{8+δ}$ with $T_c=54$ K. We use the softening of the RIXS-measured bond stretching phonon line as a marker for the presence of charge-order-related dynamic electron correlations. The experiments show that these dynamic correlations exist at energies below approximately $70$ meV and are centered around a quasi-circular manifold in the $q_x$-$q_y$ scattering plane with radius equal to the magnitude of the charge order wave vector, $q_{CO}$. We also demonstrate how this phonon-tracking procedure provides the necessary experimental precision to rule out fluctuations of short-range directional charge order (i.e. centered around $[q_x=\pm q_{CO}, q_y=0]$ and $[q_x=0, q_y=\pm q_{CO}]$) as the origin of the observed correlations.
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Submitted 19 January, 2023;
originally announced January 2023.
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Full-Field Nanoscale X-ray Diffraction-Contrast Imaging using Direct Detection
Authors:
Elliot Kisiel,
Ishwor Poudyal,
Peter Kenesei,
Mark Engbretson,
Arndt Last,
Rourav Basak,
Ivan Zaluzhnyy,
Uday Goteti,
Robert Dynes,
Antonino Miceli,
Alex Frano,
Zahir Islam
Abstract:
Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We presen…
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Recent developments in x-ray science provide methods to probe deeply embedded mesoscale grain structures and spatially resolve them using dark field x-ray microscopy (DFXM). Extending this technique to investigate weak diffraction signals such as magnetic systems, quantum materials and thin films proves challenging due to available detection methods and incident x-ray flux at the sample. We present a direct detection method focusing on DFXM studies in the hard x-ray range of 10s of keV and above capable of approaching nanoscale resolution. Additionally, we compare this direct detection scheme with routinely used scintillator based optical detection and achieve an order of magnitude improvement in exposure times allowing for imaging of weakly diffracting ordered systems.
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Submitted 4 January, 2023; v1 submitted 14 December, 2022;
originally announced December 2022.
