Showing 1–1 of 1 results for author: Jiménez-González, H J
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Transverse Magnetoresistance of Zn$_{0.9}$Co$_{0.1}$O:Al Thin Films
Authors:
R. Martínez-Valdez,
H. J. Jiménez-González,
L. Angelats-Silva,
M. Tomar
Abstract:
The transverse magnetoresistance of thin films of the Diluted Magnetic Semiconductor Zn$_{1-x}$Co$_{x}$O:Al on glass was studied for temperatures in the range of 5 to 100 K. Measurements were made on thin films grown by rf magnetron sputtering, with a thickness of approximately 200 nm. ZnO was alloyed with Co to a concentration $x$ of 0.1 and co-doped with a 5.5% wt concentration of Al. The electr…
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The transverse magnetoresistance of thin films of the Diluted Magnetic Semiconductor Zn$_{1-x}$Co$_{x}$O:Al on glass was studied for temperatures in the range of 5 to 100 K. Measurements were made on thin films grown by rf magnetron sputtering, with a thickness of approximately 200 nm. ZnO was alloyed with Co to a concentration $x$ of 0.1 and co-doped with a 5.5% wt concentration of Al. The electrical resistivity was measured along the sample surface by the four-point probe method with a magnetic field of up to 4 T applied perpendicular to the surface of the film. The experimental results of the magnetoresistance have been interpreted by means of a semiclassical model that combines a relaxation-time approximation to describe scattering processes in ZnO and a phenomenological approach to the spin-disorder scattering due to the indirect exchange interaction of the magnetic impurities.
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Submitted 24 May, 2017;
originally announced May 2017.